wireless motor speed control by rf
Abstract: smema GPIB/USB DSASW0010279 gpib rohwedder smema specifications
Text: 5830+ In-line Multi-Combinational Tester Key features Test capability • • ICT: In-Circuit Test Up to 3060 in-circuit test points, or • FCT: Functional Circuit Test Up to 1024 functional test points, or • FUT: Functional Unit Test Up to 19, 3U PXI cards
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F-1352
Abstract: 016v 1352
Text: Turns Ratio + 2% F-1352 1:1:1:1 PARAMETER MIN. Open Circuit Inductance Test Level = .016V Test Frequency = 100.0 KHz MAX. COMMON MODE CHOKE UNITS µHy 36 Leakage Inductance Test Level = .016V Test Frequency = 1 MHz 0.3 µHy Interwinding Capacitance (CW/W)
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F-1352
F-1352
016v
1352
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104PEA/2X11N-452
Abstract: No abstract text available
Text: SUHNERâ TEST+MEASUREMENT TEST LEADS 50 9 Agilent Technologies VNAs 48 This range of test leads has been specially developed for applications involving network analyzers from Agilent Technologies. All test leads are provided at one end with the unit-specific, sturdy 3.5
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SF104PB/HP3
5m/570
104PB
104PEA
SF104PEA/Nm/Nf/5000
104PEA/2X11N-452
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UL20624
Abstract: UL2643 UL289X
Text: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:
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96hrs
12hrs
10mmRx10cmx70cycle/min
03minal
UL20624
UL2643
UL289X
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UL2643
Abstract: UL20624 17546
Text: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:
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96hrs
12hrs
10mmRx10cmx70cycle/min
03nal
CBLA--FFC-050-33-M-D-175-4-6-A
UL2643
UL20624
17546
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UL20624
Abstract: UL2643
Text: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:
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96hrs
12hrs
10mmRx10cmx70cycle/min
UL20624
UL2643
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PDF
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UL20624
Abstract: No abstract text available
Text: 1 2 3 4 5 6 7 8 SPECIFICATIONS Conductor Material: Conductor Resistance: Insulation Material: Insulation Resistance: Support Tape: Open/Short Test: Heat Resistance: Heat Cycle Test: A B Moisture Resistance: Flame Test: Flexing Test: Bending Test: Abrasion Test:
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96hrs
12hrs
10mmRx10cmx70cycle/min
UL20624
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Untitled
Abstract: No abstract text available
Text: www.avionteq.com 7700 Integrated Microwave Test Solution A complete test environment for automated production and integration test of RF components and modules A Complete RF Test Environment
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x-7700-Integrated-Microwave-Test-Solution
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NSG1003
Abstract: TCL24-124 TDS1002 TCL24-112 TCL060-112 TCL060-124 TCL060-148 TCL120-112 208VAC TCL24-105
Text: SEMI F-47 Test Compliance Test Report Standard: SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity Test Procedure Standard: Semi F42 : Test method for Semiconductor Processing Equipment. Voltage Sag Immunity 1. Test Setup
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F47-0200
NSG1003:
TDS1002
TCL24-105
TCL24-112
TCL24-124
TCL060-112
TCL060-124
TCL060-148
TCL120-112
NSG1003
TCL24-124
TDS1002
TCL24-112
TCL060-112
TCL060-124
TCL060-148
TCL120-112
208VAC
TCL24-105
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NSG1003
Abstract: TDS1002 TSP070-112 TSP090-124 TSP140-112 TSP180-124 TSP360-124 TSP600-124
Text: SEMI F-47 Test Compliance Test Report Standard: SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity Test Procedure Standard: Semi F42 : Test method for Semiconductor Processing Equipment. Voltage Sag Immunity 1. Test Setup
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F47-0200
NSG1003:
TDS1002
TSP070-112
TSP090-124
TSP140-112
TSP180-124
TSP360-124
TSP600-124
DUT50
NSG1003
TDS1002
TSP070-112
TSP090-124
TSP140-112
TSP180-124
TSP360-124
TSP600-124
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Willamette
Abstract: project transistor tester
Text: Intel Technology Journal Q199 Defect-Based Test: A Key Enabler for Successful Migration to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel Corp. Sreejit Chakravarty, MPG Test Technology, Intel Corp.
