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    IEEE 1149 Search Results

    IEEE 1149 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    LBAA0QB1SJ-295 Murata Manufacturing Co Ltd SX1262 MODULE WITH OPEN MCU Visit Murata Manufacturing Co Ltd
    GRM-KIT-OVER100-DE-D Murata Manufacturing Co Ltd 0805-1210 over100uF Cap Kit Visit Murata Manufacturing Co Ltd
    LBUA5QJ2AB-828 Murata Manufacturing Co Ltd QORVO UWB MODULE Visit Murata Manufacturing Co Ltd
    LXMSJZNCMH-225 Murata Manufacturing Co Ltd Ultra small RAIN RFID chip tag Visit Murata Manufacturing Co Ltd
    LXMS21NCMH-230 Murata Manufacturing Co Ltd Ultra small RAIN RFID chip tag Visit Murata Manufacturing Co Ltd

    IEEE 1149 Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    IEEE 1149.1 (JTAG) Altera IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices Application Note 39 Original PDF

    IEEE 1149 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    SCAN18245T

    Abstract: SCAN182245A SCAN182373A SCAN182374A SCAN18373T SCAN18374T SCAN18540T SCAN18541T teradyne national semiconductor handbook
    Text: Information on IEEE Standards The IEEE Working Group developed the IEEE Std 1149 11990 IEEE Standard Test Access Port and Boundary-Scan Architecture To purchase this book $50 please call one of the following numbers and ask for SH13144 In the USA 1-800-678-IEEE


    Original     		PDF SH13144 1-800-678-IEEE 1-800-CS-BOOKS) SCANPSC110) SCANPSC110 x4500 SCAN18245T SCAN182245A SCAN182373A SCAN182374A SCAN18373T SCAN18374T SCAN18540T SCAN18541T teradyne national semiconductor handbook

    RF Power Insensitive Varactors

    Abstract: No abstract text available
    Text: 418 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, VOL. 22, NO. 8, AUGUST 2012 RF Power Insensitive Varactors Koen Buisman, Member, IEEE, Cong Huang, Member, IEEE, Peter J. Zampardi, Senior Member, IEEE, and Leo C. N. de Vreede, Senior Member, IEEE Abstract—In this letter, the influence of the RF voltage swing


    Original     		PDF

    GIGA090

    Abstract: "network interface cards"
    Text: GIGA090 90nm Single Port Embeddable Gigabit Ethernet Transceiver Data Brief Main features • Fully standards compliant: IEEE 802.3, IEEE 802.3u, IEEE 802.3z and IEEE 802.3ab ■ Advanced Cable Diagnostic Features: – hard fault detection – Inter pair short


    Original     		PDF GIGA090 1000BASE-T 100BASE-TX GIGA090 "network interface cards"

    SIEMENS BST

    Abstract: ericsson bsc manual LVTH18245 ericsson bscs manual BSDL Files siemens data transistor scans LVTH18502 tbc 541 7923 eprom ieee 1149
    Text: IEEE Std 1149.1 JTAG Testability Primer 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group IEEE Std 1149.1 (JTAG) Testability 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group Primer IEEE Std 1149.1 (JTAG) Testability Primer i IMPORTANT NOTICE


    Original     		PDF SSYA002C SIEMENS BST ericsson bsc manual LVTH18245 ericsson bscs manual BSDL Files siemens data transistor scans LVTH18502 tbc 541 7923 eprom ieee 1149

    ericsson bsc manual

    Abstract: LVTH18245 ieee 1149 siemens handbook JEP106 LVTH18502 BCT8244 LVTH18504 SSYA002C Turner plus 3
    Text: IEEE Std 1149.1 JTAG Testability Primer 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group IEEE Std 1149.1 (JTAG) Testability 1997 Printed in U.S.A. 1096–AL SSYA002C Semiconductor Group Primer IEEE Std 1149.1 (JTAG) Testability Primer i IMPORTANT NOTICE


    Original     		PDF SSYA002C Index-10 ericsson bsc manual LVTH18245 ieee 1149 siemens handbook JEP106 LVTH18502 BCT8244 LVTH18504 SSYA002C Turner plus 3

    4DPA

    Abstract: "network interface cards"
    Text: GIGA090 90nm Single Port Embeddable Gigabit Ethernet Transceiver Data Brief Main features • Fully standards compliant: IEEE 802.3, IEEE 802.3u, IEEE 802.3z and IEEE 802.3ab ■ Advanced Cable Diagnostic Features: – hard fault detection – Inter pair short


    Original     		PDF GIGA090 1000BASE-T 100BASE-TX 100BASETX 10BASE-T GIGA090 4DPA "network interface cards"

    SNLS161

    Abstract: SCANSTA112
    Text: SCANSTA112 SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer Literature Number: SNLS161H SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a


