RTSX32
Abstract: oscilloscope MTBF
Text: Application Note Metastability Characterization Report I n tro du ct i on The setup and hold times of a register may deviate from ideal register behavior in actual applications as a result of finite circuit delays. A synchronization failure may occur if the data and clock do not satisfy the setup- and hold-time
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RTSX32
1240XL
RTSX32
oscilloscope MTBF
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RT54SX32S-CQ208B
Abstract: RT54SX72SCQ208 RT1280A-CQ172 Actel A1020B RT54SX16S-CQ256B 30-80LET Single Event Latchup FPGA
Text: Actel FPGAs for Space Applications Uncompromising in the Extreme n n n n n Total Dose Capabilities from 5Krads to 1M rad Latch-up Immune Device Capacities from 4,000 to 72,000 Available Gates Highly Reliable, Non-Volatile Antifuse Technology Meets the Most Stringent Quality
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1-888-99-ACTEL
RT54SX32S-CQ208B
RT54SX72SCQ208
RT1280A-CQ172
Actel A1020B
RT54SX16S-CQ256B
30-80LET
Single Event Latchup FPGA
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RT54SX72SCQ208
Abstract: rt1280 RT54SX32S-CQ208 RTSX72 RT1020-CQ84B aircraft logic gates RTSX72S RT1425 RT14100 RH1020-CQ84V
Text: Civilian/Scientific Exploration Actel FPGAs for Space Applications Uncompromising in the Extreme Deep Space I Device Speed Grade Gates Logic Modules Available I/Os DSCC SMD Mars Surveyor RadHard RH1020-CQ84V Std 4,000 547 69 5962F90965 RH1280-CQ172V Std 16,000
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RH1020-CQ84V
RH1280-CQ172V
RH54SXxx-CQ256V
5962F90965
5962F92156
RT54SX16-CQ208
RT54SX16-CQ256
E1020
RH1280
RH1280
RT54SX72SCQ208
rt1280
RT54SX32S-CQ208
RTSX72
RT1020-CQ84B
aircraft logic gates
RTSX72S
RT1425
RT14100
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RTSX32
Abstract: RTSX32S 13B8 EX64-TQ64 12B4 10B4 A54SX72A AC160 RT54SX72S RTSX72S
Text: Application Note AC160 IEEE Standard 1149.1 JTAG in the SX/RTSX/SX-A/eX/RT54SX-S Families In t ro d u ct i o n Testing modern loaded circuit boards has become extremely expensive and very difficult to perform. The rapid development of surface-mount technology and the use of
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AC160
SX/RTSX/SX-A/eX/RT54SX-S
RTSX32
RTSX32S
13B8
EX64-TQ64
12B4
10B4
A54SX72A
AC160
RT54SX72S
RTSX72S
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208-Pin CQFP
Abstract: Actel PQFP208 RTSX32
Text: v2.1 SX Family FPGAs RadTolerant and HiRel Features High Density Devices • • • RadTolerant SX Family • • • • • • Tested Total Ionizing Dose TID Survivability Level Radiation Performance to 100 Krads (Si) (ICC Standby Parametric) Devices Available from Tested Pedigreed Lots
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Abstract: No abstract text available
Text: v 2 .0 54SX Family FPGAs RadTolerant and HiRel Hig h D ens it y De vi ces Fe a t ur es • 16,000 and 32,000 Available Logic Gates Rad To ler ant 54S X Fam i ly • Tested Total Ionizing Dose TID Survivability Level • Up to 228 User I/Os • Radiation Performance to 100Krads (Si) (ICC Standby
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100Krads
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RTSX32
Abstract: 54SX32 034 MEC RTSX16
Text: Preliminary v1.5.1 54SX Family FPGAs RadTolerant and HiRel Fe a t ur es • Up to 225 User I/Os Rad To ler ant 54S X Fam i ly • Up to 1,080 Dedicated Flip-Flops • Tested Total Ionizing Dose TID Survivability Level E asy L ogi c In teg ra ti on • Radiation Performance to 100Krads (Si) (ICC Standby
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RTSX32
54SX32
034 MEC
RTSX16
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RTSX32
Abstract: RT54SX32-CQ208 trd24 RTSX16 54SX A54SX16 A54SX32 RT54SX RT54SX72S Actel PQFP208
Text: v2.1 SX Family FPGAs RadTolerant and HiRel Features High Density Devices • • • RadTolerant SX Family • • • • • • Tested Total Ionizing Dose TID Survivability Level Radiation Performance to 100 Krads (Si) (ICC Standby Parametric) Devices Available from Tested Pedigreed Lots
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RTSX32
Abstract: TRANSISTOR ASY 28 54SX A54SX16 A54SX32 RT54SX Cqfp256
Text: Preliminary v1.5.2 54SX Family FPGAs RadTolerant and HiRel Fe a t ur es • Up to 225 User I/Os Rad To ler ant 54S X Fam i ly • Up to 1,080 Dedicated Flip-Flops • Tested Total Ionizing Dose TID Survivability Level E asy L ogi c In teg ra ti on • Radiation Performance to 100Krads (Si) (ICC Standby
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RTSX32
TRANSISTOR ASY 28
54SX
A54SX16
A54SX32
RT54SX
Cqfp256
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Untitled
Abstract: No abstract text available
Text: Preliminary v1.5 54SX Family FPGAs RadTolerant and HiRel Fe a t ur es • Up to 225 User I/Os Rad To ler ant 54S X Fam i ly • Up to 1,080 Dedicated Flip-Flops • Tested Total Ionizing Dose TID Survivability Level E asy L ogi c In teg ra ti on • Radiation Performance to 100Krads (Si) (ICC Standby
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Abstract: No abstract text available
Text: v 2 .0 54SX Family FPGAs RadTolerant and HiRel Hig h D ens it y De vi ces Fe a t ur es • 16,000 and 32,000 Available Logic Gates Rad To ler ant 54S X Fam i ly • Tested Total Ionizing Dose TID Survivability Level • Up to 228 User I/Os • Radiation Performance to 100Krads (Si) (ICC Standby
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RTSX32
Abstract: 54SX A54SX16 A54SX32 RT54SX RT54SX72S RTSX16
Text: v 2 .0 54SX Family FPGAs RadTolerant and HiRel Hig h D ens it y De vi ces Fe a t ur es • 16,000 and 32,000 Available Logic Gates Rad To ler ant 54S X Fam i ly • Tested Total Ionizing Dose TID Survivability Level • Up to 228 User I/Os • Radiation Performance to 100Krads (Si) (ICC Standby
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A54SX16
A54SX32
RT54SX
RT54SX72S
RTSX16
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ACT1020
Abstract: JH05 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR 44 pin actel 1020b JEDEC-A113 ACTEL 1020B ACP55 smd U1p Jl03 JL-03
Text: Quality & Reliability Guide February 2001 2001 Actel Corporation All Rights Reserved. Actel and the Actel logo are trademarks of Actel Corporation. All other brand or product names are the property of their respective owners. Contents 1. Overview of Actel’s Quality and Reliability Guide . . . . . . . . . . . . . . . . . . . .1
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