MS081
Abstract: No abstract text available
Text: Agilent N6422C WiMAX Wireless Test Manager Technical Overview Get your WiMAX devices to market quickly with reduced test development costs Agilent's test manager software provides ready-to-use tests, test plans, test sequencing, and menu-selectable hardware support for quick and easy automation of device
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N6422C
N6422C
5989-7851EN
cdma2000
MS081
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LS-1220-1200A
Abstract: LS40041-I100 tm-U220 PCI-1750 rocketport EPSON 1220 LS-3603MX-1200A symbol P300FZY LS4004 E6651A
Text: Agilent N6422C WiMAX Wireless Test Manager Technical Overview Get your WiMAX devices to market quickly with reduced test development costs Agilent's test manager software provides ready-to-use tests, test plans, test sequencing, and menu-selectable hardware support for quick and easy automation of device
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N6422C
N6422C
5989-7851EN
cdma2000
LS-1220-1200A
LS40041-I100
tm-U220
PCI-1750
rocketport
EPSON 1220
LS-3603MX-1200A
symbol P300FZY
LS4004
E6651A
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Untitled
Abstract: No abstract text available
Text: 22355 Abracon CORX 2-29.qxd 3/6/00 6:56 AM Page 70 ABRACON QUARTZ CRYSTALS AND OSCILLATORS RELIABILITY SAMPLE TEST PLAN NO TEST NAME TEST PROCEDURES 1 High temperature storage 12 Random vibration 13 14 Wash test Resistance to chemicals 15 16 17 18 Lead bend test
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106 10k 804
Abstract: 106F 213B
Text: CTS ClearONE Terminator Reliability Test Data RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN &
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Abstract: No abstract text available
Text: *1566 PRINTER 171-241 v2 12/4/06 9:42 AM Page 29 Filtered Connector Performance Specifications The filtered D-subminiature connectors shown in this catalog have been designed and tested to the following test plan. I Order of Test Examination of Test Test Method
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MIL-STD-202
IFI-100
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Untitled
Abstract: No abstract text available
Text: *1130 PRINTER 171-241 v2 3/13/03 4:01 PM Page 25 Filtered Connector Performance Specifications The filtered D-subminiature connectors shown in this catalog have been designed and tested to the following test plan. I Order of Test Examination of Test Test Method
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MIL-STD-202
IFI-100
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LTE transmit spectrum mask
Abstract: FSK labview vector generator Ghz LTE transmit spectrum future scope of wiMAX frequency synthesizer for LTE Applications settling time Signal Generators lte
Text: A passion for performance. Modular RF Test System Plan eXecute Integrate 3000 Series 3000 Series RF test challenges, Aeroflex’s solution The Challenges of RF Test In advanced wireless communications the speed of technological developments demand test solutions to continually evolve in performance, functionality and speed while remaining
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Willamette
Abstract: project transistor tester
Text: Intel Technology Journal Q199 Defect-Based Test: A Key Enabler for Successful Migration to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel Corp. Sreejit Chakravarty, MPG Test Technology, Intel Corp.
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A4/T11
Willamette
project transistor tester
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JEDEC JESD22-B117
Abstract: JESD22-B117 Solder Paste, Indium 5.8 N41 250 y 803 IPC-9504 10k resistor 1/8 watt datasheet hot air bga Solder Paste, Indium 5.1, Type 3 10k resistor 1/4 watt datasheet
Text: RELIABILITY TEST DATA Table of Contents BGA RESISTOR ARRAY DESIGN VALIDATION TEST PLAN .3 DESIGN VERIFICATION PLAN & REPORT .4
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TRM1000C
Abstract: No abstract text available
Text: TRM1000C T/R Module Test Environment • Complete Synthetic Test Environment Hardware, software, processes, support • Optimized for T/R Module Test Test module subassemblies, modules and multi-module assemblies on one system • Highest Test Throughput Available
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TRM1000C
TRM1000C
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tektronix scope tip jack
Abstract: tektronix TDS 220 oscilloscope tektronix TAS 250 oscilloscope tektronix TAS 220 scope CORDURA tektronix TDS 220 scope 885-1000 FLUKE 80 DMM ccfl
Text: P o m o n a Electronics Test Companion Test Kits ª Test Companionª Test Kits Guide c Each Test Companionª Kit Is Tailored to Your Instrument c Contact Your Local Allied Sales Representative for Pomona ElectronicsÕ New 1999 Catalog Simply find the model number of your Fluke, Hewlett-Packard, Tektronix or Wavetek meter to locate the Test Companion ª test
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IEC1010
4401A
IEC1010-compliant
352-A-60
352-A-120
c1003
tektronix scope tip jack
tektronix TDS 220 oscilloscope
tektronix TAS 250 oscilloscope
tektronix TAS 220 scope
CORDURA
tektronix TDS 220 scope
885-1000
FLUKE 80 DMM
ccfl
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NAPRD03
Abstract: Racal Instruments 6103 GCF-CC NAPRD03 test plan ptcrb 3g call flow 6103G GSM project circuit Racal Instruments 6103 option 6103G-93 API 662
Text: Protocol Test 6103 AIME 6103 AIME/CT 2/2.5G Protocol Analysis and Conformance Test Solutions • GSM, GPRS and EGPRS Protocol Analyzer • 3GPP Compliant Mobile Conformance Test System • 3GPP TS51.010 test cases validated by accredited test houses • Fully automated testing including mobile
