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    IC TEST CLIP Search Results

    IC TEST CLIP Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    74HC4053FT Toshiba Electronic Devices & Storage Corporation CMOS Logic IC, SPDT(1:2)/Analog Multiplexer, TSSOP16B, -40 to 125 degC Visit Toshiba Electronic Devices & Storage Corporation
    7UL2T125FK Toshiba Electronic Devices & Storage Corporation One-Gate Logic(L-MOS), Buffer, SOT-765 (US8), -40 to 85 degC Visit Toshiba Electronic Devices & Storage Corporation
    7UL2T126FK Toshiba Electronic Devices & Storage Corporation One-Gate Logic(L-MOS), Buffer, SOT-765 (US8), -40 to 85 degC Visit Toshiba Electronic Devices & Storage Corporation
    74HC4051FT Toshiba Electronic Devices & Storage Corporation CMOS Logic IC, SP8T(1:8)/Analog Multiplexer, TSSOP16B, -40 to 125 degC Visit Toshiba Electronic Devices & Storage Corporation
    7UL1G07FU Toshiba Electronic Devices & Storage Corporation One-Gate Logic(L-MOS), Non-Inverter Buffer (Open Drain), USV, -40 to 85 degC Visit Toshiba Electronic Devices & Storage Corporation

    IC TEST CLIP Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    D431000

    Abstract: INTEL 87C196 USER MANUAL D75304GF AIC6360Q d431000agw aic-6360 INTEL PLCC 68 dimensions AIC-6360Q d431000ag NEC uPD71054
    Text: IC Test Clips Test Clip Selection Made Easy To select the Pomona IC Test Clip specifically designed for your chip, find the table for your chip type and follow the selection procedure outlined in this section. SSOP/QSOP JEDEC QFP Pomona IC Test Clips are uniquely designed to provide


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    PDF SN74F32D, EPM5032, TMC1171 TMPN3120, HM628128, D431000AGW D431000 INTEL 87C196 USER MANUAL D75304GF AIC6360Q aic-6360 INTEL PLCC 68 dimensions AIC-6360Q d431000ag NEC uPD71054

    900714

    Abstract: No abstract text available
    Text: A P Products GmbH Standard DIP TEST-CLIP The IC Test-Clip for fast, safe access to DIP Leads Invented in 1967 by A P Products, our Test-Clip has remained the industry standard for faster easier DIP IC Testing, quality control inspection, and field service. A P Test-Clips have become an


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    PDF 64-pins AP03/2004 900714

    Untitled

    Abstract: No abstract text available
    Text: Pomona Model 3785 Minigrabber® Test Clip To Stacking Pin Tip Plug Patch Cord FEATURES: • Allows fast and convenient connection between pin tip jacks and test terminals, axial leaded devices, IC Test Clips and other test points. • Grabber hook attaches to terminal sizes up to .060” 1,5mm O.D.


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    PDF \Release\DataSheets\FlukeDataSheet\d3785

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    Abstract: No abstract text available
    Text: Pomona Model 3785 Minigrabber® Test Clip To Stacking Pin Tip Plug Patch Cord FEATURES: • Allows fast and convenient connection between pin tip jacks and test terminals, axial leaded devices, IC Test Clips and other test points. • Grabber hook attaches to terminal sizes up to .060” 1,5mm O.D.


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    PDF 00\D3785

    MIL-C-17

    Abstract: BU225 bu 302
    Text: Mueller Insulated Test Accessories and Micro Clippers ÒMicro Plunger ClipsÓ, Mini-Plunger Clip and Plunger Clip Type BU-1010 test leads make difficult IC connections fast and easy. Spring-loaded beryllium copper conductor attaches to component leads and terminals. Type BU-1031 test clip to insulated mini-alligator clip. Type BU-1080 test clip to


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    PDF BU-1010 BU-1031 BU-1080 BU-1414 BU-111, BU-1420 BU-1449 BU-1480 BU-1481 BU-1058C/U, MIL-C-17 BU225 bu 302

    Untitled

    Abstract: No abstract text available
    Text: Model 3785 Minigrabber Test Clip To Stacking Pin Tip Plug Patch Cord ® Pomona • • • • • • • Allows fast and convenient connection between pin tip jacks and test terminals, axial leaded devices, IC Test Clips and other test points. Grabber hook attaches to terminal sizes up to .060” 1,5mm O.D.


