HD-BNC
Abstract: AMPHENOL Spanner Amphenol HD-BNC 4028 BE
Text: 2. REV MECHANICAL: A. DURABILITY: 4. ENVIRONMENTAL: A. THERMAL SHOCK PER MIL-STD-202 METHOD 107 TEST CONDITION B EXCEPT HIGH TEMP @200 C B. VIBRATION: MIL-STD-202 METHOD 204 TEST CONDITION B C. SHOCK: MIL-STD-202 METHOD 213 TEST CONDITION B D. CORROSION: MIL-STD-202 METHOD 101
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06-Apr-10
19-May-10
MIL-STD-202ng
20-May-10
HD-BNC
AMPHENOL Spanner
Amphenol HD-BNC
4028 BE
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HD-BNC
Abstract: 4028 BE 800REF
Text: 2. REV MECHANICAL: A. DURABILITY: 4. ENVIRONMENTAL: A. THERMAL SHOCK PER MIL-STD-202 METHOD 107 TEST CONDITION B EXCEPT HIGH TEMP @200 C B. VIBRATION: MIL-STD-202 METHOD 204 TEST CONDITION B C. SHOCK: MIL-STD-202 METHOD 213 TEST CONDITION B D. CORROSION: MIL-STD-202 METHOD 101
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06-Apr-10
19-May-10
MIL-STD-202implicatioin
20-May-10
HD-BNC
4028 BE
800REF
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Option Information
Abstract: No abstract text available
Text: Work-In-Progress Option Information www.vishay.com Vishay Siliconix MIL-PRF-38535 Class Level B Process Flow MIL-STD-883/M5004 INTERNAL VISUAL METHOD 2010 CONDITION B TEMP CYCLE METHOD 1010 CONDITION C CONSTANT ACCELERATION METHOD 2001 CONDITION E PRE-BURNIN ELECTRICAL
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MIL-PRF-38535
MIL-STD-883/M5004)
HETD-883/M5004)
28-Apr-15
Option Information
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PDF
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no-go
Abstract: No abstract text available
Text: HVCMOS IC Process Option Flows RB PRODUCT FLOW 1 (SIMILAR TO MIL-STD-883 CLASS B) RC PRODUCT FLOW COMMERICAL PRODUCT FLOW Preseal Visual Method 2010, Condition B Preseal Visual Method 2010, Condition B Temperature Cycle (2) Method 1010, Condition C, 10 Cycles, -65°C to + 150°C
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MIL-STD-883
MIL-STD-883.
MIL-STD-883
no-go
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an5241
Abstract: ADJD-J823 new bright J82-3 AV02-1422EN new bright R288-2
Text: ADJD-J823 Method of Fast Brightness Change Using BRIGHT Register of ADJD-J823 Application Note 5398 Introduction Description of Method This application note describes a method to speed up brightness change using BRIGHT register of the ADJD-J823 color management controller. This method is an extension
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ADJD-J823
AN5241.
ADJD-J823.
AV02-1422EN
an5241
ADJD-J823
new bright
J82-3
new bright R288-2
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UP Board Exam Date Sheet 2012 for Intermediate
Abstract: sem 5025 MIL-STD-883H INCOMING RAW MATERIAL INSPECTION format INCOMING RAW MATERIAL INSPECTION QML-38535 INCOMING RAW MATERIAL INSPECTION method INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report MARKING CODE 883H
Text: MIL-STD-883H METHOD 5001 PARAMETER MEAN VALUE CONTROL 1. PURPOSE. The purpose of this method is to define a technique for assuring a conformance to a maximum or minimum mean of a parameter measured in any test method listed in section 3000 and 4000 of this standard. This method
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MIL-STD-883H
UP Board Exam Date Sheet 2012 for Intermediate
sem 5025
MIL-STD-883H
INCOMING RAW MATERIAL INSPECTION format
INCOMING RAW MATERIAL INSPECTION
QML-38535
INCOMING RAW MATERIAL INSPECTION method
INCOMING RAW MATERIAL INSPECTION procedure
INCOMING RAW MATERIAL INSPECTION report
MARKING CODE 883H
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Untitled
Abstract: No abstract text available
Text: Environmental / Mechanical Specifications F5 C A L IB E R E L E C T R O N IC S IN C . MECHANICAL Shock: MIL-STD-883C, Method 2002, Condition B Solderability: MIL-STD-883C, Method 2003 Vibration MIL-STD-883C, Method 2007, Condition A Terminal Strength: MIL-STD-202F, Method 211, Conditions A and C
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MIL-STD-883C,
MIL-STD-202F,
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mil-std-202
