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    SEM 2006

    Abstract: F2223-21SH SUS304 TMCPF0020 beam mcp
    Text: MCP ASSEMBLY F2223-21SH This MCP assembly is a suitable detector for an electron or ion beam in SEM, SIM or Lithography. It is possible to detect some signal from a sample with high sensitivity, that can be performed with the compactness and the center hole


    Original     		F2223-21SH TMCPF0020 SE-171-41 TMCP1001E03 SEM 2006 F2223-21SH SUS304 TMCPF0020 beam mcp PDF