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    PDF 3785-XX-* D3785

    d431000agw

    Abstract: D75304GF AIC6360Q Actel a1280 intel 80386dx HG62G027 AIC-6360Q CL-SH260 L1A9349 5252 F 1002
    Text: P o m o n a Electronics IC Test Clips Logic Scope Probe JEDEC PQFP Test Clips PomonaÕs JEDEC QFP test clips are designed to fit on surfacemounted plastic and ceramic JEDEC chips. Choose from four clip types specifically designed to give you optimum functionality and ease of use for testing, troubleshooting and


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    PDF ABT16244, ACT16245 FCT16223, FCT162511 d431000agw D75304GF AIC6360Q Actel a1280 intel 80386dx HG62G027 AIC-6360Q CL-SH260 L1A9349 5252 F 1002

    Untitled

    Abstract: No abstract text available
    Text: Model 6174 Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 6263 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 6232A Modular Probe Set Qty 2 - 1 Red, 1 Black 6262 Extended Find Point Test Adapter Qty 2 - 1Red, 1 Black 5907A Test Lead Set Qty 2 - 1 Red, 1 Black


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    PDF D1094478

    Untitled

    Abstract: No abstract text available
    Text: Model 6174 Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 6263 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 6232A Modular Probe Set Qty 2 - 1 Red, 1 Black 6262 Extended Find Point Test Adapter Qty 2 - 1Red, 1 Black 6153 Spade Lugs Qty 2 5907A Test Lead Set


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    PDF D1094478

    plier

    Abstract: 502001 501774
    Text: 472-2012:QuarkCatalogTempNew 8/29/12 6:50 PM Page 472 Alligator, Heavy, Plier Type, Kelvin and Telecom Clips Clips B A A/V, TEST CONNECTORS & IC SOCKETS TEST & MEASUREMENT 2 D G F H ENCLOSURES E C INDEX ASSEMBLY PASSIVE & ACTIVE OPTOELECTRONICS AUTOMATION &


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    Type A USB

    Abstract: transistor 2515
    Text: 458-2012:QuarkCatalogTempNew 9/1/12 12:57 PM Page 458 ENCLOSURES A/V, TEST CONNECTORS & IC SOCKETS TEST & MEASUREMENT 2 USB, Strip, DIP, Grid, Transistor Sockets and Headers Standard Solder Tail DIP Sockets Open Frame A B .015-.025 .010*.018 Most popular line of standard low profile IC-Sockets. Open frame design leaves


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    PDF O-100 Type A USB transistor 2515

    Untitled

    Abstract: No abstract text available
    Text: Pomona Model 6200 Test Companion Kit For HP 34401A Benchtop Multimeters MATERIALS: Model 5246: IC Test Tip Adapter: Insulation: Nylon, Tip: Stainless steel, Color: Black, Red, Green RATINGS: +80ºC. +176ºF. Max. Model 5548A: POP Jack Style Miniature Test Probe: Body: Brass, nickel Plated, Insulation: Nylon, Receptacle:


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    PDF 4401A 600VRMS 00\D6200

    Untitled

    Abstract: No abstract text available
    Text: Pomona Model 6200 Test Companion Kit For HP 34401A Benchtop Multimeters MATERIALS: Model 5246: IC Test Tip Adapter: Insulation: Nylon, Tip: Stainless steel, Color: Black, Red, Green RATINGS: +80ºC. +176ºF. Max. Model 5548A: POP Jack Style Miniature Test Probe: Body: Brass, nickel Plated, Insulation: Nylon, Receptacle:


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    PDF 4401A 600VRMS Goldberg\FlukeDataSheet\d6200

    d6090

    Abstract: No abstract text available
    Text: Pomona Model 6090 & 6091 Ultra-Thin Micrograbber® Test Clip Patch Cords FEATURES: • Pincer style of grabber attaches to surface mount .050" 1,27 mm lead pitch devices. • Test clip’s narrow 3,2 mm (.13") flat body allows side by side stacking when testing high density IC


