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    CHECK AND DETECT SINGLE ERRORS USING PARITY Search Results

    CHECK AND DETECT SINGLE ERRORS USING PARITY Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    TCTH011AE Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=1μA / IDD=1.8μA / Push-pull type Visit Toshiba Electronic Devices & Storage Corporation
    TLP5212 Toshiba Electronic Devices & Storage Corporation Photocoupler (Gate Driver Coupler) DESAT Detection, OCP, AMC, 5000 Vrms, SO16L Visit Toshiba Electronic Devices & Storage Corporation
    TCTH022AE Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type / FLAG signal latch function Visit Toshiba Electronic Devices & Storage Corporation
    TLP5214A Toshiba Electronic Devices & Storage Corporation Photocoupler (Gate Driver Coupler) DESAT Detection, OCP, AMC, 5000 Vrms, SO16L Visit Toshiba Electronic Devices & Storage Corporation
    TCTH021AE Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type Visit Toshiba Electronic Devices & Storage Corporation

    CHECK AND DETECT SINGLE ERRORS USING PARITY Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    7 bit hamming code

    Abstract: FCT245 IDT39C60 32-bit microprocessor architecture IDT49C460 IDT49C465 IDT49C466 IDT74FCT244
    Text: PROTECTING YOUR DATA WITH THE IDT49C465 32-BIT Flow-thruEDC UNIT APPLICATION NOTE AN-64 PROTECTING YOUR DATA WITH THE IDT49C465 32-BIT Flow-thruEDC UNIT APPLICATION NOTE AN-64 Integrated Device Technology, Inc. By Tao Lin, Gerard Lyons and Frank Schapfel


    Original     		PDF IDT49C465 32-BIT AN-64 64-bit 7 bit hamming code FCT245 IDT39C60 32-bit microprocessor architecture IDT49C460 IDT49C465 IDT49C466 IDT74FCT244

    IDT39C60

    Abstract: IDT74FCT244 IDT49C460 IDT49C465 IDT49C466 hamming code CBO70
    Text:  PROTECTING YOUR DATA WITH THE IDT49C465 32-BIT Flow-thruEDC UNIT APPLICATION NOTE AN-64 Integrated Device Technology, Inc. by Tao Lin, Gerard Lyons and Frank Schapfel high-density dynamic RAMs, typically with access times of 100 nanoseconds or more, but with four times the density of


    Original     		PDF IDT49C465 32-BIT AN-64 64-bit IDT39C60 IDT74FCT244 IDT49C460 IDT49C465 IDT49C466 hamming code CBO70

    4 bit even parity generator circuit

    Abstract: check and detect single errors using parity 8 bit dff with output enable
    Text: White Paper Using Parity to Detect Errors Introduction Altera® Stratix devices feature the TriMatrix™ memory architecture, which is composed of three different-sized embedded RAM blocks. TriMatrix memory includes the 512-bit M512 blocks, the 4-Kbit M4K blocks, and the 512Kbit MegaRAM™ blocks.


    Original     		PDF 512-bit 512Kbit 4 bit even parity generator circuit check and detect single errors using parity 8 bit dff with output enable

    4 bit even parity generator circuit

    Abstract: check and detect single errors using parity 8 bit dff with output enable 3 bit parity generator application of parity bits parity generator parity
    Text: White Paper Using Parity to Detect Errors Introduction Altera® Stratix® II and Stratix devices feature the TriMatrix memory architecture, which is composed of three different-sized embedded RAM blocks. TriMatrix memory includes the 512-bit M512 blocks, the 4-Kbit M4K blocks,


    Original     		PDF 512-bit 512-Kbit 4 bit even parity generator circuit check and detect single errors using parity 8 bit dff with output enable 3 bit parity generator application of parity bits parity generator parity

    DP8400N-2

    Abstract: DP8400N DP8400 DP8400-2 hamming encoder IC of XOR GATE C1995 74s280 T46D
    Text: DP8400-2 E2C2 Expandable Error Checker Corrector The DP8400-2 Expandable Error Checker and Corrector E2C2 aids system reliability and integrity by detecting errors in memory data and correcting single or double-bit errors The E2C2 data I O port sits across the processormemory data bus as shown and the check bit I O port connects to the memory check bits Error flags are provided


    Original     		PDF DP8400-2 DP8400-2 48-pin DP8400-2s DP8400N-2 DP8400N DP8400 hamming encoder IC of XOR GATE C1995 74s280 T46D

    IDT39C60

    Abstract: 7 bit hamming code IDTFCT244 IDTFCT245 IDT39C60A intel 8206 IDT39C60-1 2587 IDT49C460 AN037
    Text: TRUST YOUR DATA WITH  A HIGH-SPEED CMOS 16-, 32-, OR 64-BIT EDC Integrated Device Technology, Inc. APPLICATION NOTE AN-03 APPLICATION NOTE AN-03 TRUST YOUR DATA WITH A HIGH-SPEED CMOS 16-, 32-, OR 64-BIT EDC By Suneel Rajpal and John R. Mick INTRODUCTION


