BCT8373A
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
SCBA004C
SDYA010
SDYA012
SSYA002C,
SZZU001B,
SDYU001N,
BCT8373A
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V5050
Abstract: F373 SN54BCT8373A SN74BCT8373A
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
V5050
F373
SN54BCT8373A
SN74BCT8373A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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F373
Abstract: SN54BCT8373A SN74BCT8373A
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
F373
SN54BCT8373A
SN74BCT8373A
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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PDF
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F373
Abstract: SN54BCT8373A SN74BCT8373A
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
F373
SN54BCT8373A
SN74BCT8373A
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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V5050
Abstract: F373 SN54BCT8373A SN74BCT8373A
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
V5050
F373
SN54BCT8373A
SN74BCT8373A
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
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PDF
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F373
Abstract: SN54BCT8373A SN74BCT8373A SCBS044f
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
F373
SN54BCT8373A
SN74BCT8373A
SCBS044f
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PDF
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F373
Abstract: SN54BCT8373A SN74BCT8373A
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
F373
SN54BCT8373A
SN74BCT8373A
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PDF
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1-BIT D Latch
Abstract: 74F373 F373 SN54BCT8373A SN74BCT8373A 74BCT373 74bct8373
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT8373A
SN54BCT8373A
1-BIT D Latch
74F373
F373
SN54BCT8373A
SN74BCT8373A
74BCT373
74bct8373
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Boundary Scan JTAG Logic
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
Boundary Scan JTAG Logic
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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Original
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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SN54LVT18502
Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
Text: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the
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Original
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SN74BCT8374A
ti8374;
ispGDX160VA-3Q208;
SN54LVT18502
SN54ABT8245
SN54ABT8543
SN54ABTH18502A
SN54BCT8240A
SN54BCT8244A
SN54BCT8245A
SN54BCT8373A
SN74ABT18245A
SN74ABT18502
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PDF
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SN54LVT18502
Abstract: No abstract text available
Text: Using ispGDX to Replace Boundary Scan Bus Devices TM the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the
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Original
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SN74BCT8374A
ti8374;
ispGDX160VA-3Q208;
SN54LVT18502
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES _ SCBS044F - JUNE 1990 - REVISED JULY 1996 I • | I • • [ • • • • • Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits
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OCR Scan
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES S C B S 04 4F -JU N E 1990-R E V IS E D JULY 1996 | • [ • • • • • • • Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits
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OCR Scan
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SN54BCT8373A,
SN74BCT8373A
1990-R
SN54/74F373
SN54/74BCT373
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PDF
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1S94
Abstract: DDT7373 SN54BCT373 SN54BCT8373A SN54F373 SN54F37
Text: SN54BCT8373A SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES S C B S 044D - JUNE 1990 - REVISED JUNE 1994 • Member of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuit • Functionally Equivalent to SN54F373 and
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OCR Scan
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SN54BCT8373A
SCBS044D
SN54F373
SN54BCT373
1S94
DDT7373
SN54F37
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PDF
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Untitled
Abstract: No abstract text available
Text: SAMSUNG ELECTRONICS INC b?E D • 7 ^ 4 1 4 2 DDlSSSfl 171 I KM41C4000B SUGK CMOS DRAM 4 M x 1 Bit CMOS Dynamic RAM with Fast Page Mode FEATURES GENERAL DESCRIPTION • Performance range: The Samsung KM41C4000B is a high speed CMOS 4,194,304 x 1 Dynamic Random Access Memory. Its de
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KM41C4000B
KM41C4000B
110ns
KM41C4000B-7
130ns
KM41C4000B-8
150ns
KM41C4000B-6
SN54BCT8373A
i1bl723
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