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    DS217 Price and Stock

    Rochester Electronics LLC DS2176

    DS2176 T1 RECEIVE BUFFER
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    DigiKey DS2176 Tube 19
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    Rochester Electronics LLC DS2175

    DS2175 T1/CEPT ELASTIC STORE
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    DigiKey DS2175 Tube 23
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    Maxim Integrated Products DS2175

    IC TELECOM INTERFACE 16DIP
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    DigiKey DS2175 Tube 1,000
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    Rochester Electronics DS2175 366 1
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    Rochester Electronics LLC DS2175-

    DS2175 T1/CEPT ELASTIC STORE
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    DigiKey DS2175- Tube 29
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    Rochester Electronics LLC DS2175S

    DS2175 T1/CEPT ELASTIC STORE
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    DigiKey DS2175S Tube 19
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    DS217 Datasheets (74)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    DS217 Mil Electronics 3 Watts of Isolated Output Power, Power Supply Scan PDF
    DS2172 Dallas Semiconductor Bit Error Rate Tester BERT Original PDF
    DS2172 Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172 Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172 Dallas Semiconductor Bit Error Rate Tester (BERT) Scan PDF
    DS2172 Dallas Semiconductor Bit Error Rate Tester (BERT) Scan PDF
    DS2172T Dallas Semiconductor Bit Error Rate Tester BERT Original PDF
    DS2172T Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172T+ Maxim Integrated Products Bit Error Rate Tester (BERT). Lead-free Original PDF
    DS2172TN Dallas Semiconductor Bit Error Rate Tester BERT Original PDF
    DS2172TN Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172TN+ Maxim Integrated Products Bit Error Rate Tester (BERT). Lead-free Original PDF
    DS2172TN+T&R Dallas Semiconductor Interface - Telecom, Integrated Circuits (ICs), IC BIT ERROR RATE TESTER 32TQFP Original PDF
    DS2172TN/T&R Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172T/T&R Maxim Integrated Products Communication Misc, Bit Error Rate Tester (BERT), Tape and Reel Original PDF
    DS2172T/T&R+ Maxim Integrated Products Bit Error Rate Tester (BERT). Lead-free Original PDF
    DS2172T+T&R Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172T/T&R/C01 Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2172T/T&R/C02 Maxim Integrated Products Bit Error Rate Tester (BERT) Original PDF
    DS2174 Dallas Semiconductor EBERT Original PDF

    DS217 Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    DS2175

    Abstract: DS2175N DS2175S DS2180A DS2181A HC595
    Text: DS2175 T1/CEPT Elastic Store www.dalsemi.com FEATURES • • • • • • • • PIN ASSIGNMENT Rate buffer for T1 and CEPT transmission systems Synchronizes loop–timed and system timed data streams on frame boundaries Ideal for T1 1.544 MHz to CEPT (2.048


    Original     		DS2175 DS2180A DS2181A DS2175N DS2175S 16-PIN DS2175 DS2175N DS2181A HC595 PDF

    DS2172

    Abstract: burst generator ds2172 application note psr1
    Text: DS2172 Application Note Bit Error Rate Tester, V.54 Modem Test Patterns June 6, 1996 The DS2172 can be used to generate and detect the PREPARATORY, ACKNOWLEDGE, and TERMINATION patterns for V.54 modem testing. Figure 1 shows the pattern generator depicted in V.54. The pattern generator in the DS2172 is


    Original     		DS2172 DS2172. DS2172 burst generator ds2172 application note psr1 PDF

    ds2172 application note

    Abstract: receiver transistor DS2172 32 Bit Counter counter pcr sin01v12 Receiver
    Text: DS2172 Application Note Bit Error Rate Tester, Simplified Receiver Operation April 28, 1997 DS2172 SIMPLIFIED RECEIVER OPERATION DURING REPETITIVE PATTERN MODE PATTERN RECEIVE REGISTERS RL PCR.3 1 RDATA S1 2 SHIFT REGISTER TAP CONTROLLED BY PATTERN LENGTH REGISTER


    Original     		DS2172 ds2172 application note receiver transistor 32 Bit Counter counter pcr sin01v12 Receiver PDF

    DS2172

    Abstract: No abstract text available
    Text: DS2172 Application Note Bit Error Rate Tester, Repetitive Pattern Operation May, 9 1996 The DS2172 can be used to generate repetitive patterns up to 32 bits in length. Operation of the synchronizer differs in this mode from the Pseudo random Pattern mode. In the Repetitive Pattern mode the receiver looks for a repeating


    Original     		DS2172 PDF

    PS700

    Abstract: No abstract text available
    Text: PS700 PS700 Rev. B4 Silicon Errata The PS700 Rev. B4 parts you have received conform functionally to the Device Data Sheet DS21760F , except for the anomalies described below. Microchip does not intend to address the issues listed here in future revisions of the PS700 silicon. It is recommended that you replace the PS700 in existing


