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    MIL-STD-883 PRESSURE Search Results

    MIL-STD-883 PRESSURE Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    DE6B3KJ151KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ471KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6E3KJ152MN4A Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ101KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ331KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd

    MIL-STD-883 PRESSURE Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    IEC-68-2-32

    Abstract: EIAJ-IC-121-18 IEC68-2-32 IEC 68-2-45 IEC-147 IEC68-2-1 IEC-68-2-3 IEC 68-2-32 IEC 68-2-14 IEC-68-2-21
    Text: FAGOR 9 N° 1 2 TEST LEAD STRENGTH SOLDERABILITY CONDITIONS DURATION DO 41 /D 0 1 5 : 1 kg. DO 201 A D /A E: 2 kg. P6: 4 kg. 10” 235 + 5°C 5" STANDARD IEC-68-2-21 MIL-STD 202F-211A IEC -68-2-20 MIL-STD IEC -68-2-54 MIL-STD 883-2003-3 202F-208E 3 4 5 6 REVERSE BIASS


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    202F-211A IEC-68-2-21 202F-208E IEC-68-2-2 IEC-68-2-3 202F-103B EIAJ-IC-121-18 202F-210A IEC-68-2-1 202F-215E IEC-68-2-32 EIAJ-IC-121-18 IEC68-2-32 IEC 68-2-45 IEC-147 IEC68-2-1 IEC-68-2-3 IEC 68-2-32 IEC 68-2-14 IEC-68-2-21 PDF

    Sharp Semiconductor Lasers

    Abstract: AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics
    Text: Application Note Optoelectronics Failure Analysis of Optoelectronic Devices DEFINITIONS • US Military Standard: MIL-STD-883 Method 5003 Failure Analysis Procedures for Microcircuits – Failure analysis is a post-mortem examination of a failed device employing, as required, electrical


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    MIL-STD-883 SMA04033 Sharp Semiconductor Lasers AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics PDF

    acousto optic Modulator

    Abstract: GR-468 DS-7024 SM 1060
    Text: Acousto Optic Modulator Features • • • • • • • Hermetic to MIL-Std 883 Rugged laser welded construction Fast rise / fall time High throughput High contrast ratio High PER Wide operating temperature range Applications • • • • Fast optical shutter


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    EM416 EM416-01 acousto optic Modulator GR-468 DS-7024 SM 1060 PDF

    acousto optic Modulator

    Abstract: GR-468 single mode fiber bend radius
    Text: Acousto Optic Modulator Features • • • • • • • Hermetic to MIL-Std 883 Rugged laser welded construction Fast rise / fall time High throughput High contrast ratio High PER Wide operating temperature range Applications • • • • Fast optical shutter


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    em381 acousto optic Modulator GR-468 single mode fiber bend radius PDF

    MBD3057-C18

    Abstract: MBD2057-C18 DIODE e26 back Tunnel diode MBD1057
    Text: JMAR BACK TUNNEL DIODES m «|h Frequency Detector Series (To 18 GHz) U L = FEATURES • • • • • Rugged Germanium Planar Construction Excellent Temperature Stability No DC Bias Required Wide Video Bandwidth MIL-STD-19500 & 883 Capability M AXIM UM RATINGS


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    MIL-STD-19500 MBD-1057-C18 MBD-1057-T80 MBD-1057-T54 MBD-1057-H20 MBD-1057-E26 MBD-2057-C18 MBD-2057-T80 MBD-2057-T54 MBD-2057-H20 MBD3057-C18 MBD2057-C18 DIODE e26 back Tunnel diode MBD1057 PDF

    M2003

    Abstract: No abstract text available
    Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-92 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 80 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 30 MIL-STD-883 0.00 HAST 330 100 hrs


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    MIL-STD-883 M2003 23-Oct-03 M2003 PDF

    M2003

    Abstract: No abstract text available
    Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-220 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 120 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 45 MIL-STD-883 0.00 HAST 495 100 hrs


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    O-220 MIL-STD-883 M2003 23-Oct-03 M2003 PDF

    MBD3057-C18

    Abstract: MBD5057-C18 back Tunnel diode MBD-3057-C18 MIL-STD-195 MBD5057 MBD2057-C18 MBD-1057-C18 MBD1057
    Text: PLANAR BACK TUNNEL DIODES m T ^ High Frequency D e te c to r Series (To 18 GHz) IB = oti^ rationS FEATURES • Rugged Germanium Planar Construction • Excellent Temperature Stability • No DC Bias Required • Wide Video Bandwidth • MIL-STD-195 00 & 883 Capability


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    MIL-STD-195 MBD-1057-C18 MBD-1057-T80 MBD-1057-T54 MBD-1057-H20 MBD-1057-E26 MBD-2057-C18 MBD-2057-T80 MBD-2057-T54temperature, MBD3057-C18 MBD5057-C18 back Tunnel diode MBD-3057-C18 MBD5057 MBD2057-C18 MBD1057 PDF

    72590

    Abstract: M2003
    Text: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-263 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 40 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 15 MIL-STD-883 0.00 HAST 165 100 hrs


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    O-263 MIL-STD-883 M2003 23-Oct-03 72590 M2003 PDF

    MBD2057-C18

    Abstract: No abstract text available
    Text: FEATURES • • • • • Rugged Germanium Planar Construction Excellent Temperature Stability No DC Bias Required Wide Video Bandwidth MIL-STD-19500 & 883 Capability M A X IM U M RATINGS Storage Tem perature. -6 5 to +125°C Operating T e m p e ra tu re . -6 5 to +110°C


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    MIL-STD-19500 MBD2057-C18 PDF

