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    EP3C80U484I7 Price and Stock

    Intel Corporation EP3C80U484I7

    IC FPGA 295 I/O 484UBGA
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    DigiKey EP3C80U484I7 Tray 84
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    Intel Corporation EP3C80U484I7N

    IC FPGA 295 I/O 484UBGA
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    DigiKey EP3C80U484I7N Tray 84
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    Altera Corporation EP3C80U484I7

    FPGA - Field Programmable Gate Array
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    Mouser Electronics EP3C80U484I7
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    Win Source Electronics EP3C80U484I7 960
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    Altera Corporation EP3C80U484I7N

    FPGA - Field Programmable Gate Array
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    Mouser Electronics EP3C80U484I7N
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    Win Source Electronics EP3C80U484I7N 138
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    EP3C80U484I7 Datasheets (4)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    EP3C80U484I7 Altera Embedded - FPGAs (Field Programmable Gate Array), Integrated Circuits (ICs), IC FPGA 295 I/O 484UBGA Original PDF
    EP3C80U484I7 Altera Cyclone™ III FPGAs: An Unprecedented Combination of Power, Functionality, and Cost; 484 pin UBGA; -40 to 100°C Original PDF
    EP3C80U484I7N Altera Embedded - FPGAs (Field Programmable Gate Array), Integrated Circuits (ICs), IC FPGA 295 I/O 484UBGA Original PDF
    EP3C80U484I7N Altera Cyclone™ III FPGAs: An Unprecedented Combination of Power, Functionality, and Cost; 484 pin UBGA; -40 to 100°C Original PDF

    EP3C80U484I7 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    PCN0904

    Abstract: EP3C16Q240C8N EP3C10E144C8N EP3C16F484C6 ep3C40F484C8N EP3C40F780I7N ep3c16 EP3C25F324C8N EP3C25E144I7N EP3C120F484I7N
    Text: Revision: 1.2.0 PROCESS CHANGE NOTIFICATION PCN0904 Cyclone III Family Process Shrink from 65-nm to 60-nm and Package Bill of Material Change Change Description This is an update to PCN0904, please see revision history table for information specific to this


    Original     		PDF PCN0904 65-nm 60-nm PCN0904, EU-REP3C16U484I7N EP3C10E144C7 EP3C10E144C7N EP3C10E144C8 PCN0904 EP3C16Q240C8N EP3C10E144C8N EP3C16F484C6 ep3C40F484C8N EP3C40F780I7N ep3c16 EP3C25F324C8N EP3C25E144I7N EP3C120F484I7N

    CYCLONE 3 ep3c25f324* FPGA

    Abstract: FBGA-484 datasheet EP3C16F484I7N EPM570T144I5 EP3C10E144I7N EP3C25F324I7N EPM1270F256I5 EPM1270T144I5 EP2C5Q208I8N EP3C120F780I7N
    Text: Technical Brief Extended Temperature Support for Cyclone II, Cyclone III, and MAX II Devices Introduction Semiconductor devices undergo at least two types of testing: device characterization and production testing. Device characterization is used to verify the performance of a semiconductor design and its physical implementation.


    Original     		PDF

    EP3C40F780I7

    Abstract: EP3C40F484I7 EP3C10F256 EP3C25F256I7 ep3c16f484i7 EP3C10E144I7 EP3C10E144 EP3C55F484 EP3C5F256I7 EP3C55F484I7
    Text: Quartus II Device Support Release Notes October 2007 Quartus II version 7.2 This document provides late-breaking information about device support in this version of the Altera Quartus® II software. For information about memory, disk space, and system requirements, refer to the readme.txt file in your


    Original     		PDF RN-01030-1 EP3C40F780I7 EP3C40F484I7 EP3C10F256 EP3C25F256I7 ep3c16f484i7 EP3C10E144I7 EP3C10E144 EP3C55F484 EP3C5F256I7 EP3C55F484I7