    Original     		PS700 PS700 DS21760F) PDF

    BEC23

    Abstract: DS2172 PS22 PS29 PS30 INTEL PR8
    Text: DS2172 DS2172 Bit Error Rate Tester BERT FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems • Operates at speeds from DC to 52 MHz


    Original     		DS2172 DS2172 BEC23 PS22 PS29 PS30 INTEL PR8 PDF

    C32-C40

    Abstract: 50-Pin DIP Connector SMD diode DS1 DS2174 SMD TQFP microcontroller DS87C520-ECL how to use in crystal osc 11.0592mhz ECU-V1H102KBM DS2174DK SEMICONDUCTOR dallas
    Text: DS2174DK Enhanced Bit Error-Rate Tester Design Kit www.maxim-ic.com GENERAL DESCRIPTION FEATURES The DS2174DK is a fully integrated demonstration kit for the DS2174 enhanced bit error-rate tester BERT . This demo kit contains all the necessary circuitry to evaluate the device in all modes of


    Original     		DS2174DK DS2174DK DS2174 DS2174, RS-232 44-Pin com/DS2174) DS2174 C32-C40 50-Pin DIP Connector SMD diode DS1 SMD TQFP microcontroller DS87C520-ECL how to use in crystal osc 11.0592mhz ECU-V1H102KBM SEMICONDUCTOR dallas PDF

    Untitled

    Abstract: No abstract text available
    Text: DS2175 T1/CEPT Elastic Store www.dalsemi.com FEATURES • • • • • • • • PIN ASSIGNMENT Rate buffer for T1 and CEPT transmission systems Synchronizes loop–timed and system timed data streams on frame boundaries Ideal for T1 1.544 MHz to CEPT (2.048


    Original     		DS2175 DS2180A DS2181A DS2175S 16-PIN DS2175 PDF

    TFDU circuit

    Abstract: marking code C9 TFDU 4100 circuit MCP2140 MMUN2111LT1
    Text: MCP2140 MCP2140 Rev. A Silicon/Data Sheet Errata The MCP2140 Rev. A parts you have received conform functionally to the MCP2140 device data sheets DS21790A , with the exception of the anomaly described below. These issues has been addressed in the MCP2140


    Original     		MCP2140 MCP2140 DS21790A) DS80237A-page TFDU circuit marking code C9 TFDU 4100 circuit MMUN2111LT1 PDF

    32-PIN

    Abstract: DS2172 DS2172T DS2172TN PS22 PS30 O.151
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz


    Original     		DS2172 32-bit DS2172 32-PIN DS2172T DS2172TN PS22 PS30 O.151 PDF

    DS2174

    Abstract: DS2174Q DS2174QN
    Text: DS2174 EBERT www.maxim-ic.com § § § § § § § § § ORDERING INFORMATION DS2174Q DS2174QN 44-Pin PLCC 0°C to +70°C 44-Pin PLCC -40°C to +85°C RDAT2 RDAT1 RDAT0 RCLK_EN RCLK VDD D7 D6 D5 D4 D3 6 5 4 3 2 1 44 43 42 41 40 § PIN ASSIGNMENT Generates and detects digital patterns for


    Original     		DS2174 DS2174Q DS2174QN 44-Pin 48-bit DS2174 DS2174Q DS2174QN PDF

    DS2172

    Abstract: AN458
    Text: COMMUNICATIONS CIRCUITS Application Note 458: May 08, 2001 App Note 332: DS2172 Simplified Receiver Operation DS2172 Bit Error Rate Tester BERT simplified receiver operation during repetitive pattern mode. Operation During Repetitive Pattern Mode PATTERN RECEIVE REGISTERS


    Original     		DS2172 com/an458 DS2172: AN458 PDF

    DS2186

    Abstract: DS2187 DS2176 DS2176N DS2176Q DS2180A 193s
    Text: DS2176 DS2176 T1 Receive Buffer PIN ASSIGNMENT • Synchronizes loop–timed and system–timed T1 data 1 24 VDD 2 23 SCLKSEL RCLK 3 22 SYSCLK RSER 4 21 SSER A 5 20 SLIP B 6 19 SBIT8 C 7 18 SMSYNC D 8 17 SIGFRZ SCHCLK 9 16 SFSYNC SM0 10 15 ALN SM1 11 14 FMS


    Original     		DS2176 compens2176 DS2176Q DS2176 DS2186 DS2187 DS2176N DS2176Q DS2180A 193s PDF

    32-PIN

    Abstract: DS2172 PS22 PS29 PS30
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz Programmable polynomial length and feedback taps for generation of any other


    Original     		DS2172 32-bit DS2172 32-PIN PS22 PS29 PS30 PDF

    DS2175

    Abstract: No abstract text available
    Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS2175 Jul-97 9712 D1 ANAM, K. DN702069AAJ 2.0µ OXIDE 16 SOIC STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C): T/C: -55°C to +125°C, 10~