    Original     		PDF SCANSTA112 SCANSTA112 SNLS161H IEEE1149 SNLS161

    SCANSTA112SM/NOPB

    Abstract: No abstract text available
    Text: SCANSTA112 SCANSTA112 7-Port Multidrop IEEE 1149.1 JTAG Multiplexer Literature Number: SNLS161H SCANSTA112 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer General Description Features The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a


    Original     		PDF SCANSTA112 SCANSTA112 SNLS161H IEEE1149 SCANSTA112SM/NOPB

    WL60010

    Abstract: WL6001 802.11a Controller MAC Data Sheet WaveLAN WaveLAN WL54040 WL60040 modem MMI sdi capture card AD27 AD29
    Text: Product Brief August 2003 WaveLAN TM WL60040 Multimode Wireless LAN Media Access Controller MAC 1 Features ! Full implementation of the IEEE 802.11 WMAC protocol including the following: ― IEEE 802.11a, IEEE 802.11g, and IEEE 802.11h standards, supporting all mandatory and optional


    Original     		PDF WL60040 PB03-164WLAN WL60010 WL6001 802.11a Controller MAC Data Sheet WaveLAN WaveLAN WL54040 WL60040 modem MMI sdi capture card AD27 AD29

    AN-890

    Abstract: No abstract text available
    Text: Fairchild Semiconductor Application Note February 1994 Revised May 2001 P1149.1A Extensions to IEEE-STD-1149.1-1990 Abstract 1, 2, 3 Since publication of IEEE-1149.1-1990/ANSI , extensions and requests for clarifications have been adopted by the IEEE 1149.1 Working Group. The original standard


    Original     		PDF P1149 IEEE-STD-1149 IEEE-1149 1-1990/ANSI AN-890

    JTAG

    Abstract: TRST AN242
    Text: 242 IEEE 1149.1 JTAG Test Access Port Reset Requirement Application Note Introduction A number of Pericom’s bridge and packet switch devices support built-in IEEE 1149.1 JTAG Test Access Port TAP controller for debugging and testing purposes. The IEEE Standard Test Access Port and


    Original     		PDF AN242 JTAG TRST

    equivalent bc 517

    Abstract: bc 312 equivalent Controller BC 415 MPC561 MPC563 BC2 373 EQUIVALENT BC 309 26vf 3410Z BC 247
    Text: SECTION 25 IEEE 1149.1-COMPLIANT INTERFACE JTAG 25.1 IEEE 1149.1 Test Access Port (TAP) and Joint Test Action Group (JTAG) The chip design includes user-accessible test logic that is compatible with the IEEE 1149.1-1994 Standard Test Access Port and Boundary Scan Architecture. The


    Original     		PDF MPC561/ MPC563 MPC561/MPC563 equivalent bc 517 bc 312 equivalent Controller BC 415 MPC561 MPC563 BC2 373 EQUIVALENT BC 309 26vf 3410Z BC 247

    SN74BCT8244

    Abstract: symposium ABT18502 electronics parts tutorial SATV002 P-1149 ieee embedded system papers free ieee 1149.1 jtag boundary scan
    Text: JTAG IEEE 1149.1/P1149.4 Tutorial - Introductory JTAG (IEEE 1149.1/P1149.4) Tutorial Introductory AL 10Sept.-97 1149.1(JTAG)-Tut.I-1 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory Agenda • ■ ■ ■ ■ ■ What Is JTAG? The Increasing Problem of Test


    Original     		PDF 1/P1149 10Sept SN74BCT8244 symposium ABT18502 electronics parts tutorial SATV002 P-1149 ieee embedded system papers free ieee 1149.1 jtag boundary scan

    DS201003

    Abstract: ieee 1149 MTC20 STA400EP STA400MTEP multiplexor analog mux
    Text: STA400EP Enhanced Plastic Dual 2:1 Analog Mux with IEEE 1149.4 General Description Features This Dual 2 to 1 Analog Mux with IEEE 1149.4 incorporates many features of the IEEE 1149.4 Test Standard. The device provides access to up to 9 Analog test points and can be


    Original     		PDF STA400EP STA400EP DS201003 ieee 1149 MTC20 STA400MTEP multiplexor analog mux

    analog multiplexor

    Abstract: A3-12 analog ups circuit diagram datasheet multiplexor high voltage analog multiplexer ieee 1149 national semiconductor databook MTC20 STA400EP STA400MTEP
    Text: STA400EP Enhanced Plastic Dual 2:1 Analog Mux with IEEE 1149.4 General Description Features This Dual 2 to 1 Analog Mux with IEEE 1149.4 incorporates many features of the IEEE 1149.4 Test Standard. The device provides access to up to 9 Analog test points and can be


    Original     		PDF STA400EP STA400EP analog multiplexor A3-12 analog ups circuit diagram datasheet multiplexor high voltage analog multiplexer ieee 1149 national semiconductor databook MTC20 STA400MTEP

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX
    Text: SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master General Description Features The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.