    M25P10

    Abstract: ST M25P10 SO8 Wide Package QRFS0001 ATM-.100 M25P
    Text: QRFS0001 QUALIFICATION REPORT M25P10 Using CMOST6X-U35 Technology at Agrate R1 Fab Table 1. Product and Process being Qualified Product M25P10 Package SO8 Process CMOST6X-U35 Fab Line Agrate R1 PRODUCT DESCRIPTION The M25P10 is a 1 Mbit 128K x 8 bit Low Voltage, Paged Flash Memory, accessed by a 20 MHz SPI


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    QRFS0001 M25P10 CMOST6X-U35 CMOST6X-U35 M25P10 ST M25P10 SO8 Wide Package QRFS0001 ATM-.100 M25P PDF

    Untitled

    Abstract: No abstract text available
    Text: Power M anagem ent Division Power M anagem ent Division Sm artpack pow er m odules Sam ple Sm artpack package outlines not to scale T hank s to Smartpack, designing high power circuits has never been easier. Sm artpack T echnology offers engineers the b e n efits of ex c e lle n t pow er dissipation and


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    PDF

    SO8 Wide Package

    Abstract: M25P10 QRFS0002
    Text: QRFS0002 QUALIFICATION REPORT M25P10 Using CMOST6X-U35 Technology at Catania M5 Fab Table 1. Product and Process being Qualified Product M25P10 Package SO8 Process CMOST6X-U35 Fab Line Catania M5 PRODUCT DESCRIPTION The M25P10 is a 1 Mbit 128K x 8 bit Low Voltage, Paged Flash Memory, accessed by a 20 MHz SPI


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    QRFS0002 M25P10 CMOST6X-U35 CMOST6X-U35 M25P10 SO8 Wide Package QRFS0002 PDF

    Untitled

    Abstract: No abstract text available
    Text: Q-TECH ONE INCH SQUARE LOW PHASE NOISE OCXO 3.3 to 12Vdc - 1MHz to 125MHz CORPORATION Description Q-Tech’s High Stability OCXO is a high reliability signal generator that provides an HCMOS or Sine Wave output. The OCXO is available in a Through hole package.


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    12Vdc 125MHz QT5006SJM-100 000MHz 10kHz 20MHz, QT5006S, QT5006SJ-100 PDF

    Untitled

    Abstract: No abstract text available
    Text: Q-TECH ONE INCH SQUARE LOW PHASE NOISE OCXO 3.3 to 12Vdc - 1MHz to 125MHz CORPORATION Description Q-Tech’s High Stability OCXO is a high reliability signal generator that provides an HCMOS or Sine Wave output. The OCXO is available in a Through hole package.


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    12Vdc 125MHz QT5006SJM-100 000MHz 10kHz 20MHz, QT5006S, QT5006SJ-100 PDF

    Untitled

    Abstract: No abstract text available
    Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability We put quality first. No matter what it takes, or what kind of problems we run into, our goal is to provide a constant supply of high quality products to our cus­ tomers both at home and abroad, in the quantities they


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    min/10 min/30 PDF

    Untitled

    Abstract: No abstract text available
    Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. N o matter what it takes, or what kind of problem s we run into, our goal is to provide a constant sup p ly of high quality products to our c u s­ tomers both at home and abroad, in the quantities they


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    min/10 min/30 PDF

    Untitled

    Abstract: No abstract text available
    Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. No m atter w hat it takes, or w hat Incidental failures are determined by the design quality kind of problem s w e run into, our goal is to provide a


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    min/10 min/30 PDF

    Untitled

    Abstract: No abstract text available
    Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability We put quality first. No m atter what it takes, or what kind of problem s we run into, our goal is to provide a constant supply of high quality products to our cus­ tomers both at home and abroad, in the quantities they


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    min/10 min/30 PDF

    Untitled

    Abstract: No abstract text available
    Text: HIGH STABILITY DIGITAL TCXO Q-TECH CORPORATION SURFACE MOUNT CRYSTAL OSCILLATORS 3.3 to 5Vdc - 1MHz to 125MHz Description Q-Tech’s High Stability Digital TCXO is a high reliability signal generator that provides an HCMOS output. The TCXO is available in a Surface Mount SMD package.


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    125MHz QT3103CU-27 480MHz QPDS-0009 PDF

    QPDS-0009

    Abstract: No abstract text available
    Text: HIGH STABILITY DIGITAL TCXO Q-TECH CORPORATION SURFACE MOUNT CRYSTAL OSCILLATORS 3.3 to 5Vdc - 1MHz to 125MHz Description Q-Tech’s High Stability Digital TCXO is a high reliability signal generator that provides an HCMOS output. The TCXO is available in a Surface Mount SMD package.


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    125MHz QT3103CU-27 480MHz QPDS-0009 QPDS-0009 PDF

    Untitled

    Abstract: No abstract text available
    Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put q u a lity first. No m a tte r w h a t it ta k e s , or w h a t Incidental failures are determ ined by the design quality kind of p ro b le m s w e run into, our g oal is to p ro vid e a


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    min/10 PDF

    Untitled

    Abstract: No abstract text available
    Text: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. No m atter w hat it takes, or w hat Incidental failures are determined by the design quality kind of problem s we run into, our goal is to provide a of the product, so we work to lower our incidental fail­


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    min/10 PDF

    Untitled

    Abstract: No abstract text available
    Text: Rev.1 Date: 2012-02‐10 Specification AXIOM6060 Oscillator type : OCXO with Low Phase Noise for Space Application Parameter Nominal frequency Frequency stability Initial tolerance before screening test Initial tolerance after screening test


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    AXIOM6060Â IPC610 PDF