Untitled
Abstract: No abstract text available
Text: High-Rellability High-Speed CMOS Logic ICs CD54HC393/3A CD54HCT393/3A 37 E D Ha r r i s 4302271 semicond DDSST? 3 MHAS sector ''P 4 5 -2 .W 3 T - S M °l Switching Sp66d Lim its w ith black dots (. are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t r, t, = 6
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CD54HC393/3A
CD54HCT393/3A
Sp66d
54HCT
54HC/HCT
2k-47k
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CD4059B
Abstract: No abstract text available
Text: 4302571 0Q5b02fl 3 * 37 E IHAS HIgh-Rellability High-Speed CMOS Logic ICs HARRIS SEMICON» SECTOR CD54HC4053/3A CD54HCT4053/3A T -5 1 -1 2 Switching Sp66d Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (Ct. = 50 pF, Input t„ t, = 6 ns)
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0Q5b02fl
CD54HC4053/3A
CD54HCT4053/3A
Sp66d
CD54HC/HCT4053
CD54HC/HC
HCT4060
HC4060;
14-STAGE
CD4059B
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54HC
Abstract: CD54HC221 CD54HCT221 hct195
Text: High-Reliability High-Speed C M O S Logic ICs CD54HC195/3A CD54HCT195/3 A Switching Sp66d L im its w ith b la ck dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns) LIMITS TEST 25 >C 55 C to +125°C CONDITIONS S4HCT
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CD54HC195/3A
CD54HCT195/3
54HCT
CD54HC/HCT221
CD54HC/HCT221
2k-47k
54HC
CD54HC221
CD54HCT221
hct195
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Untitled
Abstract: No abstract text available
Text: ÛUALITY SEM IC ON DU CT OR INC 41E D Q S7201, Q • ?4bEifiG3 OGQQMbl S M û S I QS7202 High Sp66d CMOS 9-bit FIFO Buffer Memories 512x9: 1Kx9: QS7201 QS7202 FEATURES/BENEFITS •15ns flag and data access times • Fully Asynchronous Read and Write I • Zero fall-through time
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S7201,
QS7202
Sp66d
512x9:
QS7201
MIL-STD-883,
mil/600
QS7201
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SM5829P
Abstract: ISZ50
Text: n I Q / " n ip p o n p r e c is io n c ir c u it s l t d . SM5829P Hic|h-sp66d, 8 _bit Vsrisbls-lGnQth Shift RGQistGr O VER VIEW PINOUT The S M 5829P is a variable-length shift register fabricated in M olybdenum -gate CMOS. The length can be set to any value between 2 and 129.
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SM5829P
SM5829P
129-step
NC9108AE
ISZ50
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CT158
Abstract: CT-160
Text: High-Reliability High-Speed C M O S Logic ICs CD54HC158/3A CD54HCT158/3A Switching Sp66d L im its w itn bla ck d o ts (• are tested 100%.) S W IT C H IN G C H A R A C T E R IS T IC S <CL = 50 pF, Input t„ t, = 6 ns) L IM IT S TEST C O N D IT IO N S C H A R A C T E R IS T IC
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CD54HC158/3A
CD54HCT158/3A
54HCT
CT158
CT-160
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pzgl
Abstract: TTL ALU 54HC
Text: .High-Reliability High-Speed C M O S Logic ICs CD54HC182/3A CD54HCT182/3A Carry Generator T h e R CA C D 54H C 182 and C D 5 4 H C T 1 8 2 c a rry lookahead g e n e ra to rs are h ig h -sp e e d s ilic o n -g a te C M O S devices and are pin co m p a tib le w ith lo w -p o w e r S c h o ttk y T T L LS TTL .
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CD54HC182/3A
CD54HCT182/3A
CD54HC182
CD54HCT182
CD54HC/HCT182
HC/HCT182
CD54HC/HCT182
2k-47k
pzgl
TTL ALU
54HC
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CD4059B
Abstract: No abstract text available
Text: 37E D WÊ 430 2 27 1 002b02b T • HAS - High-Reliability High-Speed CMOS Logic ICs HARRIS S E M I C O N D SE CT OR CD54HC4052/3A CD54HCT4052/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns)
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002b02b
CD54HC4052/3A
CD54HCT4052/3A
54HCT
CD4059B
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