    Original     		PDF 64-BIT AN-03 IDT39C60 7 bit hamming code IDTFCT244 IDTFCT245 IDT39C60A intel 8206 IDT39C60-1 2587 IDT49C460 AN037

    CRC-32

    Abstract: CY27H512 PALCE22V10 "XOR Gates" hamming code hamming code FPGA crc32 lfsr
    Text: Parallel Cyclic Redundancy Check CRC for HOTLink bandwidth, or require operation of the link at a 20% faster transfer rate to carry the redundant bits. Introduction This application note discusses using CRC codes to ensure data integrity over high-speed serial links, such as Fibre


    Original     		PDF CY7B923/CY7B933 CRC-32 CY27H512 PALCE22V10 "XOR Gates" hamming code hamming code FPGA crc32 lfsr

    CRC-16 and CRC-32

    Abstract: CRC-32 cyclic redundancy check CRC-32 LFSR integrated circuit for cyclic redundancy check AN1089 AN1274 CRC-16 CY7B923 CY7B933
    Text: AN1089 Associated Project: No Associated Part Family: CY7B923/CY7B933 Software Version: NA Associated Application Notes: AN1274 Parallel Cyclic Redundancy Check CRC for HOTLink Abstract AN1089 discusses using CRC codes to insure data integrity over high-speed serial links, such as Fibre Channel,


    Original     		PDF AN1089 CY7B923/CY7B933 AN1274 AN1089 CY7B923 CY7B933 CRC-16 CRC-32) CRC-16 and CRC-32 CRC-32 cyclic redundancy check CRC-32 LFSR integrated circuit for cyclic redundancy check AN1274

    UT80CRH196KD

    Abstract: No abstract text available
    Text: UTMC APPLICATION NOTE UT80CRH196KD Error Detection and Correction Functionality The UT80CRH196KD provides flow through Error Detection and Correction EDAC for external memory accesses. When enabled, the EDAC will produce check bits for any external memory


    Original     		PDF UT80CRH196KD

    9148H

    Abstract: UT80CRH196KD
    Text: UTMC APPLICATION NOTE UT80CRH196KD Error Detection and Correction Functionality The UT80CRH196KD provides flow through Error Detection and Correction EDAC for external memory accesses. When enabled, the EDAC will produce check bits for any external memory


    Original     		PDF UT80CRH196KD 9148H

    hamming code

    Abstract: "hamming code" 4 bit hamming code BU-203
    Text: AmZ8160 Cascadable 16-Bit Error Detection and Correction Unit ADVANCED DATA DISTINCTIVE CHARACTERISTICS GENERAL DESCRIPTION • Modified Hamming Code Detects multiple errors and corrects single bit errors in a parallel data word. Ideal for use in dynamic memory


    OCR Scan     		PDF 16-Bit AmZ8160 AmZ8000 Z8000 Am2960 hamming code "hamming code" 4 bit hamming code BU-203

    Z8000

    Abstract: "hamming code"
    Text: Am2960 Cascadable 16-Bit Error Detection and Correction Unit ADVANCED DATA DISTINCTIVE CHARACTERISTICS GENERAL DESCRIPTION • Modified Hamming Code Detects multiple errors and corrects single bit errors in a parallel data word. Ideal for use in dynam ic memory


    OCR Scan     		PDF Am2960 16-Bit Am2960s 32-bit 64-bit Z8000 "hamming code"

    intel 2117

    Abstract: intel 2104a Intel application note AP-46 intel 2107a intel 2116 2107B 2107A RAM S1 1MD3 "hamming code" 7 bit hamming code parity positions
    Text: intJ Ir te l C o rp o ra tio n , 1979 APPLICATION NOTE 3-110 AP-46 9 8 0 0752 INTRODUCTION Complex electronic systems require the utmost in reli­ ability. Especially when the storage and retrieval of critical data demands faultless operation, the system


    OCR Scan     		PDF AP-46 intel 2117 intel 2104a Intel application note AP-46 intel 2107a intel 2116 2107B 2107A RAM S1 1MD3 "hamming code" 7 bit hamming code parity positions

    Untitled

    Abstract: No abstract text available
    Text: P^pi GEC PLESSEY PRELIMINARY INFORMATION DS3569-2.4 MA31752 16-BIT FEEDTHROUGH ERROR DETECTION & CORRECTION UNIT EDAC The MA31752 is a 16 bit Error Detection and Correction Unit intended for use in a high integrity system for monitoring and correcting data values retrieved from memory. The EDAC


    OCR Scan     		PDF DS3569-2 MA31752 16-BIT MA31752 MA31750 68-pin MA31750

    NS32201

    Abstract: cgw RESISTORS op840 hamming encoder IC of XOR GATE tl 2345 ml cgw resistor CIL 108 DP8400-2 DP8400N-2 DP8400V-2
    Text: DP8400-2 National Semiconductor DP8400-2—E2C2 Expandable Error Checker/Corrector General Description memory check bits or DP8400-2S than the single-error cor­ rect configurations. The DP8400-2 has a separate syndrome I/O bus which can be used for error logging or error management. In addition,


