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    Intel Corporation EP3C80F780I7N

    IC FPGA 429 I/O 780FBGA
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    DigiKey EP3C80F780I7N Tray 36
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    Altera Corporation EP3C80F780I7N

    FPGA - Field Programmable Gate Array
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    Mouser Electronics EP3C80F780I7N
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    EP3C80F780I7N Datasheets (2)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    EP3C80F780I7N Altera Embedded - FPGAs (Field Programmable Gate Array), Integrated Circuits (ICs), IC FPGA 429 I/O 780FBGA Original PDF
    EP3C80F780I7N Altera Cyclone™ III FPGAs: An Unprecedented Combination of Power, Functionality, and Cost; 780 pin FBGA; -40 to 100°C Original PDF

    EP3C80F780I7N Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    PCN1205

    Abstract: EP3C120F780I7N EP4CE30F29I8LN EP4CGX50CF23C8 EP2SGX125GF1508C4 EP3C16F484C8N EP4SGF45I3
    Text: Revision: 1.3.0 PROCESS CHANGE NOTIFICATION P C N1 2 0 5 ADDITIONAL ASSEMBLY SOURCE ASE AND TRANSITION TO CENTER PIN GATE MOLD FOR FBGA PACKAGES Change Description This is an update to PCN1205; please see the revision history table for information specific to this


    Original     		PDF PCN1205; Reco0HF35I4 EP4SGX230HF35I4N EP4SGXHF35I3* EP4SGXKH40I3* EP4SGXKH40I3N* EP4SH40C2N* EP4SGF45I3* EP4SGX290NF45C2 PCN1205 EP3C120F780I7N EP4CE30F29I8LN EP4CGX50CF23C8 EP2SGX125GF1508C4 EP3C16F484C8N EP4SGF45I3

    PCN0904

    Abstract: EP3C16Q240C8N EP3C10E144C8N EP3C16F484C6 ep3C40F484C8N EP3C40F780I7N ep3c16 EP3C25F324C8N EP3C25E144I7N EP3C120F484I7N
    Text: Revision: 1.2.0 PROCESS CHANGE NOTIFICATION PCN0904 Cyclone III Family Process Shrink from 65-nm to 60-nm and Package Bill of Material Change Change Description This is an update to PCN0904, please see revision history table for information specific to this


    Original     		PDF PCN0904 65-nm 60-nm PCN0904, EU-REP3C16U484I7N EP3C10E144C7 EP3C10E144C7N EP3C10E144C8 PCN0904 EP3C16Q240C8N EP3C10E144C8N EP3C16F484C6 ep3C40F484C8N EP3C40F780I7N ep3c16 EP3C25F324C8N EP3C25E144I7N EP3C120F484I7N

    CYCLONE 3 ep3c25f324* FPGA

    Abstract: FBGA-484 datasheet EP3C16F484I7N EPM570T144I5 EP3C10E144I7N EP3C25F324I7N EPM1270F256I5 EPM1270T144I5 EP2C5Q208I8N EP3C120F780I7N
    Text: Technical Brief Extended Temperature Support for Cyclone II, Cyclone III, and MAX II Devices Introduction Semiconductor devices undergo at least two types of testing: device characterization and production testing. Device characterization is used to verify the performance of a semiconductor design and its physical implementation.


    Original     		PDF