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    Untitled

    Abstract: No abstract text available
    Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS2502 Dec-96 9641 A6 CARSEM DM631365ABA1 1.2µ OX/NI EPROM 08 SOIC 150 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):


    Original     		DS2502 Dec-96 P-18987 P-19062, P-19095 DM631365ABA1 P-19096 P-19097 P-19098 PDF

    dk52

    Abstract: P-16890 17872 p1908 P1875 P-18701
    Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96


    Original     		DS1302) Mar-96 Sep-96 Feb-96 Aug-96 Nov-96 Feb-97 May-96 dk52 P-16890 17872 p1908 P1875 P-18701 PDF

    DK53

    Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M
    Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96


    Original     		DS1302) DS1302 DS1868 DS21S07A DS80C320 DK53 dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M PDF