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    SN54BCT8244A

    Abstract: SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­


    OCR Scan     		PDF SN54BCT8244A, SN74BCT8244A SCBS042D SN54/74F244 SN54/74BCT244 752S5 SN54BCT8244A

    54HC299

    Abstract: No abstract text available
    Text: TEXAS INSTR LOGIC 25E D • 6=1(31753/ QQab72b 2 SN64HC299, SN74HC299 8-BIT UNIVERSAL SHIFT/STORAGE REGISTERS WITH DIRECT CLEAR AND 3-STATE OUTPUTS _ Multiplexed I/O Ports Provide Improved Bit Density 02 684, DECEMBER 19B2-REVISED SEPTEMBER 1987


    OCR Scan     		PDF QQab72b SN64HC299, SN74HC299 19B2-REVISED 300-mU 54HC299

    SN74AHCT245

    Abstract: No abstract text available
    Text: SN74AHCT245 OCTAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS SCLS233A- OCTOBER 1995 - REVISED FEBRUARY 1996 DB, DW, N, OR PW PACKAGE CTOP VIEW Inputs Are TTL-Voltage Compatible EPIC Enhanced-Performance Implanted CMOS) Process High Latch-Up Immunity Exceeds 300 mA


    OCR Scan     		PDF SN74AHCT245 SCLS233A- JESD-17