quality assurance for semiconductor devices
Abstract: in-process quality inspections ISO9002 BS5750 semiconductor quality assurance office organization Seminar national semiconductor
Text: QUALITY ASSURANCE FOR SEMICONDUCTOR DEVICES II. QUALITY ASSURANCE FOR SEMICONDUCTOR DEVICES 1. QUALITY ASSURANCE SYSTEM FOR SEMICONDUCTOR DEVICES 2. QUALITY ASSURANCE AT DEVELOPMENT STAGE 3. QUALITY ASSURANCE AT MASS PRODUCTION STAGE 4. FAILURE AFTER SHIPPING AND CORRECTIVE ACTIONS
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quality assurance for semiconductor devices
Abstract: MIL-HDBK-217 Semiconductor Devices mitsubishi packaging
Text: Quality Assurance and Reliability Testing Table of Contents I. RELIABILITY OF SEMICONDUCTOR DEVICES II. QUALITY ASSURANCE FOR SEMICONDUCTOR DEVICES III. FAILURE MECHANISMS OF SEMICONDUCTOR DEVICES IV. FAILURE ANALYSIS V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
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marking IAM transistor sot-23
Abstract: ATF-13170 transistor MARKING IAM IAM-XXX08 IAM-81008 HSMP 30XX HSMP 30XX ATF HSMS-282X HSMS-820X JESD22
Text: Quality Assurance Concepts and␣ Methodology Semiconductor Devices and Hybrid␣ Assemblies Reliability/Quality Philosophy Recognizing the increasing importance of microwave component reliability for the consumer, industrial, and military markets, the Components Group
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500mW 808nm infrared laser diode driver circuit
Abstract: LM358 laser driver SLD323 blue CD laser pickup assembly 2SK405 equivalent 808nm 1W laser diode laser Semicondutor fiber optic Laser diode lm358 lm358 laser current driver DVD optical pick-up assembly
Text: LASER DI O D E G SONY SEMICONDUCTOR ation U I D E Notes • Responsibility for quality assurance, defect warranties and other items relating to individual transactions shall conform to these sales contracts and other adjunct contracts concluded between the Sony Sales Department or Sony agents and customers.
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than-60dB.
500mW 808nm infrared laser diode driver circuit
LM358 laser driver
SLD323 blue
CD laser pickup assembly
2SK405 equivalent
808nm 1W laser diode
laser Semicondutor fiber optic
Laser diode lm358
lm358 laser current driver
DVD optical pick-up assembly
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toshiba lot traceability
Abstract: toshiba control code toshiba traceability toshiba trace code Diversified Engineering and Manufacturing semiconductor quality assurance office organization failure report micron Standard Bar Code Label Wuxi Automation Engineering toshiba weekly code two digits marking
Text: Semiconductor Reliability Handbook Semiconductor Company ● Toshiba is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility
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JESD22-A108-A
Abstract: JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners
Text: Reliability and Quality Assurance February 2002 Introduction Lattice Semiconductor Corporation LSC designs, develops and markets high performance programmable logic devices (PLDs) and related development system software. Lattice Semiconductor is the inventor and world's leading supplier of in-system programmable (ISPtm) CPLDs. PLDs are standard semiconductor components that can
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MIL-STD-883,
MIL-STD-883E,
J-STD-035
JESD22-A108-A
JESD22-A104-A
JESD22*108
EIA-671
JEDS22-C101-A
doc-70
ISO14000
J-STD-035
8110014
Distributors and Sales Partners
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INCOMING MATERIAL INSPECTION procedure
Abstract: INCOMING IC INSPECTION receiving inspection procedure Quality Assurance of IC Memories quality assurance for semiconductor devices
Text: Quality Assurance of IC Memory Contents 1. Views on Quality and Reliability 2. Reliability Design of SemiconductorDevices 3. Quality Assurance System of Semiconductor Devices Quality Assurance of IC Memories 1. Views on Quality and Reliability Hitachi products should always meet individual
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MIL-STD-105D.
