4932
Abstract: 7086 generic failure rate D2863 JESD47 M2003 M2004 JESD-47 HTGB
Text: Reliability Information Vishay Siliconix Reliability at Vishay Siliconix This document provides a general description of Vishay Siliconix’s reliability program. The reliability data for specific products is available from the information page associated with each part. The general reliability description provided below and the reliability
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17-Nov-05
UL-94
D2863
J-STD-020C)
4932
7086
generic failure rate
JESD47
M2003
M2004
JESD-47
HTGB
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Hewlett-Packard transistor microwave
Abstract: HSMS-285A
Text: Passivated P-Type Microwave Schottky Diodes Reliability Data HSMS-285A/5X Description For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is compiled from reliability tests run to
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HSMS-285A/5X
MIL-STD-750
1051C
DOD-HDBK-1686
Hewlett-Packard transistor microwave
HSMS-285A
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IN5767
Abstract: 1N5767
Text: PIN Diodes Reliability Data 1N5767 5082-3080 5082-3188 Description Applications For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is initially compiled from reliability tests run prior to
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1N5767
MIL-S-19500
DOD-HDBK-1686
IN5767
IN5767
1N5767
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1N5719
Abstract: diode 5082-3077
Text: PIN Diodes Reliability Data 1N5719 5082-3001 5082-3039 5082-3077 Description For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is initially compiled from reliability tests run prior to
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1N5719
MIL-S-19500
DOD-HDBK-1686
1N5719
diode 5082-3077
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JESD22-A115-A
Abstract: JESD22-A115A JESD22-A113D HSMP-282Y JESD22-A114-C JESD22-A114 HSMS-286Y JESD22-A113-D transistor A114 JESD22A115A
Text: HSMS-282Y, HSMS-285Y, HSMS-286Y Schottky Diode Reliability Data Sheet Description Reliability Prediction Model This document describes the reliability performance of HSMS-285Y based on a series of reliability test conducted. An exponential cumulative failure function constant
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HSMS-282Y,
HSMS-285Y,
HSMS-286Y
HSMS-285Y
JESD22-A113-D
AV01-0356EN
JESD22-A115-A
JESD22-A115A
JESD22-A113D
HSMP-282Y
JESD22-A114-C
JESD22-A114
HSMS-286Y
transistor A114
JESD22A115A
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JA113
Abstract: JESD-A103 JESD-A102 JESDA103 avago MSL 1 optocoupler MTTF
Text: ACPL-K49T Wide Operating Temperature Automotive R2CouplerTM 20kBd Digital Optocoupler Configurable as Low Power, Low Leakage Phototransistor Reliability Data Sheet Description Definition of Failure The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done
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ACPL-K49T
20kBd
JESD-A110
96hrs
1000hrs
15psig
JESD-A103
JESD-A102
AV02-3187EN
JA113
JESD-A103
JESD-A102
JESDA103
avago MSL 1
optocoupler MTTF
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JESD-B-102
Abstract: AVAGO DIP JESD-A102 JA113
Text: ACPL-M71U, ACPL-M72U Wide Operating Temperature High Speed, Low Power CMOS Digital Optocoupler with R2CouplerTM Isolation Reliability Data Sheet Description Definition of Failure The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done
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ACPL-M71U,
ACPL-M72U
JESD-A110
15psig
JESD-A102
JESD-A103
AV02-3713EN
JESD-B-102
AVAGO DIP
JESD-A102
JA113
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DOD-HDBK-1686
Abstract: No abstract text available
Text: Mesh Schottky Diodes Reliability Data 5082-2303 5082-2900 Description For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is compiled from reliability tests run to demonstrate that a product meets
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MIL-STD-750
1051C
DOD-HDBK-1686
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AVAGO DIP
Abstract: 0133E MIL-STD-217 FIT
Text: HCNW138 and HCNW139 Low Input Current, High Gain Optocouplers Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use
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HCNW138
HCNW139
MIL-STD-883
1000hrs
AV01-0133EN
AVAGO DIP
0133E
MIL-STD-217 FIT
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HPND-4005
Abstract: HPND-4028
Text: Beam Lead PIN Diodes Reliability Data HPND-4005 HPND-4028 HPND-4038 Description Applications For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is initially compiled from reliability tests run prior to
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HPND-4005
HPND-4028
HPND-4038
MIL-S-19500
DOD-HDBK-1686
HPND-4038
5965-8892E
5967-6072E
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DOD-HDBK-1686
Abstract: No abstract text available
Text: Passivated P-Type Microwave Schottky Diodes Reliability Data HSMS-285A/5X Description For applications requiring component reliability estimation, Agilent Technologies provides reliability data for all families of devices. Data is compiled from reliability tests run to demonstrate that a product meets the
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HSMS-285A/5X
DOD-HDBK-1686
5965-8868E
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MIL-STD-217 FIT
Abstract: No abstract text available
Text: HCPL-3140 0.4A Photocoupler Reliability Data Sheet Description Operating Life Test The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done on this product family. All of these products use the same LEDs, similar IC, and the same packaging
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HCPL-3140
MIL-STD-883
121oC
AV01-0659EN
MIL-STD-217 FIT
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koike relays
