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    CY7C251 QUALIFICATION REPORT Search Results

    CY7C251 QUALIFICATION REPORT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    DRV8872DDARQ1 Texas Instruments Automotive 3.6A Brushed DC Motor Driver With Fault Reporting 8-SO PowerPAD -40 to 125 Visit Texas Instruments Buy
    DRV8872DDAR Texas Instruments 3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125 Visit Texas Instruments Buy
    DRV8872DDA Texas Instruments 3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125 Visit Texas Instruments Buy
    TPS2013APWP Texas Instruments 2.6A, 2.7 to 5.5V Single High-Side MOSFET Switch IC, No Fault Reporting, Active-Low Enable 14-HTSSOP -40 to 85 Visit Texas Instruments Buy
    TPS2015D Texas Instruments 1.1A, 4-5.5V Single Hi-Side MOSFET, Fault Report, Act-Low Enable 8-SOIC Visit Texas Instruments

    CY7C251 QUALIFICATION REPORT Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    27c128A

    Abstract: hysol 7C256 7c251 CY27C256 CY7C251 CY7C254 CY27C128 CY7C251 qualification report CY7C254 CROSS
    Text: Qualification Report February, 1994, QTP 93324 Version 1.2 256K PROM / 128K PROM REDESIGNED MARKETING PART NUMBER DEVICE DESCRIPTION CY27C256 32K x 8 Power Switch and Reprogrammable PROM CY27C128 16K x 8 Power Switch and Reprogrammable PROM CY7C251 16K x 8 Power Switch and Reprogrammable PROM


    Original     		CY27C256 CY27C128 CY7C251 CY7C254 CY27C256/CY27C128/CY7C251/CY7C254 256K/128K 15psig) 7C256-PC 7C251-WC 27c128A hysol 7C256 7c251 CY27C256 CY7C251 CY7C254 CY27C128 CY7C251 qualification report CY7C254 CROSS PDF

    Gunn Diode symbol

    Abstract: cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet
    Text: CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY APPENDIX A: FAILURE RATE CALCULATION Thermal Acceleration Factors Acceleration factors AF for thermal stresses (High Temperature Operating Life, Data Retention and High Temperature Steady State Life) are calculated from the Arrhenius equation.


    Original     		62x10-5 Gunn Diode symbol cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet PDF

    CY62256LL-PC

    Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
    Text: Cypress Semiconductor Product Reliability 1997 Published June, 1997 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM. 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY. 2


    Original     		PALCE22V10-JC FLASH-FL22D CY62256LL-PC VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113 PDF