    Original     		PDF SCANSTA101 SCANSTA101 SCANPSC100. SCANSTA101SM SCANSTA101SMX

    ppi interface

    Abstract: SCANSTA101 SCANSTA101SM SCANSTA101SMX
    Text: SCANSTA101 Low Voltage IEEE 1149.1 System Test Access STA Master General Description Features The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.


    Original     		PDF SCANSTA101 SCANSTA101 SCANPSC100. ppi interface SCANSTA101SM SCANSTA101SMX

    5SGX

    Abstract: SV51012-1 jtag receiver Stratix V
    Text: 11. JTAG Boundary-Scan Testing in Stratix V Devices SV51012-1.0 This chapter describes the boundary-scan test BST features that are supported in Stratix V devices. Stratix V devices support IEEE Std. 1149.1 and IEEE Std. 1149.6. The IEEE Std. 1149.6 is only supported on the high-speed serial interface (HSSI) transceivers in Stratix V


    Original     		PDF SV51012-1 5SGX jtag receiver Stratix V

    mdo 365

    Abstract: MPC566 motorola 2443 MPC565 504 BC equivalent bc 517 4700Z BC 213 Motorola
    Text: SECTION 24 IEEE 1149.1-COMPLIANT INTERFACE JTAG 24.1 IEEE 1149.1 Test Access Port (TAP) and Joint Test Action Group (JTAG) The chip design includes user-accessible test logic that is compatible with the IEEE 1149.1-1994 Standard Test Access Port and Boundary Scan Architecture.The implementation supports circuit-board test strategies based on this standard. An overview


    Original     		PDF MPC565 MPC566 MPC566 mpio32b8 mpio32b9 MPC565/MPC566 mpio32b10 mdo 365 motorola 2443 504 BC equivalent bc 517 4700Z BC 213 Motorola

    C896

    Abstract: flexible de 12 pines PA96 application circuit MD500 LRD 14 st d83
    Text: CRLŒIUBS CA91C897 OCTOBER 1990 FUTUREBUS+ INTERFACE UNIT • Fully compatible with IEEE P896.1 -1 9 9 0 • IEEE 1149.1 JTAG testability port • TTL input/output levels • Low power CMOS implementation • The CA91C897 is a high performance IEEE P896.1-1990


    OCR Scan     		PDF OCTOBER199Â CA91C897 CA91C896 C896 flexible de 12 pines PA96 application circuit MD500 LRD 14 st d83

    MCF5206

    Abstract: No abstract text available
    Text: SECTION 1S IEEE 1149.1 TEST ACCESS PORT JTAG The MCF5206 includes dedicated user-accessible test logic that is fully compliant with the IEEE standard 1149.1 Standard Test Access Port and Boundary Scan Architecture. Use the following description in conjunction with the supporting IEEE document listed above. This


    OCR Scan     		PDF MCF5206

    motorola sc38

    Abstract: sc38* motorola SC236 vhdl code for traffic light control motorola 88000 motorola sc49 SC188 SC135 SC183 SC107
    Text: C fíLM W "" CA91C896 OCTOBER 1990 FUTUREBUS+ ARBITER • Fully compatible with IEEE P896.1 -1 9 9 0 • IEEE 1149.1 JTAG testability port • TTL Input/output levels • Low power CMOS implementation • Futurebus+ Interface The CA91C896 is a high performance IEEE P896.1-1990


    OCR Scan     		PDF OCTOBER199Â CA91C896 CA91C896 motorola sc38 sc38* motorola SC236 vhdl code for traffic light control motorola 88000 motorola sc49 SC188 SC135 SC183 SC107

    MC68060

    Abstract: M68060 MC68060 version XBS2
    Text: SECTION 9 IEEE 1149.1 TEST JTAG AND DEBUG PIPE CONTROL MODES This section describes the IEEE 1149.1 test access port (normal Joint Test Action Group (JTAG) mode and the debug pipe control mode, which are available on the MC68060. 9.1 IEEE 1149.1 TEST ACCESS PORT (NORMAL JTAG) MODE


    OCR Scan     		PDF MC68060. MC68060 M68060 MC68060 version XBS2

    MCF5204

    Abstract: No abstract text available
    Text: SECTION 11 JTAG SPECIFICATION 11.1 IEEE 1149.1 STANDARD JTAG SPECIFICATION The MCF5204 processors include dedicated user-accessible test logic that is fully compliant with the IEEE standard 1149.1 test access port and boundary-scan architecture. The following description should be used in conjunction with the supporting IEEE document


    OCR Scan     		PDF MCF5204 conne5204 MCF5204,