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    QUALIFIED PARTS LABORATORY Search Results

    QUALIFIED PARTS LABORATORY Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    25LS2518PC Rochester Electronics LLC Replacement for AMD part number AM25LS2518PC. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    74LS491ANS Rochester Electronics LLC Replacement for AMD part number SN74LS491ANS. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    9519A-1JC Rochester Electronics LLC Replacement for AMD part number AM9519A-1JC. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    2147-55/BYA Rochester Electronics LLC Replacement for AMD part number AM2147-55/BYA. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy
    25S18FM/B Rochester Electronics LLC Replacement for AMD part number AM25S18FMB. Buy from authorized manufacturer Rochester Electronics. Visit Rochester Electronics LLC Buy

    QUALIFIED PARTS LABORATORY Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: V I S H AY I N T E R T E C H N O L O G Y, I N C . I INNOVAT AND TEC O L OGY LMA 96/4, LMB 96/4 N HN MELF RESISTORS O 19 62-2012 Resistors - Laboratory Sample Kits Laboratory Sample Kit Precision MELF Resistors KEY BENEFITS • • • • • AEC-Q200 qualified resistors


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    PDF AEC-Q200 25-Jan-12 VMN-PT0330-1208

    PF600-1

    Abstract: No abstract text available
    Text: PFEVAL-1 Evaluation Board Kit Application Notes PFEVAL-1 Evaluation Board Kit WARNING! HAZARDOUS VOLTAGES! In setting up a laboratory station for conducting electrical tests of the PF600-1 using the PFEVAL-1 Evaluation Board, operator safety must be the first and foremost consideration. Because the PFEVAL-1 Evaluation Board was designed to provide users with access to all input, output,


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    PDF PF600-1 PF600-1, PF600-1

    SRAM Cross References

    Abstract: UT9Q512K8 SRAM SAMSUNG UT8Q512K8 36E-4 weibull test data 19E4
    Text: Single Event Effects Qualification UT8Q512K8 RQ02 Lot 6ZVL04 4Mbit SRAM 7/21/03 Craig Hafer 719-594-8319 craig.hafer@aeroflex.com SUMMARY-Single event effects qualification testing was performed on the UTMC 4Mbit SRAM, (Samsung Rev C die), Lot 6ZVL04, at the Lawrence Berkeley Laboratory using


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    PDF UT8Q512K8 6ZVL04 6ZVL04, 88-inch 5E-11 9E-10 3E-09 7E-08 0E-11 SRAM Cross References UT9Q512K8 SRAM SAMSUNG UT8Q512K8 36E-4 weibull test data 19E4

    Untitled

    Abstract: No abstract text available
    Text: Wide Side Termination Thin Film Chip Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision Thin Film Chip Resistors MCW 0406-25 0.1 % AT FEATURES • Resistors - Rated dissipation P70 up to 0.250 W - AEC-Q200 qualified pending - Lead (Pb)-free solder terminations


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    PDF AEC-Q200 96-series. 23-May-13

    LMA964MMA02040DB00

    Abstract: No abstract text available
    Text: MELF Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision MELF Resistors MMA 0204-25 0.1 % FEATURES • Resistors - Approved to EN 140401-803 - AEC-Q200 qualified - Advanced thin film technology - Compliant to RoHS Directive 2002/95/EC


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    PDF AEC-Q200 2002/95/EC 96-series. 99-SERIES 25-Jan-12 LMA964MMA02040DB00

    Untitled

    Abstract: No abstract text available
    Text: MELF Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision MELF Resistors MMB 0207-25 0.1 % FEATURES • Resistors - Approved to EN 140401-803 - AEC-Q200 qualified - Advanced thin film technology - Compliant to RoHS Directive 2002/95/EC


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    PDF AEC-Q200 2002/95/EC 96-series. 25-Jan-12

    Untitled

    Abstract: No abstract text available
    Text: MELF Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision MELF Resistors MMU 0102-25 0.1 % FEATURES • Resistors - Approved to EN 140401-803 - AEC-Q200 qualified - Advanced thin film technology - Compliant to RoHS Directive 2002/95/EC


