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Catalog Datasheet	MFG & Type	Document Tags	PDF
Hi-rel 8936 Abstract: 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533 Text: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA	Original	RM2012XW-QMLV 6354IR EQR2012BA EM16372S1 JCPAC010 7H4385K019 Hi-rel 8936 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533	PDF

Catalog Datasheet

MFG & Type

Document Tags

PDF

Hi-rel 8936

Abstract: 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533
Text: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA

Original

RM2012XW-QMLV 6354IR EQR2012BA EM16372S1 JCPAC010 7H4385K019 Hi-rel 8936 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533

PDF