Untitled
Abstract: No abstract text available
Text: No.:T1091 RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA8806 Date Received ：2008.01.21 Date Tested ：2008.01.29 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA8806
L0835-060321
HS0801210029A
RAC9700250-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA8806 Date Received ：2008.01.21 Date Tested ：2008.01.29 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA8806
L0835-060321
HS0801210029A
RAC9700250-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA8806 Date Received ：2008.01.21 Date Tested ：2008.01.25 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA8806
L0835-060321
HS0801210029A
RAC9700295-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 Revision:A RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：PM8808 Date Received ：2009.12.23 Date Tested ：2010.01.08 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
PM8808
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 Revision:A RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA0086L3N Date Received ：2009.07.24 Date Tested ：2009.07.28 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA0086L3N
HS0907240038A
RAC9802419-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 Revision:A RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA0086L3N Date Received ：2009.07.24 Date Tested ：2009.07.28 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA0086L3N
HS0907240038A
RAC9802419-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 ESD RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA6963 Date Received ：2007.07.25 Date Tested ：2007.08.09 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA6963
L0835-060321
HS0707250101A
RAC9602499-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 Revision:A RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA0086L3N Date Received ：2009.07.24 Date Tested ：2009.07.28 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA0086L3N
HS0907240038A
RAC9802419-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 ESD RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：RA6963 Date Received ：2007.07.25 Date Tested ：2007.08.09 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
RA6963
L0835-060321
HS0707250101A
RAC9602499-E
|
Untitled
Abstract: No abstract text available
Text: No.:T1091 Revision:B RELIABILITY TEST REPORT TEST REPORT Company ：RAIO TECHNOLOGY INC. Model Name ：PM8808 Date Received ：2010.12.23 Date Tested ：2010.01.20 TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ 17025 certificate of independent test laboratory approval
|
Original
|
PDF
|
T1091
PM8808
HS0912230062A
RAC9804608-E
|
5962-8513101XA
Abstract: 5962-85131073A 5962-85131083C 5962-85131013A 5962-85131032A HI5116 34371 5962-8513105XA hi4-546 5962-85131083A
Text: REVISIONS LTR DESCRIPTION DATE YR-MO-DA APPROVED A Add case outlines, terminal connections and thermal resistance values for case outlines 2 and 3. For device type 01, 02, and 03, add subgroup 3 to IIH and IIL test, add RDS1 test, add VISO test, delete VCT test, change RL and CL test conditions for
|
Original
|
PDF
|
5962-R061-95.
1ES66
5962-8513101XA
5962-85131073A
5962-85131083C
5962-85131013A
5962-85131032A
HI5116
34371
5962-8513105XA
hi4-546
5962-85131083A
|
mobile phone repair
Abstract: imei telephone repair no fault found mobile repair
Text: Application Note Maximizing GSM Mobile Repair Centre Throughtput Service center throughput is affected by more than just test times - it involves the entire workshop process. Administration, data management, de-skilling of repetitive tasks, test setup times, test equipment user interfaces, test
|
Original
|
PDF
|
|
Untitled
Abstract: No abstract text available
Text: Four Position Meter Test Bench The Calmet TB40 Four Position Meter Test Bench is used for calibration and testing of single and three phase electromechanical and electronic active and reactive electricity meters and portable test equipment. The TB40 Test Bench comprises:
|
Original
|
PDF
|
500Hz
300TS
300PQ
RS232
AD300
CF101
CF100
UCF100
CF100
CF101
|
M38510/19002BXA
Abstract: 5962-8513101XA HI1-546/883 M38510/19001BXA qml-38535 5962-85131032A HI5116 M38510/19003BXA HI1-549/883 HI4-549/883
Text: REVISIONS LTR DESCRIPTION DATE YR-MO-DA APPROVED 88-08-26 D. A. DiCENZO Add case outlines, terminal connections and thermal resistance values for case outlines 2 and 3. For device type 01, 02, and 03, add subgroup 3 to IIH and IIL test, add RDS1 test, add VISO test, delete VCT test, change RL and CL test
|
Original
|
PDF
|
5962-R061-95.
95-01-25ility.
