HR05XXXW3S
Abstract: DC-12 08E-06
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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HR05XXXW3S
01-20DB)
DC-12
0-20DB
MIL-STD-130.
TP-8965.
755W002.
HR05XXXW3S
08E-06
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Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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PDF
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HR05XXXW3S
01-20DB)
DC-12
0-20DB
TP-8965.
MC0023.
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Untitled
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
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PDF
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HR05XXXW3S
01-20DB)
DC-12
0-20DB
MIL-STD-1686.
MIL-STD-130.
TP-8965.
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1010005
Abstract: No abstract text available
Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A
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Original
|
PDF
|
HR05XXXW3S
01-20DB)
DC-12
0-20DB
MIL-STD-130.
TP-8965.
755W002.
1010005
|