Untitled
Abstract: No abstract text available
Text: SN54LVT8986, SN74LVT8986 3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS www.ti.com SCBS759E – OCTOBER 2002 – REVISED MAY 2007 FEATURES • • • • • • • Members of the Texas Instruments (TI) Family
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SN54LVT8986,
SN74LVT8986
SCBS759E
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SCANSTA111
Abstract: STA111
Text: SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board
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SCANSTA111
SCANSTA111
IEEE1149
STA111
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LVT8986
Abstract: SN54LVT8986 SN74LVT8986 SN74LVT8986GGV SN74LVT8986PM SNJ54LVT8986HV
Text: SN54LVT8986, SN74LVT8986 3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS SCBS759B – OCTOBER 2002 – REVISED APRIL 2003 D D D D D D D D Members of the Texas Instruments (TI) Family of JTAG Scan-Support Products
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SN54LVT8986,
SN74LVT8986
SCBS759B
LVT8986
SN54LVT8986
SN74LVT8986
SN74LVT8986GGV
SN74LVT8986PM
SNJ54LVT8986HV
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SCANPSC110F
Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Text: General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a
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SCANPSC110F
32-bit
cou85
ds011570
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
SCANPSC110FSC
SCANPSC110FSCX
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FB 3306
Abstract: 7200L 18504 845 motherboard circuit 7804 inverter 7805 ACT 845 motherboard BTL 8 236 CMOS 4060 cmos open collector
Text: Section 2 Functional Index Gates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2–3 Inverting/Noninverting Buffers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2–5 Buffers/Drivers and Bus Transceivers . . . . . . . . . . . . . . . . . . . . . . . . . . . 2–5
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Untitled
Abstract: No abstract text available
Text: SN54LVT8986, SN74LVT8986 3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS www.ti.com SCBS759D – OCTOBER 2002 – REVISED MARCH 2006 FEATURES • • • • • • • Members of the Texas Instruments (TI) Family
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SN54LVT8986,
SN74LVT8986
SCBS759D
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memoguard
Abstract: LM 327 CN LSH 26180 LiMnO2 LSH 20 safety Electronic toll collect ba5112 leclanche LSH 14250 SAFT space
Text: Primary lithium batteries Selector guide February 2005 Saft Lithium batteries meeting your needs… For more than 31 years, Saft has pioneered the development and production of primary lithium cells and battery packs in Europe, North America and Asia/Pacific.
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LVT8986
Abstract: SN54LVT8986 SN74LVT8986 SN74LVT8986GGV SN74LVT8986PM SN74LVT8986ZGV SNJ54LVT8986HV STDO1
Text: SN54LVT8986, SN74LVT8986 3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS www.ti.com SCBS759E – OCTOBER 2002 – REVISED MAY 2007 FEATURES • • • • • • • Members of the Texas Instruments (TI) Family
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SN54LVT8986,
SN74LVT8986
SCBS759E
LVT8986
SN54LVT8986
SN74LVT8986
SN74LVT8986GGV
SN74LVT8986PM
SN74LVT8986ZGV
SNJ54LVT8986HV
STDO1
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SCANPSC110F
Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan
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SCANPSC110F
IEEE1149
SCANPSC110F
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
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LSP01
Abstract: sgpio backplane AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 STA112
Text: National Semiconductor Application Note 1259 April 2003 Introduction the ScanBridge. This insures that all of the TAPs on the LSPs are in a reset mode. The SCANSTA112 is the third device in a series that enable multi-drop address and multiplexing of IEEE-1149.1 scan
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SCANSTA112
IEEE-1149
STA112
SCANPSC110
SCANSTA111.
