SI4735 VHF Search Results

AN388

Abstract: Si4743 Si474x Si470x Si4735 Si4740 SI4734 Si4749 SI4711 si4708
Text: AN388 S i 4 7 0 X / 1 X / 2 X / 3 X /4 X E V A L U A T I O N B O A R D TE S T P R O C E DUR E 1. Introduction The purpose of this document is to describe the test procedures used in Silicon Laboratories for the Si470x/1x/2x/ 3x/4x evaluation boards EVB . It is also intended to enable customers to exactly replicate Silicon Laboratories’ test