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    PDF AEC-Q200 2002/95/EC 96-series. 25-Jan-12

    LCT964MCT0603MDB00

    Abstract: No abstract text available
    Text: Thin Film Chip Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision Thin Film Chip Resistors MCT 0603-25 0.1 % AT FEATURES • Resistors - Rated dissipation P70 up to 0.150 W - AEC-Q200 qualified - Approved to EN 140401-801 - Lead Pb -free solder terminations


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    PDF AEC-Q200 2002/95/EC 96-series. 09-Dec-11 LCT964MCT0603MDB00

    Untitled

    Abstract: No abstract text available
    Text: LTW0402 e3 96/4 www.vishay.com Vishay Laboratory Sample Kit High Stability Thin Film Chip Resistors TNPW0402 0.1 % T-9 e3 FEATURES • Resistors - High stability - AEC-Q200 qualified - Lead Pb -free solder terminations - Material categorization: For definitions of


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    PDF LTW0402 TNPW0402 AEC-Q200 96-series. TNPW0402 21-Mar-14

    Untitled

    Abstract: No abstract text available
    Text: LTW0603 e3 96/4 www.vishay.com Vishay Laboratory Sample Kit High Stability Thin Film Chip Resistors TNPW0603 0.1 % T-9 e3 FEATURES • Resistors - High stability - AEC-Q200 qualified - Lead Pb -free solder terminations - Compliant to RoHS Directive 2002/95/EC


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    PDF LTW0603 TNPW0603 AEC-Q200 2002/95/EC 96-series. resistan03 TNPW0603

    AY210

    Abstract: No abstract text available
    Text: AY2 Laboratory www.vishay.com Vishay BCcomponents AY2 Sample Kit AC Line Rated Ceramic Disc Capacitors Class X1, 440 VAC, Class Y2, 300 VAC FEATURES • AEC-Q200 qualified • Temperature cycle: 1000 cycles -55 °C to +125 °C • Complies with IEC 60384-14, 3rd edition


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    PDF AEC-Q200 17-Sep-14 AY210

    INCOMING RAW MATERIAL INSPECTIONs

    Abstract: INCOMING RAW MATERIAL INSPECTION in-process quality inspections mil-std-883 INCOMING RAW MATERIAL INSPECTION method MIL-STD-883 method 2003 in-coming quality control INCOMING RAW MATERIAL process flow
    Text: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected


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    PDF

    INCOMING RAW MATERIAL INSPECTION method

    Abstract: INCOMING RAW MATERIAL INSPECTION INCOMING RAW MATERIAL INSPECTIONs in-process quality inspections in-coming quality control quality acceptance plan MIL-STD-883 method 2003
    Text: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected


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    PDF

    PD9002

    Abstract: comparison cd 4093 smd code marking a3a SCCB spec stanag LISTING 2N2369 military AQAP-1 IC cd 4093 CECC - Detail Specifications smd code marking a4a
    Text: EXPERIENCE AND INNOVATION EXPERIENCE AND INNOVATION EXPERIENCE AND INNOVATION HIGH RELIABILITY and SCREENING OPTIONS DOC 2624 ISS 4 Contents 1. Introduction 1 2. Quality Approvals 2 3. Material Qualification 3 3.1 Header/Cap/Wire Approval Procedures 3.2 Die Approval Procedure


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    PDF 168hrs PD9002 comparison cd 4093 smd code marking a3a SCCB spec stanag LISTING 2N2369 military AQAP-1 IC cd 4093 CECC - Detail Specifications smd code marking a4a

    2N2369 equivalent

    Abstract: No abstract text available
    Text: IRFNJ9130 IRF9130SMD05 MECHANICAL DATA Dimensions in mm inches 7.54 (0.296) 0.76 (0.030) min. 2.41 (0.095) 3.175 (0.125) Max. 2.41 (0.095) P–CHANNEL POWER MOSFET FOR HI–REL APPLICATIONS 3 5.72 (.225) 0.76 (0.030) min. 1 2 VDSS ID(cont) RDS(on) 10.16 (0.400)


