plasma cutter
Abstract: tanaka al wire stroboscop grinding mill ultrasonic movement detector cuzn tanaka silver alloy wire ion metal detector for detect gold in ground field UPS error alloy tungsten corrosion plating resistance gold
Text: FAILURE ANALYSIS IV. FAILURE ANALYSIS 1. WHY FAILURE ANALYSIS IS NECESSARY? 2. WHAT IS FAILURE ANALYSIS? 3. PROCEDURE OF FAILURE ANALYSIS 3.1 INVESTIGATION OF FAILURE CIRCUMSTANCES 3.2 PRESERVATION OF FAILED DEVICES 3.3 VISUAL INSPECTION 3.4 ELECTRICAL TESTS
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Abstract: No abstract text available
Text: Scientific applications UV to visible spectroscopy Fluorescence spectroscopy Raman scattering Chemiluminescence analysis Liquid chromatography Gas chromatography ICP emission analysis Discharge spectrum analysis Combustion analysis Micro spectroscopy Industrial applications
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PMA-12
SE-164
SDSS0008E12
MAR/2013
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Untitled
Abstract: No abstract text available
Text: Failure Analysis Support System FA-Navigation Quickly narrows down failure locations with high accuracy by iPHEMOS Time Resolved Emission Analysis Inverted Emission Analysis TriPHEMOS utilizing a combination of information Photo Emission Analysis output from failure analysis systems
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SSMS0020E04
MAY/2012
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Untitled
Abstract: No abstract text available
Text: Scientific applications UV to visible spectroscopy Fluorescence spectroscopy Raman scattering Chemiluminescence analysis Liquid chromatography Gas chromatography ICP emission analysis Discharge spectrum analysis Combustion analysis Micro spectroscopy Industrial applications
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PMA-12
SE-171-41
SDSS0008E11
JAN/2013
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Untitled
Abstract: No abstract text available
Text: Bit Error Rate Tester BitAlyzer BA Series Data Sheet BitAlyzer® Error Analysis to Rapidly Understand your BER Performance Limitations, Assess Deterministic versus Random Errors, Perform Detailed Pattern-dependent Error Analysis, Perform Error Burst Analysis, and Error-free Interval Analysis
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5W-25538-4
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ASM30
Abstract: Sine wave generation in dspic triangular wave generation in dspic Functions Generators DS01033B-32 Sine wave generation in dspic30f
Text: dsPICworks Data Analysis and DSP Software Summary dsPICworks Data Analysis and DSP Software is an easy-touse data analysis and signal processing package for designs using dsPIC Digital Signal Controllers DSCs . It provides an extensive number of functions encompassing:
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ASM30
dsPIC30F
dsPIC33F
Sine wave generation in dspic
triangular wave generation in dspic
Functions Generators
DS01033B-32
Sine wave generation in dspic30f
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Untitled
Abstract: No abstract text available
Text: DynaSpect is the name for a series of spectrophotometer devices. Scientific applications UV to visible spectroscopy Fluorescence spectroscopy Raman scattering Chemiluminescence analysis Liquid chromatography Gas chromatography ICP emission analysis Discharge spectrum analysis
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SE-171-41
0003E02
AUG/2011
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micrel impedance matching
Abstract: injection
Text: Application Hint 73 Op-Amp Injection for bode analysis By Martin Galinski General Description Bode analysis is an excellent way to measure small signal stability and loop response in power supply designs. Bode analysis monitors gain and phase of a control loop. This is
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M9999-062706
micrel impedance matching
injection
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INCOMING RAW MATERIAL INSPECTIONs
Abstract: siemens spc2 INCOMING RAW MATERIAL INSPECTION method INCOMING RAW MATERIAL INSPECTION INCOMING RAW MATERIAL INSPECTION REPORTS INCOMING RAW MATERIAL INSPECTION, INCOMING RAW MATERIAL specification
