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    NSK osc

    Abstract: 48 H diode tabai espec capacitance meter class 180 espec ps222 Kikusui TR8601 Capacitor NSK
    Text: CONTENTS 1． Purpose 1 of 4 2． Test Contents and Test Equipment 1 of 4 3． Test 2 of 4 to 4 of 4 , 2 of 13 Test Data 1 Dimensions 1 of 13 2 Capacitance 3 of 13 3 tan δ (D.F.) 3 of 13 4 Insulation Resistance(I.R.) 3 of 13


    Original     		PDF 2of13 1of13 3of13 4of13 6of13 7of13 8of13 5of13 NSK osc 48 H diode tabai espec capacitance meter class 180 espec ps222 Kikusui TR8601 Capacitor NSK

    tabai espec

    Abstract: JIS-Z-3282 TR8601 NSK osc TOS8750 PS222 48 H diode capacitance meter JISZ3282 class 180
    Text: CONTENTS 1． Purpose 1 of 4 2． Test Contents and Test Equipment 1 of 4 3． Test 2 of 4 to 4 of 4 , 2 of 13 Test Data 1 Dimensions 1 of 13 2 Capacitance 3 of 13 3 tan δ (D.F.) 3 of 13 4 Insulation Resistance(I.R.) 3 of 13


    Original     		PDF 2of13 1of13 3of13 4of13 6of13 7of13 8of13 5of13 tabai espec JIS-Z-3282 TR8601 NSK osc TOS8750 PS222 48 H diode capacitance meter JISZ3282 class 180

    HMC916LP3

    Abstract: SUMITOMO EME G700 hmc424lp3e SUMITOMO G700 HMC905LP3
    Text: Analog Devices Welcomes Hittite Microwave Corporation NO CONTENT ON THE ATTACHED DOCUMENT HAS CHANGED www.analog.com www.hittite.com Report Title: Qualification Test Report Report Type: See Attached Date: See Attached Package Type: 6L LP2, 16L LP3 Package Style: 16L 3x3mm QFN Package


    Original     		PDF HMC424LP3E HMC536LP2 HMC546LP2 HMC646LP2 HMC652LP2 HMC653LP2 HMC654LP2 HMC655LP2 HMC656LP2 HMC657LP2 HMC916LP3 SUMITOMO EME G700 hmc424lp3e SUMITOMO G700 HMC905LP3

    samyoung "Humidity Sensor"

    Abstract: SAMYOUNG samyoung Humidity Sensor humidity sensor "Humidity Sensor" espec HC 741 hydrocarbon sensor sy 360 ultrasonic sensor 40khz sensor
    Text: SY-HC-1 SERIES HUMIDITY SENSOR CAPACITIVE HUMIDITY SENSOR P/N : SY-HC-1 SERIES = SPECIFICATIONS = 5436-1, Sangdaewon-dong, Jungwon-gu, Sungnam-city, Kyoungki-do, 462-819, Korea Samyoung S&C Co., Ltd.


    Original     		PDF

    LEMO 8 pin connector

    Abstract: EIA-455-171 LEMO 5 pin RX3070 24 pin lemo connector Lemo connector K
    Text: QUALIFICATION REPORT SUMMARY KINGS Fiber Optic Tri-Loc® SMPTE Camera Connector Index Index . 2 1 Scope . 3


    Original     		PDF

    MIP2G4

    Abstract: mip2g40ms D1UBA80-7062 RCR-9102B mip2g40msscf TSA-101S-W EKXJ DE1E3KX222MA4BL01 905-FN D1UBA80
    Text: LDV12 I N D E X PAGE 1. Calculated Values of MTBF …………………………………… R-1 2. Component Derating .………………………………………………. R-2 3. Main Components Temperature Rise ΔT List 4. Electrolytic Capacitor Life


    Original     		PDF LDV12 30mins 230VAC MIP2G4 mip2g40ms D1UBA80-7062 RCR-9102B mip2g40msscf TSA-101S-W EKXJ DE1E3KX222MA4BL01 905-FN D1UBA80