    OCR Scan     		PDF DP8400-2â DP8400-2 48-pin TL/F/6899-31 16-Bit TL/F/6899-32 TL/F/6899-34 TL/F/6899-33 NS32201 cgw RESISTORS op840 hamming encoder IC of XOR GATE tl 2345 ml cgw resistor CIL 108 DP8400N-2 DP8400V-2

    ma31750

    Abstract: No abstract text available
    Text: w GEC PLESS EY PRELIMINARY INFORMATION S E M I C O N D U C T O R S DS3569-2.4 MA31752 16-BIT FEEDTHROUGH ERROR DETECTION & CORRECTION UNIT EDAC The MA31752 is a 16 bit Error Detection and Correction Unit intended for use in a high integrity system for monitoring


    OCR Scan     		PDF DS3569-2 MA31752 16-BIT MA31752 68-pin MA317S0 DfO-161 A317S2 MA31750

    DPS-400

    Abstract: 68995
    Text: DP8400-2 National Semiconductor DP8400-2—E2C2 Expandable Error Checker/Corrector General Description memory check bits or DP8400-2S than the single-error cor­ rect configurations. The DP8400-2 Expandable Error Checker and Corrector E2C2 aids system reliability and integrity by detecting er­


    OCR Scan     		PDF DP8400-2 DP8400-2--E2C2 DP8400-2 48-pin DP8400-2S NS32016, DP8400-2, DP8409A DPS-400 68995

    Untitled

    Abstract: No abstract text available
    Text: DP8400-2 5 National Semiconductor DP8400-2—E2C2 Expandable Error Checker/Corrector General Description The DP8400-2 Expandable Error Checker and Corrector E2C2 aids system reliability and integrity by detecting er­ rors in memory data and correcting single or double-bit er­


    OCR Scan     		PDF DP8400-2 DP8400-2â DP8400-2 48-pin DP8400-2S DP8400-2/8409A 16-Blt

    B2035

    Abstract: SECDED "Bipolar Integrated Technology"
    Text: 47E D BIPOLAR INTEGRATE» 1451454 □ 0 0 0 b cì4 T • BIT Bipolar Integrateci Technology Inc. B2035 64-Bit Flowthrough ECC Introduction: The B2035 is the fastest 64-bit flowthrough ECC solution in the industry. Two bi-directional 64-bit buses, rather than one, and


    OCR Scan     		PDF B2035 64-Bit 32-bit SECDED "Bipolar Integrated Technology"

    amd 29000

    Abstract: No abstract text available
    Text: Ul/Hii \JM A l& lJ ii»U >NS 135 579 329 1875 2375 279 129 -. 179 call 529 349 499 169 579 .509 349 -.929 895 - . 129 .409 339 . 579 72 . 259 • -a. call call 139 .959 .169 .339


    OCR Scan     		PDF

    Untitled

    Abstract: No abstract text available
    Text: IME D INTEGRATED DEVICE • 4Ö2S771 0003^22 1 ■ 16-BIT CMOS ERROR DETECTION AND CORRECTION UNIT MICROSLICE PRODUCT FEATURES: • • ■ T -¥ £ -/7 Pin-compatible to all versions of the 2960 • Military product available compliant to MIL-STD-883, Class B


    OCR Scan     		PDF 2S771 16-BIT MIL-STD-883, 100mA IDT39C60 39C60-1 39C60A 39C60B IDT39C60A: IDT39C60B:

    Untitled

    Abstract: No abstract text available
    Text: Work? Error-correcting codes sums to 0. Thus, calculating the checkbits as shown in Fig­ Many types of error-correcting techniques exist, but in data ure 1, the data word D15-D„) 0011 1101 1001 1001 yields communications, Hamming encoding probably finds the


    OCR Scan     		PDF 16-bit

    Untitled

    Abstract: No abstract text available
    Text: Am29C660/A/B/C/D/E Advanced CMOS Cascadable 32-Bit Error Detection and Correction Circuit Micro Devices DISTINCTIVE CHARACTERISTICS • improves memory reliability ■ ■ Very high-speed error detection and correction ■ Low-power CMOS process ■ Cascadable for data words up to 64 bits


    OCR Scan     		PDF Am29C660/A/B/C/D/E 32-Bit 1Q565C-015A 10S65C-016A 10565C-017A 10565C-018A

    AMD2960

    Abstract: 2595D IDT39C60B IDT39C60 AM01B IDT39C60A
    Text: INTEGRATED DEVICE SflE D 4025771 QGl[H3fl 034 • IDT IDT39C60 IDT39C60-1 IDT39C60A IDT39C60B 16-BIT CMOS ERROR DETECTION AND CORRECTION UNIT FEATURES • Standard Military Drawing #5962-88613 available for this function • Low-power CEMOS — Military: 100mA max.


    OCR Scan     		PDF IDT39C60 IDT39C60-1 IDT39C60A IDT39C60B 16-BIT 100mA IDT39C60B: IDT39C60A: T39C60-1: IDT39C60: AMD2960 2595D IDT39C60B AM01B