Untitled
Abstract: No abstract text available
Text: Array Architecture for ATG with 100% Fault Coverage Abstract This paper discusses array architecture, circuitry and methodology for the autom atic generation o f test vectors. T he architecture is im plem ented in a mask programm ed version of an antifuse based
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transistor A1010
Abstract: actel a1020b actel a10v20b A1020b
Text: BACK ACT 1 Series FPGAs Features • 5V and 3.3V Families fully compatible with JEDEC specifications A security fuse may be programmed to disable all further programming and to protect the design from being copied or reverse engineered. • Up to 2000 Gate Array Gates 6000 PLD equivalent gates
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20-Pin
84-Pin
A1020B
transistor A1010
actel a1020b
actel a10v20b
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A1010
Abstract: A1010B A1020 A1020B transistor A1010
Text: ACT 1 Series FPGAs • 5V and 3.3V Families fully compatible with JEDEC specifications A security fuse may be programmed to disable all further programming and to protect the design from being copied or reverse engineered. • Up to 2000 Gate Array Gates 6000 PLD equivalent gates
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A1020B
A10V20B
84-Pin
A1020B
84-Pin
A1010
A1010B
A1020
transistor A1010
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A1020B
Abstract: a1010b transistor a1020 A1010 A1020 transistor A1010
Text: ACT 1 Series FPGAs Features • 5V and 3.3V Families fully compatible with JEDEC specifications A security fuse may be programmed to disable all further programming and to protect the design from being copied or reverse engineered. • Up to 2000 Gate Array Gates 6000 PLD equivalent gates
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A1010B
A10V10B
A1020B
A10V20B
84-Pin
84-Pin
A1020B
a1010b
transistor a1020
A1010
A1020
transistor A1010
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Untitled
Abstract: No abstract text available
Text: ACT 1 Series FPGAs Features • A security fuse may be programmed to disable all further programming and to protect the design from being copied or 5Vand 3.3V Fam iliesfully compatible with JEDEC reverse engineered. specifications • Up to 2000 Gate Array Gates 6000 PLD equivalent gates
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20-Pin
A1010B
A10V10B
A1020B
A10V20B
84-Pin
90S-1
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A1010-PL
Abstract: Microsoft 007 ird
Text: ACT 1 Series FPGAs Features • 5V and 3.3V Families fully compatible with JEDEC specifications A security fuse may be programmed to disable all further programming and to protect the design from being copied or reverse engineered. • Up to 2000 Gate Array Gates 6000 PLD equivalent gates
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20-Pin
10Kresistor
A1020B
A1010-PL
Microsoft 007 ird
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Actel a1280
Abstract: VKS FPGA CQFP 172 actel 1020 A1020 smd TRANSISTOR 5962-9215601MXA 5962-9096503MTC equivalent transistor A1020 y 7 b Actel A1020 ACTEL A1010 actel 1020 datasheet
Text: Military Field Programmable Gate Arrays Features ACT 3 Features • Highly Predictable Performance with 100 Percent Automatic Placement and Routing • Device Sizes from 1200 to 10,000 gates up to 25,000 PLD equivalent gates • Up to 4, Fast, Low-Skew Clock Networks
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20-pin
Actel a1280
VKS FPGA CQFP 172
actel 1020
A1020 smd TRANSISTOR
5962-9215601MXA
5962-9096503MTC
equivalent transistor A1020 y 7 b
Actel A1020
ACTEL A1010
actel 1020 datasheet
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orcad
Abstract: No abstract text available
Text: ACT 1 Series FPGAs Features • 5V and 3.3V Families fully compatible with JEDEC specifications A security fuse may be programmed to disable all further programming and to protect the design from being copied or reverse engineered. • Up to 2000 Gate Array Gates 6000 PLD equivalent gates
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20-Pin
A1020B
orcad
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A1010B
Abstract: A1020B A1010 A1020 DN241 actel a1020b actel a10v20b ACTEL A1010 LL HP A1010-PL
Text: Æ 9 c t§ Ê • ACT 1 Series FPGAs Features A security fuse may be programmed to disable all further programming and to protect the design from being copied or reverse engineered. P ro d u c t F a m ily P ro file • Replaces up to 50 TTL Packages A 1010B
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20-Pin
84-Pin
A1020B
A1010B
A1010
A1020
DN241
actel a1020b
actel a10v20b
ACTEL A1010
LL HP
A1010-PL
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A1010APG84B
Abstract: A1280Acq
Text: ACT 1 and ACT 2 Military Field Programmable Gate Arrays ACT 1 Features ACT 2 Features • * U p to 2000 G ate A rray G ates 6000 PL D eq u iv alen t gates • R eplaces up to 53 T T L P ackages • R eplaces up to seventeen 20-P in PAL Packages •
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20-Pin
172-Pin
A1010APG84B
A1280Acq
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Actel a1280
Abstract: RH1020 RH1020 datasheet RH1280 transistor a1020 VKS FPGA CQFP 106 A1020 A1280 marking 8AG lockheed-martin
