200NH-2
Abstract: SM3180
Text: SM3 SERIES High “Q”, Low DC resistance, Ultra stable. HIGH PERFORMANCE SURFACE MOUNT INDUCTORS Defect rate below 50 PPM. Statistical process control. Chart of central tendency supplied with each lot. Rugged lead frame design. Solder plated copper terminals.
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BOX111
716-532-2702/E-MAILsales
SM397
200NH-2
SM3180
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UTC 1316
Abstract: No abstract text available
Text: VISHAY Vishay Semiconductors Quality Information Vishay Semiconductors’ Continuous Improvement Activities • Quality training for ALL personnel including production, development, marketing and sales departments • Zero defect mindset • Permanent quality improvement process
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ISO14001
07-Jan-03
UTC 1316
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PDF
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MA4CS102A SOT23
Abstract: MA4CS101E MA4CS102A 102 SOT-143 MA4CS101A MA4CS101B MA4CS103A MA4CS101 MA4CS102 MA4CS102B
Text: Surface Mount Schottky Diodes MA4CS101, 102, 103 Series V3.00 SOT-23 Features ● ● ● ● ● High Performance Schottky Diodes Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Packages - Single and Pair Configurations High Quality Products Defect Rate Less Than 50 PPM
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MA4CS101,
OT-23
OT-23
OT143
MA4CS102A SOT23
MA4CS101E
MA4CS102A
102 SOT-143
MA4CS101A
MA4CS101B
MA4CS103A
MA4CS101
MA4CS102
MA4CS102B
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PDF
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Electron Radiation as an Indicator of Gold Nodule Defect during E-beam Evaporation
Abstract: No abstract text available
Text: Electron Radiation as an Indicator of Gold Nodule Defect during E-beam Evaporation Kezia Cheng Skyworks Solutions, Inc. 20 Sylvan Road, Woburn, MA. kezia.cheng@skyworksinc.com 781 241-2821 Keywords: … Back scattered electron, E-beam evaporation, Gold nodules, Gold spitting
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16th-19th,
Electron Radiation as an Indicator of Gold Nodule Defect during E-beam Evaporation
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PDF
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MA4CP101A
Abstract: MA4CP101
Text: Surface Mount PIN Diode MA4CP101A High Sigma V4.00 Features • • • • • SOT-23 High Performance PIN Diode Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Package High Quality Products Defect Rate Less than 50 PPM Aggressively Priced for High Volume,
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MA4CP101A
OT-23
OT-23
MA4CP101
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PDF
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epoxy adhesive paste cte table
Abstract: CRACK
Text: TECHNICAL INFORMATION CRACKS: THE HIDDEN DEFECT by John Maxwell AVX Corporation Abstract: Cracks in ceramic chip capacitors can be introduced at any process step during surface mount assembly. Thermal shock has become a “pat” answer for all of these cracks, but about 75 to 80% originate from
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Introd-1496
S-CHD00M900-R
epoxy adhesive paste cte table
CRACK
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PDF
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epoxy adhesive paste cte table
Abstract: No abstract text available
Text: TECHNICAL INFORMATION CRACKS: THE HIDDEN DEFECT by John Maxwell AVX Corporation Abstract: Cracks in ceramic chip capacitors can be introduced at any process step during surface mount assembly. Thermal shock has become a “pat” answer for all of these cracks, but about 75 to 80% originate from
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S-CHD200M900-R
epoxy adhesive paste cte table
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PDF
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defect ppm sampling
Abstract: marking 209e 209E wafer fab control plan 002 209e metals quality MANUALS
Text: CHAPTER 3 PROCESS CONTROL “Emphasis is on defect prevention so that routine inspection will not be needed to a large extent. The burden of quality proof lies not with inspection but with the makers of the part.” Armand V. Feigenbaum In SGS-THOMSON the term “Process Control”
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statistical process control
Abstract: AN5063 spcc APP5063 yield
Text: Maxim > Design Support > App Notes > A/D and D/A Conversion/Sampling Circuits > APP 5063 Maxim > Design Support > App Notes > Automatic Test Equipment ATE > APP 5063 Maxim > Design Support > App Notes > Digital Potentiometers > APP 5063 Keywords: statistical process control, yield defects, Gaussian distribution, Six Sigma, prediction yield analysis, defect opportunity per
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com/an5063
AN5063,
APP5063,
Appnote5063,
statistical process control
AN5063
spcc
APP5063
yield
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PDF
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ferrite core E19
Abstract: fair rite 43
Text: 17t hEdi t i on Our Position on Quality And the Environment - Fair-Rite Products Corp. is committed to be "Your Signal Solution". Management and employees continue to adhere to the ISO/TS 16949 quality system, in effect at the time of the printing of this catalog revision, providing continual improvement towards defect
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Propeller Clock circuit
Abstract: propstick usb
Text: Propeller Education Kit Labs Fundamentals Version 1.2 web release 2 By Andy Lindsay WARRANTY Parallax Inc. warrants its products against defects in materials and workmanship for a period of 90 days from receipt of product. If you discover a defect, Parallax Inc. will, at its option, repair or replace the merchandise, or refund the purchase price. Before returning the
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LM2937-3
LM2940
Propeller Clock circuit
propstick usb
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PDF
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Untitled
Abstract: No abstract text available
Text: Dallas Semiconductor IME 3Q01 DS2118 DS16A43 DS1050 5508 9090 9983 40 11 4004 1102 Totals for 0.6um: 14598 40 2740 DS1232 DS1780 DS21T07 9989 6704 9989 3 2 300 298 Totals for 0.8um: 26682 5 187 Goal = 300 ppm Ken Wendel 4/20/01 Dallas Semiconductor IME 3Q01
