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Catalog Datasheet	MFG & Type	PDF	Document Tags
SEM 2006 Abstract: F2223-21SH SUS304 TMCPF0020 beam mcp Text: MCP ASSEMBLY F2223-21SH This MCP assembly is a suitable detector for an electron or ion beam in SEM, SIM or Lithography. It is possible to detect some signal from a sample with high sensitivity, that can be performed with the compactness and the center hole	Original	PDF	F2223-21SH TMCPF0020 SE-171-41 TMCP1001E03 SEM 2006 F2223-21SH SUS304 TMCPF0020 beam mcp

Catalog Datasheet

MFG & Type

PDF

Document Tags

SEM 2006

Abstract: F2223-21SH SUS304 TMCPF0020 beam mcp
Text: MCP ASSEMBLY F2223-21SH This MCP assembly is a suitable detector for an electron or ion beam in SEM, SIM or Lithography. It is possible to detect some signal from a sample with high sensitivity, that can be performed with the compactness and the center hole

Original

PDF

F2223-21SH TMCPF0020 SE-171-41 TMCP1001E03 SEM 2006 F2223-21SH SUS304 TMCPF0020 beam mcp