Abstract: mil-std-202 101D 101D 106F "MIL-STD-202" "METHOD 302" "CONDITION B"
Text: 2 WEATHERTIGHT CONNECTORS PRODUCT BULLETIN 541 Specifications continued Environmental Temperature Limits: -40°C to +65°C non-operating Moisture Resistance: Mil-Std 202 Method 106F Insulation Resistance: Mil-Std 202 Method 302 condition B Thermal Shock: Mil-Std 202 Method 107G
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IP16/IP18
IP66/IP68
mil-std-202
mil-std-202 101D
101D
106F
"MIL-STD-202" "METHOD 302" "CONDITION B"
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Untitled
Abstract: No abstract text available
Text: 3M Electrically Conductive Connector Covers Properties Material Properties Property Test Method Typical Value Resistivity ASTM D991 <105 ohm-cm Contact Corrosivity Kovar plate FTM 101C Method 3005 Pass Crayoning 3M Not visible Elongation ASTM D638 25%
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transistor 1015
Abstract: No abstract text available
Text: Digital ASIC Military Class B Product Flow SPC, QC Monitors Wafer Fabrication SPC, QC Monitors Wafer Sort Electrical Test SPC, QC Monitors Saw, Die Attach and Wire Bond SPC, QC Monitors Internal Visual Method 2010, Condition B Mechanical Tests Method 2011 and Method 2019
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c code for convolution
Abstract: Spectrum Signal Processing
Text: CHAPTER FFT Convolution 18 This chapter presents two important DSP techniques, the overlap-add method, and FFT convolution. The overlap-add method is used to break long signals into smaller segments for easier processing. FFT convolution uses the overlap-add method together with the Fast Fourier
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Untitled
Abstract: No abstract text available
Text: CFPV-45, -46 ISSUE 2; 18 OCTOBER 2004 Delivery Options • Please contact our sales office for current leadtimes Environmental Specification ■ Mechanical shock per MIL-STD-202, Method 213, Cond. E. ■ Thermal shock per MIL-STD-883, Method 1011, Cond. A
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CFPV-45,
MIL-STD-202,
MIL-STD-883,
10LSTTL
100ppm
CFPV-45
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method d 1071
Abstract: LTPD
Text: DMOS Process Option Flow Chart DMOS ARRAY RB FLOW 1 (SIMILAR TO MIL-STD-883 CLASS B) Preseal Visual Method 2010, Condition B Temperature Cycle Method 1010, Condition C, 10 Cycles, -65°C to +150°C 10 minutes minimum @ each temperature extreme Constant Acceleration
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MIL-STD-883
MIL-STD-750
MIL-STD-750
method d 1071
LTPD
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MSK196RH
Abstract: No abstract text available
Text: MIL-PRF-38534 AND 38535 CERTIFIED FACILITY M.S.KENNEDY CORP. 196RH RAD HARD PRECISION RAIL TO RAIL CURRENT SENSE FEATURES: Manufactured using RH6105 Dice Radiation Hardened to 100 Krad Si (Method 1019.7 Condition A) Low Dose Rate Hardened to 50 Krad(Si) (Method 1019.7 Condition D)
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MIL-PRF-38534
196RH
RH6105
MIL-PRF-38535
MIL-PRF38534
MSK196RH
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K/MSK496EDU
Abstract: No abstract text available
Text: MIL-PRF-38534 & 38535 CERTIFIED FACILITY M.S.KENNEDY CORP. RAD HARD QUAD PRECISION RAIL TO RAIL CURRENT SENSE AMP 496RH FEATURES: Manufactured using RH6105 Dice Radiation Hardened to 100 Krad Si (Method 1019.7 Condition A) Low Dose Rate Hardened to 50 Krad(Si) (Method 1019.7 Condition D)
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MIL-PRF-38534
496RH
RH6105
5X1011
MIL-PRF-38534
MSK496EDUG.
K/MSK496EDU
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Untitled
Abstract: No abstract text available
Text: MIL-PRF-38534 & 38535 CERTIFIED FACILITY M.S.KENNEDY CORP. RAD HARD QUAD PRECISION RAIL TO RAIL CURRENT SENSE AMP 496RH FEATURES: Manufactured using RH6105 Dice Radiation Hardened to 100 Krad Si (Method 1019.7 Condition A) Low Dose Rate Hardened to 50 Krad(Si) (Method 1019.7 Condition D)
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MIL-PRF-38534
496RH
RH6105
5X1011
MIL-PRF-38534
MSK496EDUG.
