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    TEST METHODOLOGY Search Results

    TEST METHODOLOGY Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet

    TEST METHODOLOGY Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Test Methodology

    Abstract: M3500 VCO micronetics M3500 QUALCOMM Reference design nomograph M3500 M3500-0612 is nomograph micronetics vco micronetics M3500-0916s
    Text: TEST METHODOLOGY TEST CONFIGURATION 1 TEST CONFIGURATIONAND PERFORMANCE Test Configurations 1,2,3 & 4 illustrate the actual test methods used for collecting the test data for all M3500 VCO versions. The performance curves of figures 2 A-M pages 9-22 were


    Original     		PDF M3500 Test Methodology M3500 VCO micronetics M3500 QUALCOMM Reference design nomograph M3500-0612 is nomograph micronetics vco micronetics M3500-0916s

    credence tester

    Abstract: SENTRY-21
    Text: Test-3.6-07/98 Test Gate Array/Embedded Array Verification . 3-2 Methodology . 3-2


    Original     		PDF 10Mhz) credence tester SENTRY-21

    Willamette

    Abstract: project transistor tester
    Text: Intel Technology Journal Q1’99 Defect-Based Test: A Key Enabler for Successful Migration to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel Corp. Sreejit Chakravarty, MPG Test Technology, Intel Corp.


    Original     		PDF A4/T11 Willamette project transistor tester

    SN54ACT8997

    Abstract: SN74ACT8997
    Text: Chapter 6 Suggested Design-for-Test Flow The designer of any new product must plan for testing at any time in the life cycle of the product. This process is called design for test DFT . The test methodology, defined by IEEE Std 1149.1, is used to ease problems


    Original     		PDF

    E6601A

    Abstract: sl 100 sem aclr filter
    Text: Agilent E6835A TD-SCDMA Calibration Application For the E6601A Wireless Communications Test Set Data Sheet The next generation of mobile phone manufacturing test. The E6601A is the newest test set from Agilent Technologies, designed especially for high-volume, test-mode manufacturing.


    Original     		PDF E6835A E6601A 5989-7180EN sl 100 sem aclr filter

    Types of Radar Antenna

    Abstract: No abstract text available
    Text: Aeroflex Product Capabilities Synthetic Test Systems Progressive companies in the test and measurement industry are working to meet the challenges of developing an approach that cost effectively meets today’s test demands while preserving the investment of test in the future. Synthetic


    Original     		PDF

    0300BB

    Abstract: TPR50 TPX250 HP-3577A hi pot all transformer
    Text: TEST METHODS FOR PULSE 10BASE-T MODULES Application Note Scope This application note depicts PULSE’s test methodology for 10Base-T. Test methods are in compliance with the IEEE Std 802.3i-1993, which addresses both the 10Base-T chip as well as the 10Base-T module specifications. Module is defined as a single package component that includes


    Original     		PDF 10BASE-T 10Base-T. 3i-1993, 0300BB TPR50 TPX250 HP-3577A hi pot all transformer

    "3 Bit Shift Register"

    Abstract: I426 SD4 diode i437 ATL60 sdi verilog code OM32muxl0
    Text: Test Compiler Scan Insertion and ATPG Development via  Synopsys Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler , version


    Original     		PDF

    U2002

    Abstract: ATL60
    Text: Test Compiler Scan Insertion and ATPG Development via Synopsys• Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys• Test Compiler• , version


    Original     		PDF

    E6601A

    Abstract: IMT-2000 UMTS800 UMTS2600
    Text: Agilent E6832A W-CDMA Calibration Application For the E6601A Wireless Communications Test Set Data Sheet The next generation of mobile phone manufacturing test. E6601A/E6890A Features and General Specifications E6601A is the newest test set from Agilent Technologies,


    Original     		PDF E6832A E6601A E6601A/E6890A 5989-5294EN IMT-2000 UMTS800 UMTS2600

    MUX21

    Abstract: No abstract text available
    Text: Cell-Based IC Compiled Megacell Testing Overview BIST Circuitry This Engineering Application Note describes a test methodology for compiled megacells if Built-in Self-test BIST circuitry is not included. • • Introduction ATMEL includes in its libraries compiled


    Original     		PDF

    High Volume Test Methodology for HBT Device Ruggedness Characterization

    Abstract: kopin
    Text: High Volume Test Methodology for HBT Device Ruggedness Characterization Cristian Cismaru, Hal Banbrook, and Peter J. Zampardi Skyworks Solutions, Inc., 2427 Hillcrest Drive, Newbury Park, CA 91320 cristian.cismaru@skyworksinc.com, 805.480.4663 Keywords: BVceo, snap-back, HBT, high-volume test, ruggedness


    Original     		PDF 17th-20th, High Volume Test Methodology for HBT Device Ruggedness Characterization kopin

    E6601A

    Abstract: IMT-2000 mobile phone repair
    Text: Agilent E6833A cdma2000/1xEV-DO Calibration Application For the E6601A Wireless Communications Test Set Data Sheet The next generation of mobile phone manufacturing test. E6601A/E6890A Features and General Specifications The Agilent E6601A is the new, one-box test set that expedites


    Original     		PDF E6833A cdma2000/1xEV-DO E6601A E6601A/E6890A cdma2000 5989-6426EN IMT-2000 mobile phone repair

