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    KEMET Corporation PHE840MK5100KK01R17

    CAP FILM 10000PF 10% 760VDC RAD
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    DigiKey PHE840MK5100KK01R17 Bulk 7,270 1
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    Mouser Electronics PHE840MK5100KK01R17 1,675
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    Newark PHE840MK5100KK01R17 Bulk 2,000
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    KEMET Corporation PHE840MK5150MK01R17

    CAP FILM 0.015UF 20% 760VDC RAD
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    DigiKey PHE840MK5150MK01R17 Bulk 2,700 1
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    Mouser Electronics PHE840MK5150MK01R17 3,467
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    RS PHE840MK5150MK01R17 Bulk 1,000
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    Avnet Abacus PHE840MK5150MK01R17 32 Weeks 3,000
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    KEMET Corporation PHE840MK5100MK01R17

    CAP FILM 10000PF 20% 760VDC RAD
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    DigiKey PHE840MK5100MK01R17 Bulk 94 1
    • 1 $0.51
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    Avnet Americas PHE840MK5100MK01R17 Bulk 36 Weeks 3,000
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    Mouser Electronics PHE840MK5100MK01R17 4,912
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    RS PHE840MK5100MK01R17 Bulk 3,000
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    Avnet Abacus PHE840MK5100MK01R17 32 Weeks 3,000
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    Avnet Asia PHE840MK5100MK01R17 141 Weeks, 3 Days 3,000
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    Elesa SPA RHAK-01.R140.54

    RH-AK, DOUBLE-CURVED HANDLES, DO
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    DigiKey RHAK-01.R140.54 Bag 8 1
    • 1 $132.72
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    iEi Integration Corporation IKARPC-W08A-MK01-R10

    IKARPC 100X100 VESA MOUNT KIT - Bulk (Alt: IKARPC-W08A-MK01-R10)
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    Avnet Americas IKARPC-W08A-MK01-R10 Bulk 1
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    K01R1 Datasheets Context Search

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    KM48S8030BT-GL

    Abstract: nn5264805tt-b60 KM48S2020CT-GL 0364804CT3B-260 d4564163g5 nt56v1680a0t D4564841g5 81F641642B-103FN M5M4V16S30DTP Siemens 9832
    Text: PC100 SDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on PC100 SDRAM components. A small sample of components 2-5 devices have been tested under the conditions described in Table 2.


    Original
    PDF PC100 KM48S8030BT-GL nn5264805tt-b60 KM48S2020CT-GL 0364804CT3B-260 d4564163g5 nt56v1680a0t D4564841g5 81F641642B-103FN M5M4V16S30DTP Siemens 9832

    KM416S4030BT-G10

    Abstract: KM48S2020CT-GL 81F641642B-103FN d4564163g5 S9745-M06 M5M4V16S30DTP gm72v661641ct7j D4564163G5-A10-9JF D4516821AG5 D4516821
    Text: PC100 SDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on PC100 SDRAM components. A small sample of components 2-5 devices have been tested under the conditions described in Table 2.


    Original
    PDF PC100 KM416S4030BT-G10 KM48S2020CT-GL 81F641642B-103FN d4564163g5 S9745-M06 M5M4V16S30DTP gm72v661641ct7j D4564163G5-A10-9JF D4516821AG5 D4516821

    KM48S8030BT-GL

    Abstract: NT56V1680A0T D4516821AG5 KM416S4030BT-GL 81f641642b103fn KM48S2020CT-GL D4516821AG5-A107JF gm72v661641ct7j TC59S6408BFT80 D4564163G5
    Text: PC100 SDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on PC100 SDRAM components. A small sample of components 2-5 devices have been tested under the conditions described in Table 2.


    Original
    PDF PC100 KM48S8030BT-GL NT56V1680A0T D4516821AG5 KM416S4030BT-GL 81f641642b103fn KM48S2020CT-GL D4516821AG5-A107JF gm72v661641ct7j TC59S6408BFT80 D4564163G5