1ES66
M38510/19002BXA
5962-8513101XA
HI1-546/883
M38510/19001BXA
qml-38535
5962-85131032A
HI5116
M38510/19003BXA
HI1-549/883
HI4-549/883
|
|
|
Kir-1c
Abstract: KIR 1C KIV-6 KIT-1C/TSEC KIT-1c APM-424 KIT-1C/TSEC battery KIR 1A KIr-1c 63 KIT-1A
Text: Avionics AN/APM-424 V 3 INTERROGATOR/ TRANSPONDER TEST SET Easily accommodates a variety of aircraft, ground and ship platforms to test Transponder and Interrogator performance • Transponder Test Set Modes 1, 2, 3/A, C, 4, S • Interrogator Test Set Modes 1, 2, 3/A, C,
|
Original
|
PDF
|
AN/APM-424
Kir-1c
KIR 1C
KIV-6
KIT-1C/TSEC
KIT-1c
APM-424
KIT-1C/TSEC battery
KIR 1A
KIr-1c 63
KIT-1A
|
Untitled
Abstract: No abstract text available
Text: Wireless 3550R Touch-Screen Radio Test System The Complete Portable, On Site Radio Communication Test System for Analog and Digital Communication Systems The 3550R. The first truly portable touch-screen radio communication test system. The 3550R takes radio
|
Original
|
PDF
|
3550R
3550R.
|
ESD test plan
Abstract: TR2020 TB-3046
Text: TECHNICAL BULLETIN TB-3046 Analog Surface Resistance Test Kit Operation and Maintenance Figure 1. Desco 19784 Analog Surface Resistance Test Kit Description The Desco Analog Surface Resistance Test Kit is a portable battery-powered instrument designed to
|
Original
|
PDF
|
TB-3046
TB-3046
ESD test plan
TR2020
|
Untitled
Abstract: No abstract text available
Text: TECHNICAL BULLETIN TB-3046 Analog Surface Resistance Test Kit Operation and Maintenance Figure 1. Desco 19784 Analog Surface Resistance Test Kit Description The Desco Analog Surface Resistance Test Kit is a portable battery-powered instrument designed to
|
Original
|
PDF
|
TB-3046â
TB-3046
|
racal 6104
Abstract: mobile fault & repair GSM/6104 power systems analysis, control and fault finding nokia 206 lcd racal gpib Racal Instruments BS 2G 210 PCMCIA SRAM Card EN50082-1
Text: Cellular Parametric Test Racal Instruments Wireless Solutions 6104 - Digital Radio Test Set • Easy to use, fully integrated test set optimized for maintenance and servicing of GSM850, GSM900, GSM1800 and GSM1900 mobiles • GPRS single slot receiver BLER
|
Original
|
PDF
|
GSM850,
GSM900,
GSM1800
GSM1900
racal 6104
mobile fault & repair
GSM/6104
power systems analysis, control and fault finding
nokia 206 lcd
racal gpib
Racal Instruments
BS 2G 210
PCMCIA SRAM Card
EN50082-1
|
10D14
Abstract: varistor 1302 V100
Text: Multilayer Varistors • Perfomance Characteristics Multilayer Varistors (Electrical) Characteristics Test Method Specifications Standard Test Condition Unless otherwise specified, all test and measurements (initial/after tests) shall be made at a temperature of 15 to 35 ¡C and at a
|
Original
|
PDF
|
|
Untitled
Abstract: No abstract text available
Text: Wireless 3550R Touch-Screen Radio Test System Now Available with Positive Train Control Test Option! The Complete Portable, On Site Radio Communication Test System for Analog and Digital Communication Systems The 3550R. The first truly portable touch-screen radio
|
Original
|
PDF
|
3550R
3550R.
|
INJECTOR
Abstract: transformer overheating message indicator system micronetics attenuator
Text: MICRONETICS Test Solutions Group Carrier-to-NoiseGeneratorOperating Manual VOLUME 1: User’s Guide MICRONETICS TEST SOLUTIONS GROUP CNG Operating Manual VERSION 2.0 MAY 2004 Micronetics Test Solutions Group 26 Hampshire Drive Hudson, NH 03051 Phone 603.883.2900 • Fax 603.882.8987
|
Original
|
PDF
|
CNG-77xx
INJECTOR
transformer overheating message indicator system
micronetics attenuator
|
Untitled
Abstract: No abstract text available
Text: Testing, Screening and Test Data Certified Test Data Certified test data is provided with each DBS amplifier. Data is taken with test equipment calibrated and maintained in accordance with MIL-C-45662. All amplifiers are routinely tested for: Small signal gain.
|
OCR Scan
|
PDF
|
MIL-C-45662.
5000g
1x10-6
MIL-STD-883
|
smd rnw
Abstract: ADG508A DG508A HI-508A HI-548 MAX358
Text: REVISIONS F V YR-M0-DA APPROVED 87-01-30 Change to military drawing format. Add device type 03. Device 01, case E, inactive for new design. Table I (device 01) change test condition for Ij|_- Table I (device 02): Delete test Rpgg ant^ ^CT' add test ÀRq s v change test conditions and limits for: «qs V CIS'
|
OCR Scan
|
PDF
|
1ES66.
MIL-BUL-103.
MIL-BUL-103
smd rnw
ADG508A
DG508A
HI-508A
HI-548
MAX358
|