INCOMING MATERIAL INSPECTION procedure
INCOMING IC INSPECTION
receiving inspection procedure
Quality Assurance of IC Memories
quality assurance for semiconductor devices
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IEC 68-2-63
Abstract: transistors Si 6822 MIL-STD-781 transistors 6822 si MIL-STD-785 MIL-STD-721 The Japanese Transistor Manual 1981 IEC 68-2-28 AND 7411 NATIONAL SEMICONDUCTOR MARKING BM
Text: STANDARDS AND QUALITY CERTIFICATION FOR QUALITY SYSTEMS, SAFETY, ANDRELIABILITY OF SEMICONDUCTOR DEVICES VIII. STANDARDS AND QUALITY CERTIFICATION FOR QUALITY SYSTEMS, SAFETY, ANDRELIABILITY OF SEMICONDUCTOR DEVICES 1. QUALITY SYSTEM STANDARDS 1.1 INTRODUCTION TO THE ISO 9000 SERIES
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Untitled
Abstract: No abstract text available
Text: QUALITY GRADES ON NEC SEMICONDUCTOR DEVICES CONTENTS 1. INTRODUCTION . 2 2. QUALITY GRADES AND APPLICATIONS .
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st-100sx
Abstract: Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260
Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,
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2SK1544
st-100sx
Arakawa ST-100SX
jis C5003
mosfet induction heater
MIL-STD-750b
750H
C5003
C5700
ST-100S
YG6260
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ST-100SX
Abstract: MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater
Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,
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2SK1544
ST-100SX
MIL-STD-750b
100SX
C5700
jis C5003
750H
C5003
ST-100S
YG6260
mosfet induction heater
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Untitled
Abstract: No abstract text available
Text: RELIABILITY OF SEMICONDUCTOR DEVICES I. RELIABILITY OF SEMICONDUCTOR DEVICES 1. OUR PHILOSOPHY OF QUALITY 2. SEMICONDUCTOR RELIABILITY RELIABILITY OF SEMICONDUCTOR DEVICES I. RELIABILITY OF SEMICONDUCTOR DEVICES 1. OUR PHILOSOPHY OF QUALITY Since its foundation, Mitsubishi Electric has been seeking a philosophy of extending the business and contributing the society with high
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C42V5964
Abstract: MGF1302 TRANSISTOR MGF1601 MGFC1402 M57721 M67760LC H2 MARKING SOT-89 mmIC 2SC5125 MITSUBISHI M57710-A M68776
Text: Please Read “Notes” First! Contents Notes Contact Addresses MITSUBISHI ELECTRIC CORPORATION Contents Si Devices GaAs Devices Optical Devices Applications Quality Assurance and Reliability Testing Optical Modules Top Page © MITSUBISHI ELECTRIC CORPORATION
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M6STA-005VA/WA/SA
MF-156STA-006VA/WA/SA
MF-156SRA-002VA/WA/SA
MF-622STA-004VA/WA/SA
MF-622STA-005VA/WA/SA
MF-622STA-006VA/WA/SA
MF-622SRA-002VA/WA/SA
MF-2500STA-002VA/WA,
003VA/WA,
004VA/WA
C42V5964
MGF1302 TRANSISTOR
MGF1601
MGFC1402
M57721
M67760LC
H2 MARKING SOT-89 mmIC
2SC5125
MITSUBISHI M57710-A
M68776
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ecg semiconductors master replacement guide
Abstract: transistor SMD marked RNW th 20594 TRANSISTOR si 6822 MIL-STD-202F-201A CT 1975 sam transistors br 6822 sun hold ras 2410 relay TRANSISTOR SMD MARKING CODE jg Mist Ultrasonic Humidifier
Text: RELIABILITY OF SEMICONDUCTOR DEVICES I. RELIABILITY OF SEMICONDUCTOR DEVICES 1. OUR PHILOSOPHY OF QUALITY 2. SEMICONDUCTOR RELIABILITY RELIABILITY OF SEMICONDUCTOR DEVICES I. RELIABILITY OF SEMICONDUCTOR DEVICES 1. OUR PHILOSOPHY OF QUALITY Since its foundation, Mitsubishi Electric has been seeking a philosophy of extending the business and contributing the society with high
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DNA-H-93-140
Abstract: DNA-H-95-61 e1309 JEP133 transistor 2N2222 F1262 FOTP-64 MOSFET DOSIMETER sensor 3414 cobalt-60
Text: N RADIATION OWNER’S MANUAL – RHA-Related Documents Military Performance Specifications 19500 – General Specification for Semiconductor Devices 38534 – Performance Specifications for Hybrid Microcircuits 38535 – General Specification for Intregrated Circuits Microcircuits Manufacturing
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P1156
PSS-01-609
heisen9929
DNA-H-93-140
DNA-H-95-61
e1309
JEP133
transistor 2N2222
F1262
FOTP-64
MOSFET DOSIMETER
sensor 3414
cobalt-60
