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    1009985

    Abstract: DC-12
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW1S 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. 1009985

    HR05XXXW3S

    Abstract: DC-12 08E-06
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW3S 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. HR05XXXW3S 08E-06

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW1 01-20DB) DC-12 0-20DB TP-8965. MC0023.

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW1S 01-20DB) DC-12 0-20DB MIL-STD-1686. MIL-STD-130. TP-8965.

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW3S 01-20DB) DC-12 0-20DB TP-8965. MC0023.

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW3S 01-20DB) DC-12 0-20DB MIL-STD-1686. MIL-STD-130. TP-8965.

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXS 01-20DB) DC-18 TP-8965. MC0023.

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXX X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXX 01-20DB) DC-18 TP-8965. MC0023.

    DC-12

    Abstract: HR05XXXW3
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW3 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. HR05XXXW3

    1009975

    Abstract: DC-12
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW1 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. 1009975

    DC-12

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXWB1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXWB1 01-20DB) DC-12 MIL-STD-130. TP-8965. 755W002. 09-E1001

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXG X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXG 01-20DB) DC-18 TP-8965. MC0023.

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXWB1 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXWB1 01-20DB) DC-12 TP-8965. MC0023.

    1010005

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW3S 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. 1010005

    1009955

    Abstract: HR05XXX
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXX X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXX 01-20DB) DC-18 MIL-STD-130. TP-8965. 755W002. 09-E1001 1009955 HR05XXX

    1009965

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXS 01-20DB) DC-18 MIL-STD-130. TP-8965. 755W002. 09-E1001 1009965

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXS X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXS 01-20DB) DC-18 MIL-STD-130. TP-8965. MC0023. 04-E272

    Untitled

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW1S X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW1S 01-20DB) DC-12 0-20DB TP-8965. MC0023.

    1009995

    Abstract: No abstract text available
    Text: TITLE: SPECIFICATION CONTROL DRAWING PART IDENTIFIER: HR05XXXW3 X =TEST CODE: A=GROUP A; B=GROUP B; C=GROUP C (XX)=DB VALUE (01-20DB) DESCRIPTION: CHIP ATTENUATOR WITH HIGH RELIABILITY TESTING. NOTE: SINGLE LOT AND DATE CODE AVAILABLE UPON REQUEST. ASSEMBLY DWG: N/A


    Original     		PDF HR05XXXW3 01-20DB) DC-12 0-20DB MIL-STD-130. TP-8965. 755W002. 1009995