    MIP2G4

    Abstract: RCR-9102B mip2g40ms EKXJ401 mip2g40msscf TSA-101S-W DE1E3KX222MA4B INS-400L PS2561BL1-1-A 905-FN
    Text: LDC12 I N D E X PAGE 1. Calculated Values of MTBF …………………………………… R-1 2. Component Derating .………………………………………………. R-2 3. Main Components Temperature Rise ΔT List 4. Electrolytic Capacitor Life


    Original     		PDF LDC12 30mins 230VAC 700mA MIP2G4 RCR-9102B mip2g40ms EKXJ401 mip2g40msscf TSA-101S-W DE1E3KX222MA4B INS-400L PS2561BL1-1-A 905-FN

    Fluke 89

    Abstract: chroma 6630 espec su-241 temperature chamber HL562 espec su-241 ESI26 DL1740 su-241 ENV216 TCP404XL
    Text: LDC12 INDEX 1. Evaluation Method 1-1 Circuit used for determination . 1 Steady state data (2) Warm up voltage drift characteristics (3) Over current protection (OCP) characteristics (4) Over voltage protection (OVP) characteristics


    Original     		PDF LDC12 100VAC 64MHZ 230VAC 75MHZ Fluke 89 chroma 6630 espec su-241 temperature chamber HL562 espec su-241 ESI26 DL1740 su-241 ENV216 TCP404XL

    Untitled

    Abstract: No abstract text available
    Text: Agilent 4291B 1.8 GHz Impedance/Material Analyzer Product Overview Discontinued Product Information — For Support Reference Only — Information herein, may refer to products/services no longer supported. We regret any inconvenience caused by obsolete information. For the


    Original     		PDF 4291B 5966-1501E

    LS25 Reliability Data

    Abstract: ls25 rel MIP2G50MDSLJ MIP2G5 TE85L S1VB60-7000 HA17431UA-TL-E TSA-101S-W MIP2g HA17431UA-TL
    Text: LS25 RELIABILITY DATA DWG. No PA580-57-01 APPD TDK-Lambda CHK DWG LS25 I N D E X PAGE 1. Calculated Values of MTBF …………………………………… R-1 2. Component Derating .………………………………………………. R-2 3. Main Components Temperature Rise ΔT List


    Original     		PDF PA580-57-01 30mins 230VAC LS25 Reliability Data ls25 rel MIP2G50MDSLJ MIP2G5 TE85L S1VB60-7000 HA17431UA-TL-E TSA-101S-W MIP2g HA17431UA-TL

    LS35 Reliability Data

    Abstract: ls35 rel FA13842N-D1-TE1 IC CHIP 817C Photocoupler jc 817 264-7GVD 264-7GVD/S530-E2 INS400 jc 817 Photocoupler Q 817
    Text: LS35 RELIABILITY DATA DWG. No PA581-57-01 APPD TDK-Lambda CHK DWG LS35 I N D E X PAGE 1. Calculated Values of MTBF …………………………………… R-1 2. Component Derating .………………………………………………. R-2 3. Main Components Temperature Rise ΔT List


    Original     		PDF PA581-57-01 30mins 230VAC LS35 Reliability Data ls35 rel FA13842N-D1-TE1 IC CHIP 817C Photocoupler jc 817 264-7GVD 264-7GVD/S530-E2 INS400 jc 817 Photocoupler Q 817

    LS35 Evaluation Data

    Abstract: ls35 eva EN55011 espec su-241 EN-55011-B Kikusui EN55011-B chroma 6630 su-241 chroma 6530
    Text: LS35 EVALUATION DATA DWG.No PA581-53-01 APPD TDK-Lambda CHK DWG LS35 INDEX 1. Evaluation Method 1-1 Circuit used for determination . 1 Steady state data (2) Warm up voltage drift characteristics (3) Over current protection (OCP) characteristics


