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    EIAJ 1981 Search Results

    EIAJ 1981 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    74F381SJ Rochester Electronics LLC Arithmetic Logic Unit, F/FAST Series, 4-Bit, TTL, PDSO20, 5.30 MM, EIAJ TYPE2, SOP-20 Visit Rochester Electronics LLC Buy
    74F182SJ Rochester Electronics LLC Look-Ahead Carry Generator, F/FAST Series, 4-Bit, TTL, PDSO16, 5.30 MM, EIAJ TYPE2, SOP-16 Visit Rochester Electronics LLC Buy
    UPA1981TE-T1-AT Renesas Electronics Corporation Nch/Pch Dual Power Mosfet 7V 2.8A 70Mohm 6Pin Tmm/Sc-95 Visit Renesas Electronics Corporation
    UPA1981TE-T1-A Renesas Electronics Corporation Nch/Pch Dual Power Mosfet 7V 2.8A 70Mohm 6Pin Tmm/Sc-95 Visit Renesas Electronics Corporation
    71981S25C Renesas Electronics Corporation 64K(16KX4)CMOS STATIC RAM Visit Renesas Electronics Corporation

    EIAJ 1981 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    EIA-J Date Code System Appendix 4

    Abstract: K 1979 letters Y1112
    Text: Appendix 4 EIA-J Date Code System The EIA-J date code system uses twenty-four letters, omitting I and O, to indicate the month when a product was made. This system works on a four year cycle. Capital letters are used for the first two years and lower case letters are used


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    d313 TRANSISTOR equivalent

    Abstract: 207a smd ic smd diode 106E mil-std-202F 101D 6822 TRANSISTOR equivalent transistor d323 MIL-STD-202F-201A transistor D313 smd diode 101a D313 VOLTAGE REGULATOR
    Text: RELIABILITY TESTING OF SEMICONDUCTOR DEVICES V. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES 1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS 4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER


    Original     		PDF R69-20 d313 TRANSISTOR equivalent 207a smd ic smd diode 106E mil-std-202F 101D 6822 TRANSISTOR equivalent transistor d323 MIL-STD-202F-201A transistor D313 smd diode 101a D313 VOLTAGE REGULATOR

    IEC 68-2-63

    Abstract: transistors Si 6822 MIL-STD-781 transistors 6822 si MIL-STD-785 MIL-STD-721 The Japanese Transistor Manual 1981 IEC 68-2-28 AND 7411 NATIONAL SEMICONDUCTOR MARKING BM
    Text: STANDARDS AND QUALITY CERTIFICATION FOR QUALITY SYSTEMS, SAFETY, ANDRELIABILITY OF SEMICONDUCTOR DEVICES VIII. STANDARDS AND QUALITY CERTIFICATION FOR QUALITY SYSTEMS, SAFETY, ANDRELIABILITY OF SEMICONDUCTOR DEVICES 1. QUALITY SYSTEM STANDARDS 1.1 INTRODUCTION TO THE ISO 9000 SERIES


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    LTC1981ES5

    Abstract: dual high side MOSFET driver with charge pump LTC1981 LTC1982 Si3442DV Si6925DQ 720 mosfet sot23 LTC1154
    Text: LTC1981/LTC1982 Single and Dual Micropower High Side Switch Controllers in SOT-23 U FEATURES • ■ ■ ■ ■ ■ ■ ■ ■ ■ DESCRIPTIO No External Components Required Internal Voltage Triplers Produce High Side Gate Drive for Logic Level FETs Ultralow Power:


    Original     		PDF LTC1981/LTC1982 OT-23 LTC1982) LTC1981) OT-23 LTC1153/LTC1154 LTC1981ES5 dual high side MOSFET driver with charge pump LTC1981 LTC1982 Si3442DV Si6925DQ 720 mosfet sot23 LTC1154

    dual high side MOSFET driver with charge pump

    Abstract: 19812fs LTC1981 LTC1981ES5 LTC1982 Si3442DV Si6925DQ US1080 682 MARKING SOT-23 LTC1154
    Text: LTC1981/LTC1982 Single and Dual Micropower High Side Switch Controllers in SOT-23 U FEATURES • ■ ■ ■ ■ ■ ■ ■ ■ ■ DESCRIPTIO No External Components Required Internal Voltage Triplers Produce High Side Gate Drive for Logic Level FETs Ultralow Power:


