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    Untitled

    Abstract: No abstract text available
    Text: High-Reliability High-Speed CMOS Logic ICs CD54HC154/3A CD54HCT154/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input tr, t, = 6 ns) TEST CONDITIO NS CHARACTERISTIC SYMBOL Propagation Delay Address to Outputs


    OCR Scan     		PDF CD54HC154/3A CD54HCT154/3A 54HCT 2k-47k

    Untitled

    Abstract: No abstract text available
    Text: High-Reliability High-Speed CMOS Logic ICs CD54HC153/3A CD54HCT153/3A Burn-In Test-Circuit Connections STATIC BURN-IN 1 GROUND Vcc 6V 16 1-6,8,10-15 OPEN 7,9 C D 54H C /H C T153 Dynamic OPEN 7,9 OPEN GROUND 1/2 Vcc (3V) Vcc (6V) — 1,3,5,8,11, 13,15 7,9


    OCR Scan     		PDF CD54HC153/3A CD54HCT153/3A CD54HC154/3A CD54HCT154/3A 4-to-16-Line RCA-CD54HC154 CD54HCT154 o-16-line CDMHCT15773A RCA-CD54HC157