Text: v3.0 Radiation-Hardened FPGAs Fe a t ur es • Non-Volatile, User Programmable Devices • Guaranteed Total Dose Radiation Capability • Fabricated in 0.8µ Epitaxial Bulk CMOS Process • Low Single Event Upset Susceptibility • High Dose Rate Survivability
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A1280
A1020
Actel a1280
RH1020
RH1020 datasheet
RH1280
transistor a1020
VKS FPGA CQFP 106
marking 8AG
lockheed-martin
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0116 solar 4 pins
Abstract: 8ag marking equivalent transistor A1020 y 7 b RH1280
Text: v 2. 0 Radiation-Hardened Field Programmable Gate Arrays Features • Guaranteed Total Dose Radiation Capability • Low Single Event Upset Susceptibility • High Dose Rate Survivability • Latch-Up Immunity Guaranteed • QML Qualified Devices • Commercial Devices Available for Prototyping and
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20-Pin
RH1020
RH1280
CQ208
CQ256,
0116 solar 4 pins
8ag marking
equivalent transistor A1020 y 7 b
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RH1020
Abstract: A1020 A1280 CQ84 RH1280
Text: Radiation-Hardened Field Programmable Gate Arrays Features • Guaranteed Total Dose Radiation Capability • Low Single Event Upset Susceptibility • High Dose Rate Survivability • Latch-Up Immunity Guaranteed • QML Qualified Devices • Commercial Devices Available for Prototyping and
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RH1020
RH1280
RH1020
A1020
A1280
CQ84
RH1280
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2001TL
Abstract: actel die run marking
Text: Æ lctel Radiation-Hardened Field Programmable Gate Arrays F e a tu re s • Guaranteed Total Dose Radiation Capability • Low Single Event Upset Susceptibility • High Dose Rate Survivability • Latch-Up Immunity Guaranteed • QML Qualified Devices • Commercial Devices Available for Prototyping and
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20-Pin
RH1020
RH1280
RH1280
2001TL
actel die run marking
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Untitled
Abstract: No abstract text available
Text: — > 1 ! i Features Product Summary fcM Figure 1 • Partial View o f an ACT 1 Device A C T 1 D e v ic e S tru c tu re A partial view of an ACT 1 device Figure 1 depicts four logic modules and distributed horizontal and vertical Interconnect tracks. PLICE antifuses, located at intersections of the
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DDD136T
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Untitled
Abstract: No abstract text available
Text: RadHard Field Programmable Gate Arrays Features P ro d u c t F am ily P rofile • Guaranteed Total Dose Radiation Capabilit Device • Low Single Event Upset Susceptibility RH1020 RH1280 Capacity • High Dose Rate Survivability 2 ,0 0 0 8 ,0 00 6 ,0 0 0
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RH1020
RH1280
M0-90
CQ172
MO-113
D003Sn
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Actel a1280
Abstract: A1280 ACTEL burn-in VKS FPGA CQFP 106 A1020 RH1020 RH1280 RT1020 lockheed-martin CQFP 172 PIN
Text: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and
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actel die run marking
Abstract: No abstract text available
Text: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and
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CQFP 172 PIN
Abstract: A1280 Actel a1280 RH1280 RH1020 VKS FPGA CQFP 172 transistor a1020 VKS FPGA CQFP 106 A1020 RT1020
Text: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and
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actel cqfp 84
Abstract: No abstract text available
Text: v3.1 Radiation-Hardened FPGAs Features • • • • • • • • Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High Dose Rate Survivability Latch-Up Immunity Guaranteed QML Qualified Devices Commercial Devices Available for Prototyping and
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h128 transistor
Abstract: transistors H128 NH FUSE LINDER BSC 25-05 quivalent book
Text: RadHard Field Programmable Gate Arrays F e a ftw s re s Guaranteed Total Dose Radiation Capability Low Single Event Upset Susceptibility High D oseR ateS urvivability Latch-Up Im m unity Guaranteed QML Qualified Devices Commercial Devices A vailablefor Prototyping and
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20-Pin
h128 transistor
transistors H128
NH FUSE LINDER
BSC 25-05
quivalent book
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RT14100A
Abstract: rt1280 VKS FPGA CQFP 172 RT1280A CQFP 172 PIN 172-PIN A1280A VKS RT1460 VKS FPGA CQFP 106 A1020B
Text: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
RT14100A
rt1280
VKS FPGA CQFP 172
RT1280A
CQFP 172 PIN
172-PIN
A1280A VKS
RT1460
VKS FPGA CQFP 106
A1020B
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CQFP 256 PIN actel
Abstract: RT1280A A1280A VKS rt1280 A1020B ACTEL A1280A A1020 transistor A1280A-CQ172C RT1460 actel 172 cqfp
Text: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
CQFP 256 PIN actel
RT1280A
A1280A VKS
rt1280
A1020B
ACTEL A1280A
A1020 transistor
A1280A-CQ172C
RT1460
actel 172 cqfp
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CQFP 256 PIN actel
Abstract: ACTEL A1280A
Text: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices
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84-Pin,
132-Pin,
172-Pin,
196-Pin,
256-Pin
CQFP 256 PIN actel
ACTEL A1280A
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