ST-100SX
Abstract: MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater
Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,
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Original
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2SK1544
ST-100SX
MIL-STD-750b
100SX
C5700
jis C5003
750H
C5003
ST-100S
YG6260
mosfet induction heater
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PDF
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st-100sx
Abstract: Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260
Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,
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Original
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2SK1544
st-100sx
Arakawa ST-100SX
jis C5003
mosfet induction heater
MIL-STD-750b
750H
C5003
C5700
ST-100S
YG6260
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PDF
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Untitled
Abstract: No abstract text available
Text: 2SK2751 Silicon Junction FETs Small Signal 2SK2751 Silicon N-Channel Junction Unit : mm For impedance conversion in low frequency For pyro-electric sensor +0.2 2.8 –0.3 +0.25 0.65±0.15 1.5 –0.05 0.65±0.15 Rating VGDS – 40 V Drain current ID ±10
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Original
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2SK2751
C7030,
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PDF
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Toshiba b9 grease
Abstract: grease toshiba b9 EIA and EIAJ standards for marking EIA and EIAJ standards IC 2 5/grease toshiba b9
Text: 5.1. Quality assurance program The quality and reliability of semiconductor elements are closely related and important to our daily lives as well as to industrial equip ment. In this section is explained the quality assurance program as shown in Fig. 1 and
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OCR Scan
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168Hrs
2SD1406
150V140V^
110V100V
70V60V50
168Hrs
500Hrs
500mA,
Toshiba b9 grease
grease toshiba b9
EIA and EIAJ standards for marking
EIA and EIAJ standards
IC 2 5/grease toshiba b9
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PDF
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how to test Triode Thyristors
Abstract: LTPD JIS C5003 3M Touch Systems C7033
Text: 6. RELIABILITY At it is especially im portant at this step w hether the m anufacturing technologies, quality and reliability can be always stably m aintained, process control including grasping o f process capability, setting of preferential control item s,
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OCR Scan
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aSTD-750
1500G
IL-STD-750
20000G
S5277N
10Q0V
how to test Triode Thyristors
LTPD
JIS C5003
3M Touch Systems
C7033
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PDF
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ATI Research
Abstract: MIL-STD-750b
Text: Reliability of semiconducto in a sta b ilized condition. T he ab ility of p ro d u c tion p ro cesses is confirm ed and p rio rity item s a re estab lish ed to rea lize ideal pro cess control, th u s p av in g th e w ay fo r su b se q u en t m ass p ro
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OCR Scan
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168Hrs
500Hre
2SK643
500H-S
100n-
500Hrs
700650J,
ATI Research
MIL-STD-750b
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PDF
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Untitled
Abstract: No abstract text available
Text: 5. Reliability of s e m i c o n d u c t o r s S .l. Q uality assurance program The quality and reliability of semiconductor elements are closely related and important to our daily lives as well as to industrial equip ment. In this section is explained the quality
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OCR Scan
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2SD1406
168Hrs
500Hrs
1000Hrs
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PDF
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Untitled
Abstract: No abstract text available
Text: Panasonic Silicon Junction FETs Small Signal 2SK2751 Silicon N-Channel Junction For impedance conversion in low frequency For pyro-electric sensor 2 . 8 - 0.3 + 0.25 1 . 5 - 0.05 0.65±0.15 • Features Parameter Gate-Drain voltage Drain current Gate current
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OCR Scan
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2SK2751
O-236
SC-59
C7030,
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PDF
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