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PDF
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pic18f4520 pin diagram
Abstract: PIC18F4550 indirect addressing microchip pic18f4550 pic18f4xx DS39622 pic18F4550 configuration PIC18F4585 PIC18F4580 example code PIC18F2321 PIC18F2423
Text: PIC18F2XXX/4XXX FAMILY Flash Microcontroller Programming Specification 1.0 DEVICE OVERVIEW ICSP method is slightly different than the high-voltage method and these differences are noted where applicable. This document includes the programming specifications
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PIC18F2XXX/4XXX
PIC18F2221
PIC18F2580
PIC18F2321
PIC18F2585
PIC18F4510
PIC18F2410
PIC18F2610
PIC18F4515
PIC18F2420
pic18f4520 pin diagram
PIC18F4550 indirect addressing
microchip pic18f4550
pic18f4xx
DS39622
pic18F4550 configuration
PIC18F4585
PIC18F4580 example code
PIC18F2321
PIC18F2423
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PDF
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pic18f4520 pin diagram
Abstract: PIC18F2550 icsp PIC18F4580 example code PIC18F2XXX pic18F4550 configuration PIC18F4620 analog port number pic18f2550 program load circuit free PIC18F4XXX PIC18F2450 usb PIC18F2553
Text: PIC18F2XXX/4XXX FAMILY Flash Microcontroller Programming Specification 1.0 DEVICE OVERVIEW ICSP method is slightly different than the high-voltage method and these differences are noted where applicable. This document includes the programming specifications
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PIC18F2XXX/4XXX
PIC18F2221
PIC18F2580
PIC18F2321
PIC18F2585
PIC18F4510
PIC18F2410
PIC18F2610
PIC18F4515
PIC18F2420
pic18f4520 pin diagram
PIC18F2550 icsp
PIC18F4580 example code
PIC18F2XXX
pic18F4550 configuration
PIC18F4620 analog port number
pic18f2550 program load circuit free
PIC18F4XXX
PIC18F2450 usb
PIC18F2553
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pioneer pll
Abstract: simple F.M. transmitter understanding thermal basics for microwave power CP-01052-1
Text: DesignCon 2009 A New Jitter Classification Method Based on Statistical, Physical, and Spectroscopic Mechanisms Mike Li, Ph.D., Altera Corporation CP-01052-1.0 February 2009 Abstract This paper introduces a new jitter classification method based on jitter physical mechanisms
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CP-01052-1
pioneer pll
simple F.M. transmitter
understanding thermal basics for microwave power
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LAMBDA lrs
Abstract: lrs-55-28 LRS-57-28 LRS-55-5 Lambda LRS-54-20 lrs 50-5 lrs-52-6 LRS-53-28 LRS-55-24 LRS-57-5
Text: PART IA-AC-TO-DC SWITCHING POWER SUPPLIES CD Passed environmental tests in accordance with MIL-STD-810C. Low Pressure — Method 500.1, Proc. I. High Temperature — Method 501.1, Proc. I & II. Low Temperature — Method 502.1, Proc. I. Temperature Shock — Method 503.1, Proc. I.
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M1L-STD-810C.
MIL-STD-461A
LRS-55
LRS-56
SERV50NG,
LRS-55.
LRS-57
LRS-58
LAMBDA lrs
lrs-55-28
LRS-57-28
LRS-55-5
Lambda LRS-54-20
lrs 50-5
lrs-52-6
LRS-53-28
LRS-55-24
LRS-57-5
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Ac 472 m
Abstract: No abstract text available
Text: Axial Leads/Glass Encapsulation GENERAL DESCRIPTION Lead Pull & Torsion per MIL-STD-202, Method 211, Condition A & D Resistance to Soldering Heat perMIL-STD-202,Method210, Condition B Vibration and Shock per MIL-STD-202, Method 204, Condition B and Method 213, Condition I
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MIL-STD-202,
perMIL-STD-202
Method210,
MIL-C-39014
Ac 472 m
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PDF
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Untitled
Abstract: No abstract text available
Text: Noise, MIL-STD-202, Method 308 -20 dB max. Moisture resistance, MIL-STD-202, Method 106, hermetic applications ±0.2% max. R/R Stability, 1000 hr., +125°C, 65mw ±0.2% max. R/R Operating temperature range -55°C to +125°C Thermal shock, MIL-STD-202, Method 107, Test Condition F
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OCR Scan
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MIL-STD-202,
25ppm
35ppm
50ppm
MIL-STD-883
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PDF
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Untitled
Abstract: No abstract text available
Text: Noise, MIL-STD-202, Method 308 -20 dB max. Moisture resistance, MIL-STD-202, Method 106 - Hermetic applications ±0.2% max. R/R Stability, 1000 hr., +125°C, 100mw ±0.2% max. R/R Operating tem perature range -55°C to +125°C Thermal shock, MIL-STD-202, Method 107, Test Condition F
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MIL-STD-202,
100mw
100mw,
25ppm
35ppm
50ppm
MIL-STD-883
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PDF
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M/mrf 405
Abstract: No abstract text available
Text: MILITARY KNOBS MS91528, QPL LISTED M A T E R IA L ; KNOB: Molded of polycarbonate self extinguishing thermoplastic. Matte Finish. (Method 111 of Ml L-Std 202) M ETAL IN S E R T ; Aluminum, plated to withstand salt spray. (Method 101, test condition B, of Ml L-Std 202)
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MS91528,
FF-S-103
M/mrf 405
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PDF
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