    Original     		PDF LTC1981/LTC1982 OT-23 LTC1982) LTC1981) OT-23 LTC1153/LTC1154 dual high side MOSFET driver with charge pump 19812fs LTC1981 LTC1981ES5 LTC1982 Si3442DV Si6925DQ US1080 682 MARKING SOT-23 LTC1154

    Untitled

    Abstract: No abstract text available
    Text: LTC1981/LTC1982 Single and Dual Micropower High Side Switch Controllers in SOT-23 FEATURES • ■ ■ ■ ■ ■ ■ ■ ■ U ■ DESCRIPTIO No External Components Required Internal Voltage Triplers Produce High Side Gate Drive for Logic Level FETs Ultralow Power:


    Original     		PDF LTC1981/LTC1982 OT-23 LTC1982) LTC1981) OT-23 153/LTC1154

    MB74LS04

    Abstract: MB74LS0 MB74 MB8850H MC74HC04
    Text: FUJITSU SEMICONDUCTOR DATA SHEET DS07-20101-7E Resonator Piezoelectric Resonator FAR Family C1, C3, C4 series • DESCRIPTION Fujitsu resonators (C1, C3, C4 series) feature originally developed single crystals with a high electromechanical coupling coefficient (LiTaO3: lithium tantalate, LiNbO3: lithium niobate), the result is compact packaging. Three


    Original     		PDF DS07-20101-7E F9703 MB74LS04 MB74LS0 MB74 MB8850H MC74HC04

    MB74LS04

    Abstract: MB74LS MB8850H MC74HC04 MB8850
    Text: FUJITSU SEMICONDUCTOR DATA SHEET DS07-20101-7E Resonator Piezoelectric Resonator FAR Family C1, C3, C4 series • DESCRIPTION Fujitsu resonators (C1, C3, C4 series) feature originally developed single crystals with a high electromechanical coupling coefficient (LiTaO3: lithium tantalate, LiNbO3: lithium niobate), the result is compact packaging. Three


    Original     		PDF DS07-20101-7E MB74LS04 MB74LS MB8850H MC74HC04 MB8850

    MB74LS04

    Abstract: MB74LS quartz 12000 marking MB8850H MC74HC04 MB8850 MB74LS0 MIL-STD-202E 103A
    Text: To Top / Lineup / Index FUJITSU SEMICONDUCTOR DATA SHEET DS07-20101-7E Resonator Piezoelectric Resonator FAR Family C1, C3, C4 series • DESCRIPTION Fujitsu resonators (C1, C3, C4 series) feature originally developed single crystals with a high electromechanical


    Original     		PDF DS07-20101-7E F9703 MB74LS04 MB74LS quartz 12000 marking MB8850H MC74HC04 MB8850 MB74LS0 MIL-STD-202E 103A

    TRANSISTOR A104b

    Abstract: TRANSISTOR A107 EIAJ ED-4701 305 water pumping machine control schematic electromigration calculation for TTL smd transistor AIT AAAA series SMD transistor schematic diagram atom ED-4701 A103-C
    Text: [ 3 ] Reliability Testing Contents 1. What is Reliability Testing . 1 1.1 Significance and Purpose of Reliability Testing. 1 1.2 1.3 Before Testing . 1


    Original     		PDF 15000m/s2, 200000m/s2, TRANSISTOR A104b TRANSISTOR A107 EIAJ ED-4701 305 water pumping machine control schematic electromigration calculation for TTL smd transistor AIT AAAA series SMD transistor schematic diagram atom ED-4701 A103-C

    induction cooker schematic diagram

    Abstract: schematic diagram induction cooker gas cooker circuit ignitor 4701-306 foundry metals quality MANUALS transistor 1411 tester diagram induction cooker yamaha amplifier a 550 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR GAS COOKER IGNITOR
    Text: '04 Hand Book for QUALITY/RELIABILITY Issue Date: May 11, 2004 INTRODUCTION Thank you for supporting Oki Semiconductor products. To welcome the dawn of a new age of unlimited potential brought about by advances in the global network information revolution, the Oki semiconductor business was launched as a new company, Silicon Solution