Text: Quality Considerations 1 Production sequence and quality assurance during ferrite manufacture schematic Quality records Traceability Raw materials (powder) Incoming inspection Analysis of chemical comp. (X-ray fluorescence analysis) X-ray fluorescence analysis reports
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Abstract: No abstract text available
Text: Agilent MATLAB Data Analysis Software Packages for Agilent Oscilloscopes Data Sheet • Enhance your InfiniiVision or Infiniium oscilloscope with the analysis power of MATLAB® software • Develop custom analysis functions directly on Infiniium oscilloscopes
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86100D
0008A
5990-3353EN
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intel processor transistor count
Abstract: introduction to pentium pro features evolution of intel microprocessor cache
Text: An Overview of Advanced Failure Analysis Techniques for Pentium and Pentium Pro Microprocessors Yeoh Eng Hong, Intel Penang Microprocessor Failure Analysis Department, Malaysia Lim Seong Leong, Intel Penang Microprocessor Failure Analysis Department, Malaysia
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matlab
Abstract: MSO9000 DSO5000 DSO6000 DSO5000A MSO6000 MSO6000-062 DSO7000 DSO9000 DSO90000A
Text: Agilent MATLAB Data Analysis Software Packages for Agilent Oscilloscopes Data Sheet • Enhance your InfiniiVision or Infiniium oscilloscope with the analysis power of MATLAB® software • Develop custom analysis functions directly on Infiniium oscilloscopes
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86100C
0008A
cont800
5990-3353EN
matlab
MSO9000
DSO5000
DSO6000
DSO5000A
MSO6000
MSO6000-062
DSO7000
DSO9000
DSO90000A
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Untitled
Abstract: No abstract text available
Text: Emulation and Analysis Solutions for Hitachi SH7709A/29 Microprocessors Product Overview Debug and Integrate Real-Time Embedded Systems Logic analysis provides timing and state analysis so you can monitor microprocessor activity in relation to other important system signals such as
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SH7709A/29
5968-6946E
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Sharp Semiconductor Lasers
Abstract: AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics
Text: Application Note Optoelectronics Failure Analysis of Optoelectronic Devices DEFINITIONS • US Military Standard: MIL-STD-883 Method 5003 Failure Analysis Procedures for Microcircuits – Failure analysis is a post-mortem examination of a failed device employing, as required, electrical
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MIL-STD-883
SMA04033
Sharp Semiconductor Lasers
AU4A
transistor QB
tensile-strength
thermopile array
BREAK FAILURE INDICATOR APPLICATIONS LIST
relay failure analysis
CRACK DETECTION PATTERNS
gold wire bound failures due to ultrasonic cleaning
2n2222 micro electronics
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MSM5218
Abstract: MSM4040 M5218 msm4024 MSM5218RS 100kw msm5204a SICK AG D7 MSM5205 MSM4014
Text: ¡ Semiconductor MSM5218 ¡ Semiconductor MSM5218 ADPCM Voice Analysis/Synthesis IC GENERAL DESCRIPTION The MSM5218 is a complete voice analysis/synthesis IC featuring the Adaptive Differential Pulse Code Modulation ADPCM method of data compression. The MSM5218 contains an analysis stage
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MSM5218
MSM5218
MSM5205
10-bit
MSM4040
A10A6
100kW
MSM4034
MSM4040
M5218
msm4024
MSM5218RS
100kw
msm5204a
SICK AG D7
MSM5205
MSM4014
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cxa FM radio
Abstract: matlab N9030A MXA agilent N6171A 5989-9377EN N9010A N9010 AGILENT 9030A 5989-4942EN
Text: Agilent N6171A MATLAB Data Analysis Software for X-Series and PSA Series Signal and Spectrum Analyzers Technical Overview • Enhance your Agilent signal and spectrum analyzers with the data analysis power of MATLAB software Create and execute your own analysis routines and
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N6171A