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    PDF IRFNJ9130 IRF9130SMD05 -100V SMD05 O-276AA) O276AA) 860pF IRF9130SMD05DGS 2N2369 equivalent

    smd diodes s4 1.5w

    Abstract: marking code PAD1 SMD U3158 GENERAL SEMICONDUCTOR SMD DIODES s4 PD9002 smd diode marking f4 diode smd marking GPO 27 lvt 817 smd code marking a3a
    Text: IRF130SMD05N IRFN130SMD05 MECHANICAL DATA Dimensions in mm inches 7 .5 4 (0 .2 9 6 ) 0 .7 6 (0 .0 3 0 ) m in . 2 .4 1 (0 .0 9 5 ) 3 .1 7 5 (0 .1 2 5 ) M a x . 2 .4 1 (0 .0 9 5 ) 3 .0 5 (0 .1 2 0 ) 0 .1 2 7 (0 .0 0 5 )  ! VDSS ID(cont) RDS(on) 1 0 .1 6 (0 .4 0 0 )


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    PDF IRF130SMD05N IRFN130SMD05 IRF130SMD05 IRF130SMD05" IRF130SMD05 IRF130SMD05DSG O276AA) 650pF smd diodes s4 1.5w marking code PAD1 SMD U3158 GENERAL SEMICONDUCTOR SMD DIODES s4 PD9002 smd diode marking f4 diode smd marking GPO 27 lvt 817 smd code marking a3a

    QR204

    Abstract: CECC Detail Specifications 2N2369 equivalent
    Text: IRF130SMD05N IRFN130SMD05 MECHANICAL DATA Dimensions in mm inches 7 .5 4 (0 .2 9 6 ) 0 .7 6 (0 .0 3 0 ) m in . 2 .4 1 (0 .0 9 5 ) 3 .1 7 5 (0 .1 2 5 ) M a x . 2 .4 1 (0 .0 9 5 ) 3 .0 5 (0 .1 2 0 ) 0 .1 2 7 (0 .0 0 5 )  ! VDSS ID(cont) RDS(on) 1 0 .1 6 (0 .4 0 0 )


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    PDF IRF130SMD05N IRFN130SMD05 IRF130SMD05 IRF130SMD05DSG O276AA) 650pF MIL-PRF-19500, CPR\10192006\SEME\IRF130. 03-Jan-2007 QR204 CECC Detail Specifications 2N2369 equivalent

    diode bs 9300

    Abstract: lvt 817 Automatic Railway Gate Control system, PD9002 U3158 jan,tx series semiconductors 2n2369 die smd code marking a3a SMD-05 smd diodes s4 1.5w
    Text: IRFNJ9130 IRF9130SMD05 MECHANICAL DATA Dimensions in mm inches 7.54 (0.296) 0.76 (0.030) min. 2.41 (0.095) 3.175 (0.125) Max. 2.41 (0.095) P–CHANNEL POWER MOSFET FOR HI–REL APPLICATIONS 3 5.72 (.225) 0.76 (0.030) min. 1 2 VDSS ID(cont) RDS(on) 10.16 (0.400)


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    PDF IRFNJ9130 IRF9130SMD05 -100V SMD05 O-276AA) IRFNJ9130 IRF9130SMD05DSG" IRF9130SMD05DSG O276AA) diode bs 9300 lvt 817 Automatic Railway Gate Control system, PD9002 U3158 jan,tx series semiconductors 2n2369 die smd code marking a3a SMD-05 smd diodes s4 1.5w

    schematic diagram of bluetooth technology

    Abstract: schematic diagram of bluetooth Hands-Free EEG Project with circuit diagram BV05C blue tooth dongle circuit diagram schematic diagram bluetooth headset bluetooth technology report LMX5252 bluetooth development board schematic bluetooth antenna design
    Text: National Semiconductor Application Note December 2005 1.0 Scope 3.0 Introduction This document describes the steps and preparation needed to get full regulatory and Bluetooth certification for a new product, including lists of required tests and detailed procedures.


