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    P23128 Search Results

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    Sensata Circuit Breakers JTEP-2-31286-400

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    P23128 Datasheets Context Search

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    dallas date code ds12887

    Abstract: dallas date code P23073 DS1225A DALLAS DS80C320 9832 P23403 dallas date code ds80c320 P23074
    Text: RELIABILITY MONITOR STRESS: ULTRASOUND CONDITIONS: J-STD-020 MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE DS1233 A5 JAN 99 P23064 9842 CARSEM DM823017AB SOT-223 DS1803 A2 NOV 98 P22797 9833 CHIPPAC, KOREA DS1869 A3 MAR 99 P23360


    Original     		PDF J-STD-020 DM823017AB DS1233 DS1803 DS1869 DS2109 DS2153 DS2175 DS5002 P23064 dallas date code ds12887 dallas date code P23073 DS1225A DALLAS DS80C320 9832 P23403 dallas date code ds80c320 P23074

    DS87520

    Abstract: P2305 P23855
    Text: RELIABILITY MONITOR DS1000M-100 JAN '99 MONITOR-HYUNDAI,CHINA DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1000 E3 DH833179ADA 8 PIN PDIP CHIPPAC, CHINA CPS 9847 PROCESS Single Poly, Single Metal 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60%


    Original     		PDF DS1000M-100 DS1000 DH833179ADA P23057 P23178 DN825394AAB P23415 P23306 P23307 J-STD-020 DS87520 P2305 P23855

    DS87520

    Abstract: dm8304 P2271 DS2165Q
    Text: RELIABILITY MONITOR DS1232L OCT '98 MONITOR-HYUNDAI,KOREA DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1232L C1 DL817678ABB 8 PIN SOIC CHIPPAC, KOREA 9830 PROCESS Single Poly, Single Metal 0.8 µm Standard Process JOB NO DESCRIPT Cf: 60% Ea: 0.7


    Original     		PDF DS1232L DL817678ABB P22755 P22778 J-STD-020 DS87520 DN825394AAB DS87C520 P23306 dm8304 P2271 DS2165Q

    TSOC 6

    Abstract: P22713 P23162 dallas date code ds12887
    Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: +85°C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY DS1620 D1 SEP 98 P22710 9746 LOT NO. PACKAGE ALPHTK-BANGKOK NSEB DJ711527ABD 8PN SOIC, 208MIL READ POINT QTY FAIL 50 42


    Original     		PDF DS1620 P22710 DJ711527ABD 208MIL J-STD-020 DS1232L DS1233 DS1267 TSOC 6 P22713 P23162 dallas date code ds12887

    Untitled

    Abstract: No abstract text available
    Text: fjm IMP23064 P23128 IMP23256 IMP23512 23000 Series ROMS IMP23100 IMP23101 IMP23201 IMP23401 HIGH PERFORMANCE BYTE ORGANIZED ROMS Features • Eight JEDEC Standard Versions: IM P 23064 IM P23128 IM P 23256 IM P23512 IM P23100 IMP23101 IMP23201 IMP23401 28


    OCR Scan     		PDF IMP23064 IMP23128 IMP23256 IMP23512 IMP23100 IMP23101 IMP23201 IMP23401 P23128 P23512

    PZ3128-S10

    Abstract: 0H10- 53
    Text: Philips Semiconductors Product specification 128 macrocell CPLD PZ3128 FEATURES Table 1. PZ3128 Features • Industry's first TotalCMOS PLD - both CMOS design and. process technologies PZ3128 Usable gates 4000 • Fast Zero Power FZP™ design technique provides ultra-low


    OCR Scan     		PDF PZ3128 100j-G3 I/0-G11 I/0-G12 I/0-G13 I/0-H10 I/0-H11 I/0-H12 I/0-H13 I/0-H15 PZ3128-S10 0H10- 53

    Untitled

    Abstract: No abstract text available
    Text: Preliminary specification Philips Semiconductors 128 macrocell CPLD with enhanced clocking PZ3128A/PZ3128D FEATURES DESCRIPTION • Industry’s first TotalCMOS PLD - both CMOS design and process technologies The PZ3128A/PZ3128D CPLD Complex Programmable Logic


    OCR Scan     		PDF PZ3128A/PZ3128D 50MHz -Std-883C 100-pin 128-pin