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    79LV0832

    Abstract: No abstract text available
    Text: Documentation Change Notice Current Consumption Test Conditions Manufacturer: Manufacturer Product Effected: Document Number: Number Revision: Revision Date: Date Maxwell Technologies 79LV0832 Data Sheet 1004418 1 May 7, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |


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    PDF 79LV0832 600uA.

    79LV0832

    Abstract: No abstract text available
    Text: Documentation Change Notice Additional Current Consumption Test Conditions Manufacturer: Manufacturer Product P roduct Effected: Document Number: Number Revision: Revision Date: Date Maxwell Technologies 79LV0832 Rev 6 1004418 2 May 29, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |


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    PDF 79LV0832 600uA.

    Untitled

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832

    79LV0832

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832 10rdering

    79LV0832

    Abstract: Maxwell 79lv0832
    Text: 79LV0832 Low Voltage 8 Megabit 256K x 32-Bit EEPROM MCM CE1 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 ADD CNTL CE2 I/O0-7 I/O8-15 I/016-23 I/O24-31 Memory Logic Diagram FEATURES: DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM)


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    PDF 79LV0832 32-Bit) I/016-23 79LV0832 32-bit Maxwell 79lv0832

    79LV0832

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832

    DIN 1707

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832 DIN 1707

    79LV0832

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832

    Untitled

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects @ 25°C


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832

    79LV0832

    Abstract: 79LV radiation hardened cpu
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects


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    PDF 79LV0832 32-Bit) 32-bit 79LV0832 79LV radiation hardened cpu

    Untitled

    Abstract: No abstract text available
    Text: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects


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    PDF 32-Bit) 79LV0832 32-bit 79LV0832

    28C011

    Abstract: 28LV010 28C010 Maxwell Technologies 79C0832 79LV0408 79LV0832 HN58C1001 1mb eeprom
    Text: APPLICATION NOTE Hitachi 1Mb EEPROM – Hitachi Die HN58C1001 Purpose Over the last several months several design applications questions have been asked regarding the Hitachi EEPROM. These questions have been to both clarify the datasheet specifications as well as obtain additional information not contained in the


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    PDF HN58C1001 28C010 28C011 79C0408 79C0832 28LV010 28LV011 79LV0408 79LV0832 28C011 28LV010 28C010 Maxwell Technologies 79C0832 79LV0408 79LV0832 HN58C1001 1mb eeprom

    ADC hard radiation

    Abstract: 28/ADC hard radiation EEPROM 16MB SCS750 HSN-3000 79LV2040 29F0408 rad-pak 358 9240LP XP-40
    Text: Microelectronics’ Product List Product Description Part Number Radiation Technology Package Screening Style Level FP DIP QFP Specification Status S or B Equivalent Data Sheet Active S, B, I, E S, B, I, E S, B, I, E S, B, I, E S, B, I, E Data Sheet Data Sheet


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    PDF MIL-PRF-38535 ISO9001 AS9100 ADC hard radiation 28/ADC hard radiation EEPROM 16MB SCS750 HSN-3000 79LV2040 29F0408 rad-pak 358 9240LP XP-40