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    MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR

    Abstract: EIAJ ED-4701-1 IEC60068 repair manual suzuki The Japanese Transistor Manual 1981 JIS-C-7032 AB-6201 Diode SMD SJ 19 electron gun CRT 1978 Data catalog
    Text: This version: Sep. 2001 Previous version: Nov. 1996 DATA BOOK for QUALITY/RELIABILITY INTRODUCTION Thank you for supporting Oki Semiconductor products. To welcome the dawn of a new age of unlimited potential brought about by advances in the global network


    Original     		PDF MIL-STD-883 MIL-STD-202 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR EIAJ ED-4701-1 IEC60068 repair manual suzuki The Japanese Transistor Manual 1981 JIS-C-7032 AB-6201 Diode SMD SJ 19 electron gun CRT 1978 Data catalog

    MQ198B-10S-CV1

    Abstract: MQ198 RC-5238 MQ198B-10S-CV CL206-2443-7 MQ198IMT-2000 MQ 132 DC100V DC250V sa-800
    Text: 掲載している製品の特性及び仕様は参考値です。製品のご使用に当たっては、最新の納入仕様書／参考図にてご確認下さい。 RoHS非適合製品については生産中止予定です。RoHS対応製品につきましては、RoHS対応品検索して頂くか、弊社営業担当へご相談下さい。


    Original     		PDF IMT-2000 MQ198 IMT-2000A RC-5238 1000Mø 100mA DC250V DC100V DC300V MQ198B-10S-CV1 MQ198 MQ198B-10S-CV CL206-2443-7 MQ198IMT-2000 MQ 132 DC100V DC250V sa-800

    EIAJ ED-4701-1

    Abstract: tc5118165bj EIAJ ED-4701-1 C-111A TC5118165 TC514265DJ a107a tc5165165 tc5117405 TC5165165B failure rate TDDB
    Text: [3] 東芝半導体製品の品質･信頼性保証 1. 1.1 信頼性試験とは 信頼性試験の意義と目的 半導体デバイスの信頼性試験の目的としてデバイスがメーカーから出荷されお客様の機器組み立て 調整工程を経て、最終ユーザーにおいて所望の期間、機器の機能、性能が発揮されることを確認する


    Original     		PDF M65BJ TC5117405BST TC51V16165BFT TC5118165BFT 65deg C/150deg 300cycles) TC5117405BSJ TC514265DJ TC5118165BJ EIAJ ED-4701-1 tc5118165bj EIAJ ED-4701-1 C-111A TC5118165 TC514265DJ a107a tc5165165 tc5117405 TC5165165B failure rate TDDB

    lt941

    Abstract: 1174H5 1460d5 121i3 117450 ltc 1172 LT1682CMS8 ltc947 ltbw 1121I5
    Text: SURFACE MOUNT PRODUCTS Introduction Linear Technology Corporation LTC was founded in 1981 to address the growing demand for high performance and superior quality linear integrated circuits. Today, LTC has successfully established a leadership position by introducing and supplying leading edge products in


    Original     		PDF dev50I 1550L 1550LI 1555I 1579I 1579I3 1579I5 1620I 1621I 1643H lt941 1174H5 1460d5 121i3 117450 ltc 1172 LT1682CMS8 ltc947 ltbw 1121I5

    Ceramic Capacitors 104

    Abstract: mev-50a DXW21BN7511S SAYFP1G95AA0B00 ck 66 ul94v-0 lcd SAYFP897MCA0B00 SAFEB1G57KE0F00 SAWEN1G84 murata enc-03r MA300D1-1
    Text: MURATA PRODUCTS 2009-2010 2009-2010 MURATA PRODUCTS !Note • This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice.