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upc1470
Abstract: IC-1409 pc1470 uPC1470H IEI-1212 IEI-1213 nec 2702 MF-1134 JAPAN TRANSISTORS 1981 MEI-1202
Text: DATA SHEET BIPOLAR ANALOG INTEGRATED CIRCUIT µPC1470 MOTOR SPEED REGULATORS DESCRIPTION The µPC1470 is a monolithic integrated circuit intended as speed regulators for DC motors of record players, tape and cassette recorders etc. The devices is packaged in a new developed 4-lead quase-TO-126 plastic case.
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PC1470
PC1470
quase-TO-126
upc1470
IC-1409
uPC1470H
IEI-1212
IEI-1213
nec 2702
MF-1134
JAPAN TRANSISTORS 1981
MEI-1202
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Untitled
Abstract: No abstract text available
Text: Reliability and Quality Assurance 1. Views on Quality and Reliability Hitachi’s basic quality aims are to meet individual user’s purchase purpose and quality required, and to be at a satisfactory quality level considering general marketability. Quality required by users is
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Sumitomo CRM 1033B
Abstract: sumitomo 1033B CRM1033B MOTOROLA POWER TRANSISTOR lc 945 sumitomo crm-1033B 8361J
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Reliability Information Motorola Reliability and Quality Assurance Reliability Motorola has a long standing reputation for manufacturing products of excellent Quality and Reliability since the introduction of the first car
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BR1339
Sumitomo CRM 1033B
sumitomo 1033B
CRM1033B
MOTOROLA POWER TRANSISTOR lc 945
sumitomo crm-1033B
8361J
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Abstract: No abstract text available
Text: 5. HANDLING PRECAUTIONS Designed and manufactured under Toshiba’s high quality assurance system, semiconductor products offer satisfactory properties and quality for users. However, if such devices are selected inappropriately or are subjected to heavy thermal, mechanical, or electrical stress, their properties, quality, and reliability
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NSID technology Process
Abstract: No abstract text available
Text: MOTOROLA SEMICONDUCTOR TECHNICAL DATA Reliability Information Motorola Reliability and Quality Assurance R eliability M otorola has a long standing reputation for m anufacturing products of excellent Q uality and Reliability since the introduction of the first car
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BR1339
NSID technology Process
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sot36
Abstract: rohm surface mounted transistor series free all transistor equivalent book
Text: Introduction Introduction This data book provides data sheets for all surface mount transistors that are manufactured by ROHM Corporation. All transistors are manufactured with ROHM’s unique technology that provides a class of devices that are highly reliable. They are extremely compact to allow for high density mounting
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Abstract: No abstract text available
Text: IMPORTANT INFORMATION This Samsung Data Book includes devices commonly used in North America for design and manufacture of electronic products. Most of these are STANDARD PRODUCTS and are generally stocked in North America. Samsung does have additional devices that are available for designs targeted for high volume applications. These
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Abstract: No abstract text available
Text: RELIABILITY INFORMATION 1. INTRODUCTION Sem iconductor devices play a leading role in the explosive progress of technology. They use some of the most advanced design and manufacturing tech nology developed to date. With greater integration, diversity and reliability, their applications have ex
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Abstract: No abstract text available
Text: Reliability and Quality Assurance 1. Views on Quality and Reliability Hitachi’s basic quality aims are to meet individual user’s purchase purpose and quality required, and to be at a satisfactory quality level considering general marketability. Quality required by users is specifically
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