    Original     		DS2175 Jul-97 DN702069AAJ P-20058 P-20082 P-20083, P-20122 P-20123 39/0EADPOINT DS2175 PDF

    DS2175

    Abstract: DS2175N DS2175S DS2180A DS2181A HC595
    Text: DS 2175 DALLAS SEMICONDUCTOR FEATURES DS2175 T1/CEPT Elastic Store PIN ASSIGNMENT • Rate buffer for T1 and C E PT transm ission system s • Synchronizes lo o p -tim e d and system tim ed data stream s on fram e boundaries • Ideal forT1 1.544 MHz to CEPT (2.048 MHz), CEPT


    OCR Scan     		DS2175 DS2180A DS2181A of-40Â DS2175N DS2175S 16-PIN DS2175 DS2175N HC595 PDF

    Untitled

    Abstract: No abstract text available
    Text: DALLAS SEMICONDUCTOR DS2176 T1 Receive Buffer FEATURES PIN ASSIGNMENT • Synchronizes loop-timed and system-timed T1 data streams s ìg h C 1 24 H VDD RMSYNC C 2 • Two-frame buffer depth; slips occur on frame bound­ aries • Output indicates when slip occurs


    OCR Scan     		DS2176 2bl4130 DS2176Q DD1522b PDF

    BEC26

    Abstract: BEC10 th02 DS2172 PS24 PS25 PS26 PS27 PS28 PS29
    Text: DS2172 DALLAS s e m ic o n d u c t o r FEATURES DS2172 Bit Error R a te T e s te r B E R T PIN ASSIGNMENT 1G enerates/D etects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica­ tions system s 1 — < O Q O W O O O Q


    OCR Scan     		DS2172 32-bit BEC26 BEC10 th02 DS2172 PS24 PS25 PS26 PS27 PS28 PS29 PDF

    si24

    Abstract: No abstract text available
    Text: DS2176 F U LL DATA S H E E T A V A IL A B L E - C A L L 214-450-3836 DALLAS DS2176 T 1 R eceive Buffer s e m ic o n d u c to r PIN ASSIGNMENT FEATURES • Synchronizes loop-timed and system-timed T 1 data streams C C C C 3 22 4 21 AC 5 20 C CC DC SCH CLK C


    OCR Scan     		DS2176 DS2180AT1 DS2176 24-lead si24 PDF

    Untitled

    Abstract: No abstract text available
    Text: rjA I 1 A Q Bmmomnjctm FEATURES • DS2175 T1/CEPT Elastic Store PIN ASSIGNMENT Rate buffer for T1 and CEPT transmission systems Synchronizes loop-timed and system timed data streams on frame boundaries Ideal for T1 1.544 MHz to CEPT (2.048 MHz), CEPT to T1 interfaces


    OCR Scan     		DS2175 16-PIN DS2175S PDF

    DS2180A

    Abstract: DS2175 DS2181A DS2186 DS2187 DS2280 DS2281 DS2281-075 DS2281-120 2BL4
    Text: DS2280/DS2281 DS2280/DS2281 DALLAS SEMICONDUCTOR T 1 Line Card Stik C E P T Line Card Stik FEATURES PIN ASSIGNMENT • Pretested, snap-in T1 or CEPT line card DS2280 DS2281-075 DS2281-120 o T1 Line Card 75 ohm CEPT Line Card 120 ohm CEPT Line Card DS2175 ID


    OCR Scan     		DS2280/DS2281 DS2280 DS2281-075 DS2281-120 DS2281 DS2175 DS2180A DS2181A DS2175 DS2181A DS2186 DS2187 DS2281-120 2BL4 PDF

    Untitled

    Abstract: No abstract text available
    Text: n A I I A S s e m ic o n d u c to r FEATURES DS2172 Bit Error Rate Tester BERT PIN ASSIGNMENT • G enerates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital com m unica­ tions systems • O perates at speeds from DC to 52 MHz


    OCR Scan     		DS2172 PDF

    Untitled

    Abstract: No abstract text available
    Text: DALLAS SEMICONDUCTOR DS2175 T1/CEPT Elastic Store FEATURES PIN ASSIGNMENT • Rate buffer for T 1 and CEPT transm ission system s • Synchronizes loop-tim ed and system tim ed data stream s on fram e boundaries • Ideal for T1 1.544 MHz to CEPT (2.048 MHz), CEPT


    OCR Scan     		DS2175 DS2175S 16-PIN PDF

    Untitled

    Abstract: No abstract text available
    Text: DS2176 DALLAS SEMICONDUCTOR DS2176 T 1 Receive Buffer FEATURES PIN ASSIGNMENT • Synchronizes loop-timed and system-timed T1 data streams 1 24 □ VDD RMSYNC C 2 s ig h C 23 □ SCLKSEL r c lk C 22 □ SYSCLK • Two-frame buffer depth; slips occur on frame bound­


    OCR Scan     		DS2176 DS2180A 28-PIN DS2176 24-lead PDF