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A4/T11
Willamette
project transistor tester
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B1093
Abstract: No abstract text available
Text: TEST POINTS TEST POINTS AND TEST SOCKETS • UNIQUE RETENTION MECHANISM ENHANCES RELIABILITY THROUGH LOW STRESS CONTACTS • LOW PROFILE WITH MINIMUM CONTACT RESISTANCE < 2mΩ • CONTACT TEST POINT SUITABLE FOR BED OF NAILS APPLICATIONS • TEST SOCKETS SUPPLIES LOOSE, TEST POINTS SUPPLIED ON TAPE AND REEL
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SMOX/060/TP
SMOX/060/B1/LP
LS/B1/093/White
LS/B1/093/Red
LS/B1/093/Black
LS/B1/093
SMOX/060LS/B1/093
B1093
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EN-61010
Abstract: 6LR61 6F22 6F22 9V BATTERY en 61010 battery 6f22 IEC 6F22 acoustic 150 tester IEC-61010
Text: Continuity Tester UNITEST ® Continuity Tester UNITEST Ohmtest Technical Data Continuity Tester Continuity Test Test Current Test Voltage External Voltage Indication Protection Degree Safety complying with Power Supply Dimensions Weight Key Functions • Acoustic continuity tester
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6LR61
EN-61010
6LR61
6F22
6F22 9V BATTERY
en 61010
battery 6f22
IEC 6F22
acoustic 150
tester
IEC-61010
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TRM1000C
Abstract: No abstract text available
Text: TRM1000C T/R Module Test Environment • Complete Synthetic Test Environment Hardware, software, processes, support • Optimized for T/R Module Test Test module subassemblies, modules and multi-module assemblies on one system • Highest Test Throughput Available
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TRM1000C
TRM1000C
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Untitled
Abstract: No abstract text available
Text: Agilent E1529B, E1539A and E1422A Strain, Voltage, and Temperature, Measurement System • Airframe structural and fatigue test • Rocket and satellite structural test • Wind tunnel flight load test Remote Strain Conditioning and Voltage Unit for Stress and
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E1529B,
E1539A
E1422A
E1529B
E1586A
5988-6475EN
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IDC CONNECTOR 50 pin male
Abstract: SCSI CONNECTOR 50 pin male 40 pin LCD cable scsi 68 connector pin assignment 40-pin male connector dsub 9 male idc connector manual test idc connector 10 pin pin connection lcd wire
Text: SCSI and Flat Cable Tester SCSI Cable Tester With this test device cable with up to 68 lines can be tested. Combined with the optional PC- or MAC cable test unit extendable to a Multi cable test device. The test units are connected by a 40-wire cable to the SCSI tester. An enclosed reference table shows
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40-wire
40-pin
IDC CONNECTOR 50 pin male
SCSI CONNECTOR 50 pin male
40 pin LCD cable
scsi 68 connector pin assignment
40-pin male connector
dsub 9 male
idc connector
manual test
idc connector 10 pin
pin connection lcd wire
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laptop ic list
Abstract: NS6040 contactor Amkor Technology handler
Text: data sheet TEST CONTACTOR FusionQuad Test Contactor Test Hardware List: Amkor FusionQuad® Test Contactor: Amkor Technology is now offering the FusionQuad® Test Contactor Amkor’s FusionQuad® represents a breakthrough in leadframe-based plastic packaging through the effective
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NS6040
DS815B
laptop ic list
contactor
Amkor Technology
handler
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MTTR,
Abstract: No abstract text available
Text: COMMUNICATIONS TEST & MEASUREMENT SOLUTIONS CAS-2000 Comprehensive Application System Compact High Density Remote Test Unit Key Features • Up to 16 simultaneous DS1 tests from a DS3 interface on a Digital Crossconnect System DSC or Test Access Unit (TAU)
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CAS-2000
CAS2000
MTTR,
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cls0231mp-1
Abstract: No abstract text available
Text: Part No: CLS0231MP-1 Date: 7/09/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 23mm
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CLS0231MP-1
72dB/w
112th
cls0231mp-1
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Untitled
Abstract: No abstract text available
Text: Part No: CLS0401MAE Date: 7/03/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 40 mm
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CLS0401MAE
112th
CLS0401MAE
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Untitled
Abstract: No abstract text available
Text: Part No: CLS0301MA Date: 7/03/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 30 mm
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CLS0301MA
112th
CLS0301MA
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CLS0281-L152
Abstract: 24 ohm speaker
Text: Part No: CLS0281-L152 Date: 7/3/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 28mm
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CLS0281-L152
82dB/w
112th
UL1007,
28AWG
152mm
CLS0281-L152
24 ohm speaker
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Untitled
Abstract: No abstract text available
Text: Part No: CLS0281MAE-L152 Date: 7/5/2007 Unit: mm Description: speaker Page No: 1 of 2 Specifications Nominal Size Impedance Resonant frequency Sound pressure level Response Input power Operation Buzz, rattle, etc. Magnet Load test Heat test Humidity test 28mm
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CLS0281MAE-L152
87dB/w
112th
UL1007,
28AWG
152mm
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ic 8255 PPI
Abstract: PPI 8255 interface data serial 8255 PPI Chip PPI 8255 interface word control Control word 8255 PPI ppi interface 1007 SC1114 NUM mnda
Text: Honeywell Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability • Serial Chip-Level Test Interface
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OCR Scan
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P1149
HTIU2100
ic 8255 PPI
PPI 8255 interface data serial
8255 PPI Chip
PPI 8255 interface word control
Control word 8255 PPI
ppi interface 1007
SC1114
NUM mnda
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