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    PDF CSP-9-111C2) CSP-9-111S2) CSP-9-111S2. schematic diagram of bluetooth technology schematic diagram of bluetooth Hands-Free EEG Project with circuit diagram BV05C blue tooth dongle circuit diagram schematic diagram bluetooth headset bluetooth technology report LMX5252 bluetooth development board schematic bluetooth antenna design

    UM7410

    Abstract: T9527 ATT2C15 M-2014 ATT2C08 A88al 409at q953 899 CLEAN N ETCH ATT2C12
    Text: Manual October 1997 Field-Programmable Gate Arrays FPGA Qualification Manual Lucent Technologies’ Quality Policy Lucent Technologies is committed to achieving sustained business excellence by integrating quality principles and methods into all we do at every level of


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    PDF MN97-016FPGA DA96-005FPGA) UM7410 T9527 ATT2C15 M-2014 ATT2C08 A88al 409at q953 899 CLEAN N ETCH ATT2C12

    smd diodes s4 1.5w

    Abstract: PD9002 QR204 A4A smd SMD a3a GENERAL SEMICONDUCTOR SMD DIODES s4 smd code marking a3a QR208 QR217 smd code marking a4a
    Text: Semelab Limited High Reliability and Screening Options DOC 2624 ISS 8 Contents 1. Introduction. 1 2. Quality Approvals . 2


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    PDF QR209 BS9300 QR216 QR204 MIL-PRF-19500 smd diodes s4 1.5w PD9002 QR204 A4A smd SMD a3a GENERAL SEMICONDUCTOR SMD DIODES s4 smd code marking a3a QR208 QR217 smd code marking a4a

    Instructional Guide

    Abstract: 87017 RESISTOR NETWORK MDM (Military M83401/01) AA55534/09-R020FB-TR AA55534/08-R050FB AA55534/09-R100FB
    Text: V i s h ay I n t e r t e c h n o l o g y, I n c . I INNOVAT AND TEC O L OGY Resistive Products N HN MILITARY RESISTORS 101 O 19 62-2012 Resistors - Military Resistors 101 Overview of Military Resistors from Vishay Dale military qualifications • Film Technology


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    PDF MIL-R-10509 MIL-PRF-22684 MIL-PRF-32159 MIL-PRF-39017 MIL-PRF-55182 MIL-PRF-55342 MIL-PRF-26 Wire2726 VMN-SG2116-1311 Instructional Guide 87017 RESISTOR NETWORK MDM (Military M83401/01) AA55534/09-R020FB-TR AA55534/08-R050FB AA55534/09-R100FB

    DIGITAL IC TESTER report for project

    Abstract: wafer fab control plan atmel 823 PPAP PPAP submission requirement table PPAP flow wafer fab control JESD20 electrical engineering projects dc0327
    Text: TSS463B PPAP TSS463B Serial VAN Data Link Controller ATMEL P/N : TSS463B-TERA PPAP Submission Date: Supplier: 2003 October Atmel Nantes SA Address: La Chantrerie BP 70602 44306 NANTES Cedex 3 France Tel : 33 0 2 40 18 18 18 Fax : 33(0) 2 40 18 19 20 1 Rev. 3 : Initial Submission – 2003 October


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    PDF TSS463B TSS463B TSS463B-TERA DIGITAL IC TESTER report for project wafer fab control plan atmel 823 PPAP PPAP submission requirement table PPAP flow wafer fab control JESD20 electrical engineering projects dc0327

    Untitled

    Abstract: No abstract text available
    Text: INCH-POUND MIL-DTL-24308G w/AMENDMENT 2 1 August 2012 SUPERSEDING MIL-DTL-24308G w/AMENDMENT 1 25 January 2011 DETAIL SPECIFICATION CONNECTORS, ELECTRIC, RECTANGULAR, NONENVIRONMENTAL, MINIATURE, POLARIZED SHELL, RACK AND PANEL, GENERAL SPECIFICATION FOR This specification is approved for use by all Departments and Agencies of the Department of Defense.


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    PDF MIL-DTL-24308G