    Original     		PDF PA581-53-01 094MHz) EN55011-B 694MHz) 230VAC 641MHz) 141MHz) LS35 Evaluation Data ls35 eva EN55011 espec su-241 EN-55011-B Kikusui EN55011-B chroma 6630 su-241 chroma 6530

    espec su-241

    Abstract: espec su-241 temperature chamber ESI26 Kikusui su-241 EN55011 LDV12 T-14 T-15 T-20
    Text: LDV12 INDEX 1. Evaluation Method 1-1 Circuit used for determination . 1 Steady state data (2) Warm up voltage drift characteristics (3) Over current protection (OCP) characteristics (4) Over voltage protection (OVP) characteristics


    Original     		PDF LDV12 100VAC EN55011-B 91MHZ 230VAC 64MHZ espec su-241 espec su-241 temperature chamber ESI26 Kikusui su-241 EN55011 LDV12 T-14 T-15 T-20

    LS25 Evaluation Data

    Abstract: ls25 eva espec su-241 chroma 6630 EN55011 EN55011-B Fluke 89 Kikusui su-241 T-20
    Text: LS25 EVALUATION DATA DWG.No PA580-53-01 APPD TDK-Lambda CHK DWG LS25 INDEX 1. Evaluation Method 1-1 Circuit used for determination . 1 Steady state data (2) Warm up voltage drift characteristics (3) Over current protection (OCP) characteristics


    Original     		PDF PA580-53-01 EN55011-B 03MHz) 08MHz) 230VAC 74MHz) LS25 Evaluation Data ls25 eva espec su-241 chroma 6630 EN55011 EN55011-B Fluke 89 Kikusui su-241 T-20

    DC04 display

    Abstract: how to test POWER MOSFET with digital multimeter tektronix 576 curve tracer VISHAY VT 300 WEIGHT INDICATOR TSMC 0.35Um FLUKE 79 manual THERMAL ELECTRIC COOLER hp 4274A 532 nm laser diode PHOTO TRANSISTOR ppt
    Text: Quality And Reliability Report 2005 DC04-0001 Page 1 of 79


    Original     		PDF DC04-0001 DC04 display how to test POWER MOSFET with digital multimeter tektronix 576 curve tracer VISHAY VT 300 WEIGHT INDICATOR TSMC 0.35Um FLUKE 79 manual THERMAL ELECTRIC COOLER hp 4274A 532 nm laser diode PHOTO TRANSISTOR ppt

    tsmc 0.35um 2p4m cmos

    Abstract: K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC
    Text: Quality And Reliability Report 2004 Period Covered: 2003


    Original     		PDF DC04-0001 tsmc 0.35um 2p4m cmos K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC

    TABAI PL-2G

    Abstract: tabai espec espec ess-630a rm100-48 tabai espec pl-2g lambda power supply RM100-48-2 Lambda instruction manual lambda a serie
    Text: L a m b d a 's n ew R M S e rie s o f P o w er M odules are id e a lly d e s ig n e d f o r T e le c o m m u n ic a tio n s and N etw ork applications, w here high efficiency and low profile are critical. TECHNICAL DATA RM100-48 Series of Power Modules lambda Electronics inc. A


    OCR Scan     		PDF RM100-48 1-800-LAMBDA-4/5 TDRM100-48 106Hour) TABAI PL-2G tabai espec espec ess-630a tabai espec pl-2g lambda power supply RM100-48-2 Lambda instruction manual lambda a serie

    s3v 73 diode

    Abstract: LTYN DIODE S3V 64 diode S3V 68 DIODE S3V 46 TSV-40 ESS-630A PC6-24-5 PCD6-24-1212 DIODE S3V 39
    Text: PCD6- * - * RELIABILITY DATA «HSlíx—? DWG No.040-57-01 APPD. CHK. DWG. HWB 8. cu. DENSEI-LAMBDA '0 SL/\Jwn^' /0 fc/jah foe INDEX PAGE 1. Component Derating . pISp p t V 2 . 3^3§ï^nRÎJii,EÉ!-h^Muï


    OCR Scan     		PDF C140-57-01 24VDC s3v 73 diode LTYN DIODE S3V 64 diode S3V 68 DIODE S3V 46 TSV-40 ESS-630A PC6-24-5 PCD6-24-1212 DIODE S3V 39

    INS420

    Abstract: tabai espec ESS-630A photo transistor til 78 PC3-24-5 PCD3-24-1212 whs 73
    Text: PCD3- * - * RELIABILITY DATA f i t í l t t - T — £ DWG No.C 136-57-01 APPD. CHK. DWG. H-TAiïE a ft, ?• A * 3 'm u t h / ' DENSEI-LAMBDA Mì/A ^ /'o o INDEX PAGE 1 . p$i5i7r'Vl/w “7 V ^ ':? ' Component Derating .