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    PDF VAC/60 00\D6090 d6090

    d6090

    Abstract: C 6090 transistor c 6090
    Text: Pomona Model 6090 & 6091 Ultra-Thin Micrograbber® Test Clip Patch Cords FEATURES: • Pincer style of grabber attaches to surface mount .050" 1,27 mm lead pitch devices. • Test clip’s narrow 3,2 mm (.13") flat body allows side by side stacking when testing high density IC


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    PDF VAC/60 Goldberg\FlukeDataSheet\d6090 d6090 C 6090 transistor c 6090

    Untitled

    Abstract: No abstract text available
    Text: Model 6345 Deluxe Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 5133 Interchangeable Probe Tips Qty 2 of each 5688 4174 4988 5246 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 5689A Modular Probe Set Qty 2 - 1 Red, 1 Black 5682 Extended Find Point Test Adapter


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    PDF D1094646

    Multimeter

    Abstract: banana jack
    Text: Model 6345 Deluxe Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 5133 Interchangeable Probe Tips Qty 2 of each 5688 4174 4988 5246 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 5689A Modular Probe Set Qty 2 - 1 Red, 1 Black 5682 Extended Find Point Test Adapter


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    PDF D1094646 Multimeter banana jack

    LOCTITE 384

    Abstract: ECCOBOND 281 melcor 705TC Emerson Cuming tellurex abletherm E629 E710 mastersil
    Text: ATE-A2 Cooling High Density, High Power Pin Electronics TEST AND MEASUREMENT PRODUCTS Overview With IC’s ever-increasing speeds and pin counts, the power density inside Automated Test Equipment is also increasing. Keeping the high-speed pin drivers and other


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    Untitled

    Abstract: No abstract text available
    Text: The Value Leader Micro & Nano Surface Mount Test Clips Color Coded, Compact, Economical •Can access 0.3mm & 1.27mm Pitch Leads: Allows you to attached the clip to a lead on the smallest of surface mount IC’s for testing the input and/or output of the IC. Normal


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    XCS3201FN

    Abstract: ATT92020 80386SL MC68HC11A1FU
    Text: Pomona Innovative Solutions For IC Test Anc Development Expressly designed to facilitate testing of your surface-mounted devices, Pomona IC Test Clips and Pomona Solder-On Adapters are engineered in form and function to provide a convenient interface to logic analyzers for fast and reliable


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    D5923

    Abstract: No abstract text available
    Text: ITT Pomona Model 5923 Flying Leads for PLCC and SOIC Clip IC Test Clips Flying leads make connections to the upper contacts on PLCC test clips and SOIC Clip® test clips. The lead wires are flexible to reduce the forces applied to the test clips. These flying leads are perfect for


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    PDF D5923 D5745

    assmann AKSPLT

    Abstract: No abstract text available
    Text: ASSMANN J u m p e rs E le c tro n ic C o m p o n e n ts Plugs for shorting and addressing insulated, double sided contact, grid-spacing 5.08 mm and 2.54 mm With nut for test-pirts or test-clips With nut for test-pins or test-clips With nut for testpins or test-clips


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    LA-68

    Abstract: No abstract text available
    Text: 1C Test Clips 1C Test Clips Pomona’ Metric QFP Test Clips Fig. 1: Press-on d ip Fig. 2 : PGA interface* Fig. 4: Clip with internal locking feature No. Leads Body S iz e Lead P itc h M ax. H e ig h t C r it ic a l D im .t T y p ic a l A p p lic a t io n s


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    PDF 10X10 14X20 LA-68

    intel 87C196

    Abstract: No abstract text available
    Text: Illlllllllllll IC Test Clips rv1 D nm nnn FA* ON DEMAND This symbol indicates immediate JS C C V V C Dial U.S. (800) 444-6785, (Outside U.S.) (949) 253-3858. Enter the Pomona Access number (shown in italics) when prompted. IC Test Clips Pomona8 rOlflOIld Fax-On-Demand Technical Information is available.


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