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DS2118
DS16A43
DS1050
DS1232
DS1780
DS21T07
DS2118M
DS21352
DS21554
DS80CH11
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PDF
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DS80CH11
Abstract: 9883
Text: Dallas Semiconductor IME 3Q01 Product Tested Fails ppm DS2118M DS21X5Y DS80CH11 12380 5182 9191 3 14 66 242 2409 7181 Totals for 0.6um: 27031 83 3071 DS1232 DS87C520 DS2154 9883 10936 12243 3 14 21 304 1280 1715 Totals for 0.8um: 31278 38 1215 Goal = 300 ppm
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DS2118M
DS21X5Y
DS80CH11
DS1232
DS87C520
DS2154
DS21352
DS21554
9883
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PDF
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Oxygen Sensors
Abstract: sox sensor 20/o2 sensor
Text: Oxygen sensor module FCX-M Data sheet •Features ・High accuracy ・Long life More than 3 years in normal air *1 ・Continues calibration and maintenance not required *2 ・Calibration gas not required ・From ppm to 95%O2, wide measurement range ・No interfarance to media
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1000ppmO2
Oxygen Sensors
sox sensor
20/o2 sensor
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PDF
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Untitled
Abstract: No abstract text available
Text: T e m ic TELEFUNKEN Semiconductors Quality Information TEMIC Continuous Improvement Activities TEMIC Tools for Continuous Improvement TEMIC conducts quality training for ALL personnel including production, development, marketing and sales departments. Zero defect mindset
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SM3-120K
Abstract: No abstract text available
Text: iOA High "Q", Low DC resistance. Ultra stable. HIGH PERFORMANCE SURFACE MOUN INDUCTORS Defect rate below 50 PPM. Statistical process control. Chart of central tendency supplied with each lot. Rugged lead fram e design. Solder plated copper terminals. Vapor phase and infrared compatible.
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OCR Scan
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SM3-010K
SM3-012K
SM3-015K
SM3-018K
SM3-022K
SM3-027K
SM3-033K
SM3-039K
SM3-047K
SM3-056K
SM3-120K
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PDF
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Untitled
Abstract: No abstract text available
Text: SM3 SERIES GOWAIMDA i* HIGH PERFORMANCE SURFACE MOUNT INDUCTORS ' • High “Q”, Low DC resistance, Ultra stable. ■ Defect rate below 50 PPM. ■ Statistical process control. ■ Chart of central tendency supplied with each lot. ■ Rugged lead frame design.
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OCR Scan
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---M3-102K
fi-53
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PDF
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Untitled
Abstract: No abstract text available
Text: an A M P com pany Surface Mount PIN Diode MA4CP101A High Sigma V4.00 Features • • • • • SOT-23 High Performance PIN Diode Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Package High Quality Products Defect Rate Less than 50 PPM
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OCR Scan
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MA4CP101A
OT-23
OT-23
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PDF
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MA4CP104A
Abstract: MA4CP104 MA4CP101 MA4CP101B MA4CP103A
Text: HIGH VOLUME HIGH SIGMA commercial sem iconductors HIGH SIGMA Surface Mount PIN Diodes Features High Perform ance PIN Diodes Designed for High Volume Pick and Place Assem bly Low Profile Surface Mount Packages - Single and Pair C onfigurations High Q uality Products Defect
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OCR Scan
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OT-23
OT-23
OT-143
MA4CP104A
MA4CP104
MA4CP101
MA4CP101B
MA4CP103A
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PDF
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assembly flow chart OPTOCOUPLER
Abstract: No abstract text available
Text: Tem ic S e m i c o n d u c t o r s Quality Information TEMIC’s Continuous Improvement Activities • Quality training for ALL personnel including production, development, marketing and sales departments • Zero defect mindset • Permanent quality improvement process
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PDF
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Diode SOT-23 marking JE
Abstract: No abstract text available
Text: M r fa , M a n A M P ci o m p a n y Surface Mount PIN Diode MA4CP101A High Sigma TM V4.00 Features • • • • • SOT-23 High Performance PIN Diode Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Package High Quality Products Defect Rate Less than 50 PPM
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OCR Scan
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MA4CP101A
OT-23
OT-23
Diode SOT-23 marking JE
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PDF
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MP 1009 es
Abstract: BS-00001
Text: ^EDI B c e tro n lc D e s ig n i Inc. Reliability Program Quality Assurance Policy The Quality Standard at Electronic Designs Incorpo rated EDI is defect free work. No other standard is acceptable. This policy is reflected in the attention given to the
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MIL-STD-883.
MIL-STD-883
MP 1009 es
BS-00001
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PDF
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defect ppm sampling
Abstract: No abstract text available
Text: Signetics Quality and Reliability Military Products SIG N ETICS MILITARY PRODUCT QUALITY SIG N ETICS SHIP-TO-STOCK STS PROGRAM Signetics Quality leadership begins with the In dustry's first zero defect warranty. If a single de fect is found in any lot that we ship, the entire lot
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Untitled
Abstract: No abstract text available
Text: W I R E L E S S 4 fiC Quality Corporate Quality Policy Atm el will provide a Competitive Advantage to its Customers through Timely, Innovative, Defect-Free Products and Outstanding Service Driven by a Culture o f Systematic Continuous Improvement. F igure 1. A tm el W ireless & M icro co n tro llers quality policy
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