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pneumatic engineering project
Abstract: mechanical engineering projects free ARINC-429 driver mechanical engineering project pneumatic engine project 1553B
Text: ATE Programs, Fixtures and Services Comprehensive test solutions from Europe’s largest test bureau, from fixture kits to turnkey test solutions, including test management • Comprehensive design to build solutions from MDA to System Test • Fixturing solutions including kits, customization, and turnkey projects
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NCP1207AADAPGEVB
Abstract: No abstract text available
Text: Test Procedure for the NCP1207AADAPGEVB 01/31/2005 1.0 Diagrams 1.1 Test Configuration Figure 1. NCP1207AADAPGEVB Test Configuration. 1.2 Oscilloscope Test Points Figure 2. NCP1207AADAPGEVB Oscilloscope Test Points. 2.0 Equipment • • • • • • Variable AC Power supply 0 ~ 240 VAC, 1.0 A
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NCP1207AADAPGEVB
NCP1207AADAPGEVB
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Untitled
Abstract: No abstract text available
Text: MIL PROCESSING TEST PLAN FOR DLZ SERIES – H1 VERSIONS Bidirectional TEST CONDITION Internal Visual MIL-STD-750 TEST METHOD 2072 Storage TA = +150°C for 24 hours 1032 Temp Cycle 10 cycles, 15 minutes each extreme @ min/max rated temps 1051 Acceleration
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MIL-STD-750
10ted
1071G/H
1071C/D
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Untitled
Abstract: No abstract text available
Text: MIL PROCESSING TEST PLAN FOR DLZ SERIES – H1 VERSIONS Unidirectional TEST CONDITION Internal Visual MIL-STD-750 TEST METHOD 2072 Storage TA = +150°C for 24 hours 1032 Temp Cycle 10 cycles, 15 minutes each extreme @ min/max rated temps 1051 Acceleration
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1071G/H
1071C/D
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Untitled
Abstract: No abstract text available
Text: MIL PROCESSING GROUP B TEST PLAN FOR DLZ SERIES – H2 VERSIONS Bidirectional TEST CONDITION MIL-STD-750 TEST METHOD SUBGROUP1 Solderability 2026 Resistance to Solvents 1022 SUBGROUP 2 Temp Cycle 10 cylces, 15 minutes @ min/max rated temperatures 1051 Fine Leak
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MIL-STD-750
1071G/H
1071D
MIL-PRF-19500
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line AMPLIFIER satellite
Abstract: direct pm modulation circuit IEC61010-1
Text: 5200 Satellite Payload Test Environment • Complete Synthetic Test Environment Hardware, software, processes, support • Optimized for Satellite Payload Test • Highest Test Throughput Available • Proven Systems Deployment 5th generation solution – major
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Abstract: No abstract text available
Text: ATCA TEST EXTENDER FEATURES BOARD SPECIFICATIONS • Test points for all lines on each ZD connector • Metal frame securely holds test board in place • Designed to meet mechanical and electrical connection requirement of PICMG Rev 3.0 • External ground planes for mechanical protection
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400mm
10-layer
94-V0
VME64x,
114EXT8040-0XXX
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CITE32
Abstract: air bearing
Text: ATE 4550 Flying Probe Test System Flying Probe System offering flexible, fast test solutions to the electronic manufacturing industry • High speed, high accuracy fixtureless test Introduction • Short program development times • Improved test accessibility
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Field-Programmable Gate Arrays
Abstract: Cypress
Text: PRESS RELEASE CYPRESS OPENS PHILIPPINES ASSEMBLY/TEST FACILITY SAN JOSE, California. . . September 20, 1996. . . Cypress Semiconductor Corporation [NYSE: CY] announced the opening of a new assembly and test plant in the Philippines. By 1998, the Cypress Philippines plant will test and package 300 million
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000-square-foot
1980s,
Field-Programmable Gate Arrays
Cypress
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Untitled
Abstract: No abstract text available
Text: Agilent U7231A DDR3 Compliance Test Application for Infiniium Series Oscilloscopes Datasheet Test, debug and characterize your DDR3 designs quickly and easily The Agilent Technologies U7231A DDR3 compliance test application provides a fast and easy way to test,
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U7231A
U7231A
JESD79-3E
JESD79-31
5989-7243EN
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Untitled
Abstract: No abstract text available
Text: NEW! Modular Test Solutions Delivered within 2 Weeks! TEST OLUTIONS SPRODUCT GUIDE Mini-Circuits ISO 9001 ISO 14001 AS 9100 CERTIFIED www.minicircuits.com TSPG-15 second edition PRODUCT PORTFOLIO Mini-Circuits Test Solutions Mini-Circuits Test Solutions
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SSG-6400HS
SSG-4000HP
SSG-4000LH
SSG-6000RC
SSG-6001RC
USB-xSPDT-A18
USB-xSP4T-A18
RC-xSPDT-A18
RC-xSP4T-A18
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Untitled
Abstract: No abstract text available
Text: MODULE SCREENING TEST PLAN For Module H2 TEST CONDITION MIL-STD-750 TEST METHOD Storage TA = +150°C for 24 hours 1032 Temp Cycle -65°C to +150°C, 10 cycles, 30 minutes each extreme 1051 Electrical Reverse Current IR @ rated VWM Breakdown Voltage (V(BR) @ IT
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