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    intersil DATE CODE MARKING

    Abstract: pin diagram details of CD4015 y2010 R4573 B TA3842 wafer fab control plan TA388* transistor ESD test plan ta5142 R4573
    Text: Status of Document is: RELEASED Effective from: 07-AUG-2000 09:48:23 to Date Printed: 07-Aug-2000 10:33:38 Controlled Document QML QUALITY MANAGEMENT PLAN Title: QML QUALITY MANAGEMENT PLAN Specification Type: DOCS Specification Number :999015 Issue :24 Page :1 of 100


    Original     		PDF 07-AUG-2000 28-SEP-1995 03-NOV-1995 21-SEP-1995 28-SEP-1995 intersil DATE CODE MARKING pin diagram details of CD4015 y2010 R4573 B TA3842 wafer fab control plan TA388* transistor ESD test plan ta5142 R4573

    APPLICATION CD4094

    Abstract: ta3842 tA 1507 989XXXX icl7667 die TA384 TA5072 ta1313 TA07667B 51122A
    Text: Status of Document is:RELEASED Effective from: 19-SEP-1997 14:23:42 to Date Printed: 09/24/97 7:48 AM Controlled Document SECTION 3.0 QML TECHNOLOGY SPECIFIC GENERAL This section of the Harris QM Plan provides a description of the database systems used to control the


    Original     		PDF 19-SEP-1997 APPLICATION CD4094 ta3842 tA 1507 989XXXX icl7667 die TA384 TA5072 ta1313 TA07667B 51122A