    Original     		PDF K99E-27 Ceramic Capacitors 104 mev-50a DXW21BN7511S SAYFP1G95AA0B00 ck 66 ul94v-0 lcd SAYFP897MCA0B00 SAFEB1G57KE0F00 SAWEN1G84 murata enc-03r MA300D1-1

    EIAJ ED-4701 305

    Abstract: MIL-M-38510F ED-4701 JEDEC A104-B jis C5003 JESD22 A108-B ic CV 203 EIAJ ED-4701 313
    Text: [3] 信頼性試験 目 1. 信頼性試験とは .1 1.1 1.2 1.3 1.4 1.5 1.6 2. 加速寿命試験の目的 . 11


    Original     		PDF C/100% 105Pa) 24h/1] 15000m/s2, 200000m/s2, EIAJ ED-4701 305 MIL-M-38510F ED-4701 JEDEC A104-B jis C5003 JESD22 A108-B ic CV 203 EIAJ ED-4701 313

    ecg semiconductors master replacement guide

    Abstract: transistor SMD marked RNW th 20594 TRANSISTOR si 6822 MIL-STD-202F-201A CT 1975 sam transistors br 6822 sun hold ras 2410 relay TRANSISTOR SMD MARKING CODE jg Mist Ultrasonic Humidifier
    Text: RELIABILITY OF SEMICONDUCTOR DEVICES I. RELIABILITY OF SEMICONDUCTOR DEVICES 1. OUR PHILOSOPHY OF QUALITY 2. SEMICONDUCTOR RELIABILITY RELIABILITY OF SEMICONDUCTOR DEVICES I. RELIABILITY OF SEMICONDUCTOR DEVICES 1. OUR PHILOSOPHY OF QUALITY Since its foundation, Mitsubishi Electric has been seeking a philosophy of extending the business and contributing the society with high


    Original     		PDF

    2SC1961

    Abstract: transistor c 301b japanese transistor manual 1981 2SA771 138D 2SA770 Transistor Manual 1981
    Text: 5 - - FOR U SE BY E LEC TR IC IA N S O VER SEA S : •M-EiiOSWHE New Transistor Manual lists all the transistors registered with the Electronic Industries Association of Japan (EIAJ), arranged in a manner easy to look up. We hope that you will make full use of the data provided in this manual by referring to the Japanese-English


    OCR Scan     		PDF 2SA770 2SA771 2SC1961 transistor c 301b japanese transistor manual 1981 138D Transistor Manual 1981

    ui*321

    Abstract: No abstract text available
    Text: S E M IC O N D U C T O R 74F174 Hex D Flip-Flop w ith M aster Reset General Description Features The ’F174 is a high-speed hex D flip-flop. The device is used primarily as a 6-bit edge-triggered storage register. The infor­ mation on the D inputs is transferred to storage during the


    OCR Scan     		PDF 74F174 74F174PC 54F174DM 74F174SC 74F174SJ 54F174FM 54F174LM ui*321

    Untitled

    Abstract: No abstract text available
    Text: Revised A ugust 1999 S E M IC Q N D U C T D R T M 74F1071 18-Bit Undershoo t/Overshoot Clamp and ESD Protectic n Device General Description Features The 74F1071 is an 18-bit undersh Dot/overshoot clam p w hich is designed to limit bus voltage s and also to protect


    OCR Scan     		PDF 74F1071 18-Bit 74F1071 20-pin

    hbbd

    Abstract: No abstract text available
    Text: S E M IC O N D U C T O R 74LCX257 Low Voltage Quad 2-Input Multiplexer with 5V Tolerant Inputs and Outputs General Description Features The LCX257 is a quad 2-input multiplexer with 3-STATE out­ puts. Four bits ot data tram two sources can be selected us­


    OCR Scan     		PDF 74LCX257 LCX257 2314-006I hbbd

    Untitled

    Abstract: No abstract text available
    Text: R C H I I - P S E M IC O N D U C T O R -n 74VHC175 Quad D Flip-Flop General Description The VHC175 is an advanced high-speed C M O S device fa b ­ ricated with silicon gale CM OS technology. It achieves the high-speed operation sim ilar to e quivalent B ipolar Schottky


    OCR Scan     		PDF 74VHC175 VHC175

    74HC163

    Abstract: M2GZ
    Text: S E M C H September 1995 I L D I C C D N D U C T O R Revised April 1999 I 'M 74VHC163 4-Bit Binary Counter with Synchronous Clear General Description The VHC163 is an advanced high-speed CMOS device fabricated with silicon gate CMOS technology. It achieves


    OCR Scan     		PDF 74VHC163 VHC163 modulo-16 74HC163 M2GZ