AN-1259
LSP01
sgpio backplane
AN-1259
SCANSTA111
STA111
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hct 4047 bt
Abstract: SN74ALS679 FCT Fast CMOS TTL Logic 74LS 4075 7804 inverter SN74368A DTL Logic 4069 CMOS hex inverter SN502 CD74AC374
Text: IMPORTANT NOTICE Texas Instruments and its subsidiaries TI reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold
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SDYZ001A,
SN74LS138D
SN74LS138DR
SN74LS138N
SN74LS138N3
SN74LS138NSR
images/sn74ls138
hct 4047 bt
SN74ALS679
FCT Fast CMOS TTL Logic
74LS 4075
7804 inverter
SN74368A
DTL Logic
4069 CMOS hex inverter
SN502
CD74AC374
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74HCT 4013
Abstract: CD4078 4093 BF SN74368A SN74ALS679 LXZ Series 4069 CMOS hex inverter 2a2 vacuum tube CD74AC374 cd408
Text: SN54HC240, SN74HC240 OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS SCLS128B – DECEMBER 1982 – REVISED MAY 1997 D D SN54HC240 . . . J OR W PACKAGE SN74HC240 . . . DW OR N PACKAGE TOP VIEW 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers
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SN54HC240,
SN74HC240
SCLS128B
300-mil
SN54HC240
SN74HC240
HC240
SDYZ001A,
SN74HC240DW
SN74HC240DWR
74HCT 4013
CD4078
4093 BF
SN74368A
SN74ALS679
LXZ Series
4069 CMOS hex inverter
2a2 vacuum tube
CD74AC374
cd408
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Untitled
Abstract: No abstract text available
Text: SCANSTA111 www.ti.com SNLS060K – AUGUST 2001 – REVISED APRIL 2013 SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port Check for Samples: SCANSTA111 FEATURES DESCRIPTION • The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The
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SCANSTA111
SNLS060K
SCANSTA111
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Untitled
Abstract: No abstract text available
Text: SCANSTA111 www.ti.com SNLS060K – AUGUST 2001 – REVISED APRIL 2013 SCANSTA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port Check for Samples: SCANSTA111 FEATURES DESCRIPTION • The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The
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SCANSTA111
SNLS060K
SCANSTA111
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LSP01
Abstract: AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 STA112 sgpio backplane
Text: National Semiconductor Application Note 1259 August 7, 2008 Introduction Transparent Mode - Transparent mode refers to a condition of operation in which there are no pad-bits or 'STA112 registers in the scan chain. The Transparent mode of operation is available in both ScanBridge and Stitcher modes. Only the
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STA112
LSP01
AN-1259
LSP01
AN-1259
SCANPSC110
SCANSTA111
SCANSTA112
STA111
sgpio backplane
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code 4 bit LFSR
Abstract: h bridge CSP
Text: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan
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SCANPSC110F
IEEE1149
code 4 bit LFSR
h bridge CSP
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LSP01
Abstract: AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 STA112
Text: National Semiconductor Application Note 1259 February 2004 Introduction the ScanBridge. This insures that all of the TAPs on the LSPs are in a reset mode. The SCANSTA112 is the third device in a series that enable multi-drop address and multiplexing of IEEE-1149.1 scan
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SCANSTA112
IEEE-1149
STA112
SCANPSC110
SCANSTA111.
AN-1259
LSP01
AN-1259
SCANSTA111
STA111
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Untitled
Abstract: No abstract text available
Text: SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The SCANSTA111 Enhanced Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial
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SCANSTA111
SCANSTA111
IEEE1149
ds101245
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SN74ALVCH162245
Abstract: Schottky Barrier Diode Bus-Termination Array SN7400 CLOCKED SLLS210 SCAD001D TEXAS INSTRUMENTS SN7400 SERIES buffer SN74LVCC4245 sn74154 SDAD001C SN7497
Text: Section 4 Logic Selection Guide ABT – Advanced BiCMOS Technology . . . . . . . . . . . . . . . . . . . . . . . . . . 4–3 ABTE/ETL – Advanced BiCMOS Technology/ Enhanced Transceiver Logic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4–9
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SCANPSC110FFMQB
Abstract: PSC11 SCANPSC110F SCANPSC110FDMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Text: + / March 1998 P A IF ?C H II_ D SEMICONDUCTOR i SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) General Description Features The SC ANPSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan
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SCANPSC110F
IEEE1149
SCANPSC110F
28-Lead
28-Pin
WA28D
ds011570
SCANPSC110FFMQB
PSC11
SCANPSC110FDMQB
SCANPSC110FLMQB
SCANPSC110FSC
SCANPSC110FSCX
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Untitled
Abstract: No abstract text available
Text: Semiconductor SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop te st bus environm ent. The advan
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SCANPSC110F
IEEE1149
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6502 microprocessor
Abstract: plessey cla 3000 crompton K-50-50 ferranti ztx SP92701 draw pin configuration of ic 7404 SP9754
Text: DATA CONVERTERS & Voltage References IC Handbook APLE SSE Y Sem iconductors Foreword The collective description of Data Conversion covers a vast range of applications which is limited only by the imagination of today’s system designers. Traditionally the name of Plessey
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SCANPSC110
Abstract: SCANPSC110F SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB lfsr16
Text: O ctober 1999 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 M ulti-cast G roup Addresses General Description The SC AN PSC 110F Bridge extends the IEEE Std. 1149.1
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SCANPSC110F
IEEE1149
SCANPSC110F
SCANPSC110
SCANPSC110FDMQB
SCANPSC110FFMQB
SCANPSC110FLMQB
lfsr16
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3866S
Abstract: BF247 equivalent brochage des circuits integres Triac GK transistor bc 564 BC547E TI Small Signal FET Catalogue bcw 91 transistor SESCO SESCOSEM
Text: GENERAL INFORMATION , , v^ INFORMATION GENERALE ” ; V Index Index 3 ' v.»A* K \ a 1 Selection guide Guide de sélection Qualified devices Dispositifs homologués Quality Qualité Symbols Symboles DATA SHEETS NOTICES SILICON SIGNAL TRANSISTORS TRANSISTORS DE SIGNAL AU SILICIUM
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