    ASTM-E668

    Abstract: radiation-hardened, Diodes Transistors manual table
    Text: N RADIATION OWNER’S MANUAL Table of Contents – Radiation Testing Page Test Philosophy National’s Radiation Effects Laboratories All About National’s South Portland, Maine, REL Certification – Maine Test Methodology – Maine The Step-by-Step Process – Maine


    Original     		PDF

    CL8000

    Abstract: No abstract text available
    Text: CL8000 TEST METHODOLOGY Introduction Clear Logic’s CL8000 family of Laser-Configured ASICs LASICs provide a turnkey ASIC conversion of Altera’s FLEX 8000 family of Field Programmable Gate Arrays (FPGAs). Clear Logic’s NoFault™ test method provides 100% stuck-at fault


    Original     		PDF CL8000

    Untitled

    Abstract: No abstract text available
    Text: Agilent E7478A GPRS Drive Test System Product Overview Quickly deploy your GPRS netw orks and manage multiformat environments Our drive test solution doesn’t just uncover problems on your GPRS netw ork – it allow s you to fix them quickly. Agilent’s GPRS and data test


    Original     		PDF E7478A 5980-2375E

    GSM480

    Abstract: No abstract text available
    Text: Agilent E6831A GSM/GPRS/EGPRS Calibration Application For the E6601A Wireless Communications Test Set Data Sheet E6601A Features • • • • • • • • • • • • The next generation of mobile phone manufacturing test E6601A is the newest test set from Agilent Technologies,


    Original     		PDF E6831A E6601A nee15 5989-5293EN GSM480

    Untitled

    Abstract: No abstract text available
    Text: Compiled Megacell Testing Overview Cell-Based ASIC This application note describes a test methodology for compiled megacells if Built-in Self-test BIST circuitry is not used. Introduction Application Note Atmel includes in its libraries compiled megacells for ARAM, ROM, dual-port RAM and


    Original     		PDF 0696C 02/99/0M

    parameters of FR4 substrate with dielectric const

    Abstract: mt 6612 8710-1582 IPC-2141 HP54754A CITS500S APC7 connector 2041-6204-00 General Instrument 312 diode MaCom SMA Female 2 Hole
    Text: R Printed Circuit Board PCB Test Methodology User Guide Revision 1.6 January 2000 Order Number: 298179 - 001 Printed Circuit Board (PCB) Test Methodology R Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual


    Original     		PDF 25-Ohm parameters of FR4 substrate with dielectric const mt 6612 8710-1582 IPC-2141 HP54754A CITS500S APC7 connector 2041-6204-00 General Instrument 312 diode MaCom SMA Female 2 Hole

    esata

    Abstract: sata connector DSA70604 MAX4951 MAX4951B
    Text: Measurement methodology eSATA Rev 1.2 1 PHY testing methodology – DUT must be placed into a test mode, typically a BIST built-in self-test mode using outside stimulus or a hardware/software utility. • Special BIST sequences generated by AWGs, on-board software, or compliance load


    Original     		PDF MAX4951 MAX4951A MAX4951B MAX4951AE MAX4951 MAX4951AE esata sata connector DSA70604

    FLUKE 8840a specification

    Abstract: No abstract text available
    Text: AN770 S i826 X 5 K V I SOLATOR TEST R EPORT S UMMARY 1. Introduction This application note summarizes various performance, quality, and reliability test results for the Si826x isolator family. A summary of tests and their results is listed in Table 1. For more details on a particular test, see the


    Original     		PDF AN770 Si826x IEC62539 IEC60065 J1752 IEC61967-2) FLUKE 8840a specification

    SI8710

    Abstract: No abstract text available
    Text: AN742 Si87 XX 5 K V I SOLATOR TEST R EPORT S UMMARY 1. Introduction This application note summarizes various performance, quality, and reliability test results for the Si87xx isolator family. A summary of tests and their results is listed in Table 1. For more details on a particular test, see the


    Original     		PDF AN742 Si87xx IEC62539 IEC60065 J1752 IEC61967-2) SI8710

    Bi-directional shift register

    Abstract: AT6005
    Text: FPGA IEEE 1149.1-1990 Standard Test Access Port and Boundary-Scan Field Programmable Gate Array Introduction For system or board diagnostics, AT6000 Series devices can be programmed with the 1149.1 standard test logic and then reprogrammed for normal operation when the diagnostics are complete. The area and performance overhead of the test logic does not


    Original     		PDF AT6000 AT6005, Bi-directional shift register AT6005

    INAP125

    Abstract: apix ashell CRC-24 INAP125T24 INAP125R24 CRC24 spartan camera link apix XC3S1200E Head-Up Displays
    Text: APIX AShell August 11, 2008 Product Specification AllianceCORE Facts Provided with Core Documentation User Guide Design File Formats Encrypted NGC netlist Constraints Files Verification APIX_AShell.ucf Test Bench, Test Vectors Instantiation Templates INOVA Semiconductors GmbH


    Original     		PDF DE-81761 INAP125T1GmbH INAP125 apix ashell CRC-24 INAP125T24 INAP125R24 CRC24 spartan camera link apix XC3S1200E Head-Up Displays