    OCR Scan     		PDF 30min INS420 tabai espec ESS-630A photo transistor til 78 PC3-24-5 PCD3-24-1212 whs 73

    Nemic-Lambda

    Abstract: chroma 6630 espec su-241 espec su-241 temperature chamber ENV216 PA577-53-01 EN55011-B Fluke 19 Multimeter digital power meter 250K LIN
    Text: LSIOO EVALUATION DATA DWG.No PA577-53-01 APPD CHK DWG ¿ék' £ MsHj t j ^ L ÎÀjJéJ^À DÎ i. NEMIC-LAMBDA LS100 INDEX 1. Evaluation Method PAGE 1-1 Circuit used for determination . T -l-5 1 Steady state data (2) Warm up voltage drift characteristics


    OCR Scan     		PDF PA577-53-01 LS100 115VAC 682MHz) 627MHz) Nemic-Lambda chroma 6630 espec su-241 espec su-241 temperature chamber ENV216 PA577-53-01 EN55011-B Fluke 19 Multimeter digital power meter 250K LIN

    45Cll

    Abstract: tabai espec c124 transistor ESS-630A PC3-24-5 TRANSISTER C124 TSV-40 mtl 5018
    Text: PC3- * - * RELIABILITY DATA « « t e x - * QA APPD. O /is c ./ty A MWe-lAMBDA DWGNO.C124- 57-01 CHK, APPD. / DWG y W ì 'ì INDEX PAGE 1. bTCp Component Derating . p 2. ^ W-S p c im.I!i_ L 7 i-ilfi


    OCR Scan     		PDF C124-5 500VAC^ 45Cll tabai espec c124 transistor ESS-630A PC3-24-5 TRANSISTER C124 TSV-40 mtl 5018

    TSV-40

    Abstract: tabai espec ESS-630A PC1R5-24-5 PCD1R5-24-1212 tabai
    Text: PCD1R5- * - * RELIABILITY DATA il I1 T 1' — ^ D A M P P D - r m W G . N o . C C H l 3 2 - 5 7 - 0 1 K . D W G . A n u p f ? . DENSEI-LAMBDA fiu fr 'D D '< r o ^ f k v - f T o o INDEX PAGE 1. p|5[5p T :VI^'— Component Derating .


    OCR Scan     		PDF

    tabai espec

    Abstract: TSV-40 217F ESS-630A PC6-24-5 R-16
    Text: PC6- * - * RELIABILITY DATA « « lîT —ÿ DWG NO.C128-57-01A DENSEI-LAMBDA INDEX PAGE 1. M T B F M i È C a lcu lated V alues o f M TBF 2 . — :7~'i'y/7' C om ponent D erating 3. É îlf A bnorm al T e s t Vibration Test 6. /'{/Ç'yi.zi-U — 7. R -l . R-2


    OCR Scan     		PDF C128-57-01A R-16i 50MQjy 500VACJ^ 24VDC tabai espec TSV-40 217F ESS-630A PC6-24-5 R-16

    TSV-40

    Abstract: ESS-630A PC1R5-24-5
    Text: P C 1 R 5 - * - * RELIABILITY DATA Q A APPD. n f a c . / '9j A KCHie-UUKBU DWGNO.C120-57-01 APPD CHK. X ,/ > DWG. H. \i\cM cL 3 / fe e / 'n INDEX PA G E 1. Component Derating . 2. i l l p | 5 p p ? i l j i M a i n


    OCR Scan     		PDF C120-57-01 500VAC^ TSV-40 ESS-630A PC1R5-24-5