Abstract: ed27 smd diode EM 231 WIRING DIAGRAM corona discharge circuit simulation smd transistor marking xy TOSHIBA Thyristor tunnel diode GaAs QFP100 injection molding machine wire diagram position sensitive diode circuit
Text: [ 2 ] Semiconductor Reliability Contents 1. Reliability Concept . 1 1.1 Defining and Quantifying Reliability. 1 1.2 1.3 Reliability and Time. 1
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NS-15,
koike relays
ed27 smd diode
EM 231 WIRING DIAGRAM
corona discharge circuit simulation
smd transistor marking xy
TOSHIBA Thyristor
tunnel diode GaAs
QFP100
injection molding machine wire diagram
position sensitive diode circuit
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68hc26
Abstract: 68HC05C4 68hc705p9 68HC05B6 JPC3400 68hc805b6 68705r3 68HC05C12 68HC705B5 68HC68SE
Text: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION . 1-1 RELIABILITY DATA BY TECHNOLOGY. 2-1
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DOD-HDBK-1686
Abstract: HPND-4028 4038 HPND-4005 HPND-4038
Text: Beam Lead PIN Diodes Reliability Data HPND-4005 HPND-4028 HPND-4038 Description Applications For applications requiring component reliability estimation, Agilent Technologies provides reliability data for all families of devices. Data is initially compiled
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HPND-4005
HPND-4028
HPND-4038
MIL-S-19500
DOD-HDBK-1686
HPND-4005
HPND-4028
HPND-4038
5967-6072E
4038
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Untitled
Abstract: No abstract text available
Text: Reliability Datasheet Philips Lumileds SignalSure Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SignalSure included extensive operational life-time and
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AEC-Q101C
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Untitled
Abstract: No abstract text available
Text: Reliability Datasheet Philips Lumileds SnapLED Qualification Reliability Testing Reliability testing based on Philips Lumileds’ in-house quality test – Multi Environment Over Stress Test MEOST The development of SnapLED included extensive operational life-time and
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AEC-Q101C
SnapLED150.
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max232 16 pin diagram with pin function
Abstract: MAX232 MAX232 pin diagram 9434 8 pin integrated circuit max232 specification max232 diagram MXL902 NSO package MAX232 all pin diagram MAX202, MAX232
Text: February 1996 RR-2B Surface-Mount Devices Reliability Report This report presents reliability data for Maxim’s surfacemount devices, including the results of extensive reliability stress tests performed solely on epoxy surface-mount packages since 1991.
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28-lead
44-lead
max232 16 pin diagram with pin function
MAX232
MAX232 pin diagram
9434 8 pin integrated circuit
max232 specification
max232 diagram
MXL902
NSO package
MAX232 all pin diagram
MAX202, MAX232
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D87C257
Abstract: ic 41315 D27256 US94V D2732A intel 2708 eprom intel 4308 intel EPROM RR-35 D27C256
Text: in ter RELIABILITY REPORT RR-35 November 1990 EPROM RELIABILITY DATA SUMMARY Order Number: 210473-007 5-287 5 RR-35 INTEL EPROM RELIABILITY DATA SUMMARY CONTENTS page The Importance of Reliability. 5-289 EPROM Reliability Data Summary . 5-289
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RR-35
D2732A
D2764A
D27128A
D27256
D27C256
D87C257
P2764A.
27C256
D87C257
ic 41315
D27256
US94V
D2732A
intel 2708 eprom
intel 4308
intel EPROM
RR-35
D27C256
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Sumitomo CRM 1033B
Abstract: sumitomo 1033B CRM1033B MOTOROLA POWER TRANSISTOR lc 945 sumitomo crm-1033B 8361J
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Reliability Information Motorola Reliability and Quality Assurance Reliability Motorola has a long standing reputation for manufacturing products of excellent Quality and Reliability since the introduction of the first car
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BR1339
Sumitomo CRM 1033B
sumitomo 1033B
CRM1033B
MOTOROLA POWER TRANSISTOR lc 945
sumitomo crm-1033B
8361J
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P21256
Abstract: p21464 411K intel 21256 p21010
Text: intei RELIABILITY REPORT RR-62 September 1989 Dynamic RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240543-001 3-158 DRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 OVERVIEW . 3-160
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RR-62
P21256
p21464
411K
intel 21256
p21010
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33190B
Abstract: 33102A 33144A 33016c MIL-HDBK-217D
Text: Whp%HEWLETT mi/ÍMPACKARD Switches, Switch Drivers Reliability Data Description where: For applications requiring com ponent reliability estimation, Hewlett-Packard provides reliability data for the High Speed Circuit devices. Data is compiled from reliability tests to
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33016C
3102A
3104A
3132A
3134A
33190B
33102A
33144A
MIL-HDBK-217D
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RR-63
Abstract: No abstract text available
Text: inteT RELIABILITY REPORT RR-63 August 1989 4 Static RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240544-001 4-63 SRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 IN T R O D U C T IO N .4-65
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RR-63
RR-63
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33005D
Abstract: 330-05D cool compiled 33003B MIL-HDBK-217D 33003a
Text: r ¿ n l H EW LETT mL/ÍMP A C K A R D Comb Generators Reliability Data D escription where: For applications requiring com ponent reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is compiled from reliability tests to demonstrate
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failures/106
3002A
33002B
3003A
33003B
3004A
33004B
33005D
330-05D
cool compiled
MIL-HDBK-217D
33003a
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