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    HR2210 Search Results

    HR2210 Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    HR2210 Honeywell RICMOS GATE ARRAY Original PDF

    HR2210 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    HR2000

    Abstract: HR2010 HR2065 HR2090 HR2210 HR2125 HR2340 "rad" sram
    Text: RICMOS GATE ARRAYS HR2000 FAMILY FEATURES • Total Dose Hardness ≥1x106 rad SiO2 • Fabricated on Honeywell’s Radiation Hardened 0.65 µmLeff RICMOS™ IV Bulk Process • Dose Rate Upset Hardness ≥1x109 rad(Si)/sec • Array Sizes from 10K to 336K Available Gates (Raw)


    Original
    PDF HR2000 1x106 1x109 1x1012 1x10-10 1x1014/cm2 HR2000 HR2010 HR2065 HR2090 HR2210 HR2125 HR2340 "rad" sram

    5962L0053605VYC

    Abstract: 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA
    Text: NOT MEASUREMENT SENSITIVE MIL-HDBK-103AJ 19 SEPTEMBER 2011 SUPERSEDING MIL-HDBK-103AH 28 MARCH 2011 DEPARTMENT OF DEFENSE HANDBOOK LIST OF STANDARD MICROCIRCUIT DRAWINGS This handbook is for guidance only. Do not cite this document as a requirement. AMSC N/A


    Original
    PDF MIL-HDBK-103AJ MIL-HDBK-103AH MIL-HDBK-103AJ 5962L0053605VYC 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA

    HR2065

    Abstract: HR2090 HR2010 HR2125 HR2210 HR2340 HR2000
    Text: RICMOS GATE ARRAYS HR2000 FAMILY FEATURES • Total Dose Hardness ≥1x106 rad SiO2 • Fabricated on Honeywell’s Radiation Hardened 0.65 µmLeff RICMOS™ IV Bulk Process • Dose Rate Upset Hardness ≥1x109 rad(Si)/sec • Array Sizes from 10K to 336K Available Gates (Raw)


    Original
    PDF HR2000 1x106 1x109 1x1012 1x10-10 1x1014/cm2 HR2000 HR2065 HR2090 HR2010 HR2125 HR2210 HR2340

    honeywell memory sram

    Abstract: 419B3E
    Text: b3E D 4551072 DGQ1D3M 417 • H 0 N 3 Honeywell RICMOS SEA OF TRANSISTORS GATE ARRAY HR2210 FEATURES OTHER RADIATION HARDNESS • Total Dose Hardness of >1x106 rad Si02 • Dose Rate Upset Hardness > 1x10° rad(Si)/sec • Dose Rate Survivability > 1x1012rad(Si)/sec


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    PDF HR2210 1x106 1x1012rad 1x101 honeywell memory sram 419B3E

    Untitled

    Abstract: No abstract text available
    Text: Honeywell RICMOS GATE ARRAYS HR2000 FAMILY FEATURES • Fabricated on Honeywell’s Radiation Hardened 0.65 M-mLeff RICMOS™ IV Bulk Process • Total Dose Hardness >1x10 rad Si02 • Dose Rate Upset Hardness >1x109rad(Si)/sec • Array Sizes from 10K to 336K Available Gates (Raw)


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    PDF HR2000 1x109rad 1x101 1x101/cm2 HR2000

    207K AW

    Abstract: No abstract text available
    Text: Honeywell HR2000 RICMOS " GATE ARRAYS FAMILY FEATURES • Fabricated on Honeywell’s Radiation Hardened 0.65 nm RICMOS IV Bulk Process Total Dose Hardness of >1x106 rad S i02 Dose Rate Upset Hardnes >1x109 rad(Si)/sec • Array Sizes from 10K to 336K Available Gates (Raw)


    OCR Scan
    PDF 1x10M 1x106 1x109 HR2000 HR2000 207K AW