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    Part ECAD Model Manufacturer Description Download Buy
    SNJ54BCT8373AFK Texas Instruments Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125 Visit Texas Instruments Buy
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    Texas Instruments SNJ54BCT8373AFK

    Scan Test Device -55°C to 125°C 28-Pin CLLCC Tube
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    Arrow Electronics SNJ54BCT8373AFK 42 18 Weeks 42
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    Bristol Electronics SNJ54BCT8373AFK 47 1
    • 1 $54
    • 10 $51.921
    • 100 $47.7684
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    Quest Components SNJ54BCT8373AFK 37
    • 1 $58.5
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    • 100 $51.75
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    SNJ54BCT8373AFK Datasheets (3)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    SNJ54BCT8373AFK Texas Instruments Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125 Original PDF
    SNJ54BCT8373AFK Texas Instruments Scan Test Devices With Octal D-type Latches Original PDF
    SNJ54BCT8373AFK Texas Instruments SNJ54BCT8373 - Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125 Original PDF

    SNJ54BCT8373AFK Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    BCT8373A

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373 SCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N, BCT8373A

    V5050

    Abstract: F373 SN54BCT8373A SN74BCT8373A
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A V5050 F373 SN54BCT8373A SN74BCT8373A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373

    F373

    Abstract: SN54BCT8373A SN74BCT8373A
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A F373 SN54BCT8373A SN74BCT8373A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373

    F373

    Abstract: SN54BCT8373A SN74BCT8373A
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A F373 SN54BCT8373A SN74BCT8373A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373

    JD 1803

    Abstract: jd 1803 IC jd 1803 data sheet SNV55LVDS31W SNV55LVDS32W jd 1803 data SMV320C6701GLPW14 54LS74A bistable multivibrator using ic 555 SNV54LVTH162245WD
    Text: Mil Sel Guide 04-home-new.qxd R 8/11/2004 2:21 PM E A L W Page 1 O R L D S I G N A L P TM R O C E S S I N G Military Semiconductors Selection Guide 2004-2005 Mil Sel Guide 04-home-new.qxd 8/11/2004 2:21 PM Page 2 Table of Contents and Introduction Enhanced Plastic


    Original     		PDF 04-home-new JD 1803 jd 1803 IC jd 1803 data sheet SNV55LVDS31W SNV55LVDS32W jd 1803 data SMV320C6701GLPW14 54LS74A bistable multivibrator using ic 555 SNV54LVTH162245WD

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A

    F373

    Abstract: SN54BCT8373A SN74BCT8373A SCBS044f
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A F373 SN54BCT8373A SN74BCT8373A SCBS044f

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT8373A SN54BCT8373A

    jd 1803 IC

    Abstract: JD 1803 jd 1803 data sheet Mil JAN jm38510 Cross Reference LM 4017 decade counter driver bistable multivibrator using ic 555 UC1895 integrate JD 1803 eltek flatpack jd 1803 data
    Text: R E A L MILITARY SEMICONDUCTORS SELECTION GUIDE 2002 W O R L D S I G N A L P R O S E S S I N G TM Important Information AMERICAS PRODUCT INFORMATION Product Information Center PIC . . . . . . . . . . . .(972) 644-5580 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .(800) 477-8924


    Original     		PDF

    TSMC 0.18 um MOSfet

    Abstract: M38510 10102BCA IDT7204L 5962-8768401MQA 0.18um LDMOS TSMC sl1053 TSMC 0.25Um LDMOS UT63M125BB SMD RTAX250S-CQ208 5962-04221
    Text: DSCC Supplemental Information Sheet for Electronic QML-38535 Specification Details: Date: 9/2/2008 Specification: MIL-PRF-38535 Title: Advanced Microcircuits Federal Supply Class FSC : 5962 Conventional: No Specification contains quality assurance program: Yes


    Original     		PDF QML-38535 MIL-PRF-38535 MIL-STD-790 MIL-STD-690 -581DSCC QML-38535 TSMC 0.18 um MOSfet M38510 10102BCA IDT7204L 5962-8768401MQA 0.18um LDMOS TSMC sl1053 TSMC 0.25Um LDMOS UT63M125BB SMD RTAX250S-CQ208 5962-04221

    5962L0053605VYC

    Abstract: 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA
    Text: NOT MEASUREMENT SENSITIVE MIL-HDBK-103AJ 19 SEPTEMBER 2011 SUPERSEDING MIL-HDBK-103AH 28 MARCH 2011 DEPARTMENT OF DEFENSE HANDBOOK LIST OF STANDARD MICROCIRCUIT DRAWINGS This handbook is for guidance only. Do not cite this document as a requirement. AMSC N/A


    Original     		PDF MIL-HDBK-103AJ MIL-HDBK-103AH MIL-HDBK-103AJ 5962L0053605VYC 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373