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    bfl5

    Abstract: No abstract text available
    Text: b3E i> WM 4 5 5 1 0 7 2 0ÜÜ1Q72 HONEYl i l ELL/ S 220 HH0N3 Honeywell S E C Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability


    OCR Scan     		PDF HTIU2100 P1149 bfl5

    ic 8255 PPI

    Abstract: PPI 8255 interface data serial 8255 PPI Chip PPI 8255 interface word control Control word 8255 PPI ppi interface 1007 SC1114 NUM mnda
    Text: Honeywell Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability • Serial Chip-Level Test Interface


    OCR Scan     		PDF P1149 HTIU2100 ic 8255 PPI PPI 8255 interface data serial 8255 PPI Chip PPI 8255 interface word control Control word 8255 PPI ppi interface 1007 SC1114 NUM mnda

    Untitled

    Abstract: No abstract text available
    Text: Honeywell ON-CHIP MONITOR MACROCELL FEATURES •ASIC-Based Implementation of IEEE 1149.1 Interface • Standard ASIC Logic Interface for Control of Scan/ Boundary Paths • Up to Seven Internal ASIC Scan Paths • Test Reset Input TRSTN for Asynchronous TAP


    OCR Scan     		PDF HTIU2100 IEEE1149