5989-9723EN
cxa FM radio
matlab
N9030A
MXA agilent
5989-9377EN
N9010A
N9010
AGILENT 9030A
5989-4942EN
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MT80
Abstract: DAS-16 DAS-12 PS810 HI-80 pc to pc data transfer using laser MT-80
Text: TurboLab High Speed, Menu Driven Signal Analysis Software Package For Truly High Speed Signal Analysis and Display of Large Data Files Introduction TurboLab is an easy-to-operate, optimum software package for truly high speed signal analysis and the display of large data
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LC-815
PS810
HI-80
MT80
DAS-16
DAS-12
HI-80
pc to pc data transfer using laser
MT-80
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TETRA etch
Abstract: ADI LOT CODE IE reliability test data analysis reliability data analysis report
Text: ADI Reliability Handbook PRODUCT ANALYSIS IN ADI Introduction Product analysis or failure analysis is a key contributor to ADI’s overall quality improvement. In order to maintain its success, it’s imperative that customers have a high level of confidence in ADI’s competency as a supplier. Part of the in-built product analysis philosophy is to emphasize the concept of
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Abstract: No abstract text available
Text: Agilent Technologies E8047B Analysis Probe System for the Intel Xeon Processor Family Product Overview Requires an Agilent 16700A/B Series or 16900A Series Logic Analysis System The Agilent E8047B analysis probe system harnesses the power of the Agilent 16700A/B
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E8047B
6700A/B
6900A
6700A/B
5989-1551EN
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Untitled
Abstract: No abstract text available
Text: Agilent Technologies E8045B Analysis Probe System for the Intel Pentium® 4 Processor in the 775-Land Package Product Overview Requires an Agilent 16700A/B Series or 16900A Series Logic Analysis System Reduce your time to insight The Agilent E8045B analysis
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E8045B
775-Land
6700A/B
6900A
6700A/B
775-land
5989-1552EN
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CREATION MACHINE
Abstract: No abstract text available
Text: E2D5056-27-50 Semiconductor AR203 Voice Analysis and Editing Tool GENERAL DESCRIPTION This voice analysis and editing tool is used to translate voice into ADPCM / ADPCM2/SBC codes to create a ROM for OKI's voice IC. FEATURES The voice analysis and editing tool is composed of a voice analysis and editing board, "AR203", with
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E2D5056-27-50
AR203
AR203"
MSM6375
MSM6372,
MSM6373,
MSM6374,
MSM6375,
MSM63P74
MSM6378A
CREATION MACHINE
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ic cmos 4014
Abstract: 4bit straight adpcm method m5218 l
Text: O K I Semiconductor MSM5218 ADPCM Voice Analysis/Synthesis IC GENERAL DESCRIPTION The MSM5218 is a complete voice analysis/synthesis IC featuring the Adaptive Differential Pulse Code Modulation ADPCM method of data compression. The MSM5218 contains an analysis stage
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MSM5218
MSM5218
MSM5205
10-bit
24-pin
M5218
12-bit
ic cmos 4014
4bit straight adpcm method
m5218 l
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4bit straight adpcm method
Abstract: 4014PS ic 5218 a MSM5218
Text: O K I Semiconductor MSM5218 ADPCM Voice Analysis/Synthesis 1C GENERAL DESCRIPTION The MSM5218 is a complete voice analysis/synthesis IC featuring the Adaptive Differential Pulse Code M odulation ADPCM method of data compression. The MSM5218 contains an analysis stage
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MSM5218
MSM5218
10-bit
MSM5205
24-pin
5218Reset
4bit straight adpcm method
4014PS
ic 5218 a
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SR 6863
Abstract: sr 6863 D logic pulser intel 8085 instruction set FOR PRACTICAL of 7490 Interfacing and Matrix Keyboard 8085 86c7
Text: Application Note 222 A DESIGNER'S G UID E TO SIGNATURE ANALYSIS TABLE OF CONTENTS Introduction to Signature Analysis . Scope . The Need for SA .
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