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    STA111 Search Results

    STA111 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    SCANSTA111MT/NOPB Texas Instruments Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port 48-TSSOP -40 to 85 Visit Texas Instruments Buy
    SCANSTA111SMX Texas Instruments Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port 49-NFBGA -40 to 85 Visit Texas Instruments
    SCANSTA111SM/NOPB Texas Instruments Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port 49-NFBGA -40 to 85 Visit Texas Instruments Buy
    SCANSTA111MT Texas Instruments Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port 48-TSSOP -40 to 85 Visit Texas Instruments
    SCANSTA111SM Texas Instruments Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port 49-NFBGA -40 to 85 Visit Texas Instruments
    SF Impression Pixel

    STA111 Price and Stock

    Rochester Electronics LLC SCANSTA111MT-TI

    MICROPROCESSOR CIRCUIT, CMOS, PD
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SCANSTA111MT-TI Bulk 6,025 31
    • 1 -
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    • 100 $9.76
    • 1000 $9.76
    • 10000 $9.76
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    Texas Instruments SCANSTA111MT/NOPB

    IC INTERFACE SPECIALIZED 48TSSOP
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SCANSTA111MT/NOPB Tube 947 1
    • 1 $12.42
    • 10 $11.413
    • 100 $10.94
    • 1000 $8.57464
    • 10000 $7.86502
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    Mouser Electronics SCANSTA111MT/NOPB 126
    • 1 $12.41
    • 10 $11.41
    • 100 $10.93
    • 1000 $8.57
    • 10000 $8.57
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    Newark SCANSTA111MT/NOPB Bulk 1
    • 1 $15.2
    • 10 $14.11
    • 100 $12.94
    • 1000 $12.71
    • 10000 $12.71
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    Rochester Electronics SCANSTA111MT/NOPB 9,281 1
    • 1 $8.54
    • 10 $8.54
    • 100 $8.03
    • 1000 $7.26
    • 10000 $7.26
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    Chip1Stop SCANSTA111MT/NOPB 38
    • 1 -
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    • 100 $7.08
    • 1000 $7.08
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    SCANSTA111MT/NOPB 3
    • 1 $9.633
    • 10 $9.633
    • 100 $9.633
    • 1000 $9.633
    • 10000 $9.633
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    Rochester Electronics LLC SCANSTA111SM-NS

    MICROPROCESSOR CIRCUIT, CMOS, PB
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SCANSTA111SM-NS Bulk 693 28
    • 1 -
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    • 100 $11.06
    • 1000 $11.06
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    Texas Instruments SCANSTA111MT

    IC INTERFACE SPECIALIZED 48TSSOP
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SCANSTA111MT Tube 47 1
    • 1 $16.89
    • 10 $12.139
    • 100 $10.9188
    • 1000 $10.9188
    • 10000 $10.9188
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    Rochester Electronics SCANSTA111MT 6,025 1
    • 1 $9.85
    • 10 $9.85
    • 100 $9.26
    • 1000 $8.37
    • 10000 $8.37
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    Texas Instruments SCANSTA111SM

    IC INTERFACE SPECIALIZED 49BGA
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SCANSTA111SM Tray 416
    • 1 -
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    • 1000 $11.98704
    • 10000 $11.98704
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    Mouser Electronics SCANSTA111SM
    • 1 -
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    • 10000 -
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    Rochester Electronics SCANSTA111SM 332 1
    • 1 $11.17
    • 10 $11.17
    • 100 $10.5
    • 1000 $9.49
    • 10000 $9.49
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    Find more STA111 price and stock on Findchips.com

    STA111 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    SCANSTA111

    Abstract: MTD48 STA111 Parking counter
    Text: STA111 Multidrop Addressable IEEE 1149.1 JTAG Multiplexer Product Brief PASS BITS 2 / TDI TDO TMS TCK TRST TRIST 6 / SLOT ADDRESS INPUTS 7 / BACKPLANE TAP TAP CONTROL STA111 SELECTION CONTROL REGISTERS, TIMING, & CONTROL LOCAL SCAN PORT NETWORK 9 / TDI


    Original     		PDF SCANSTA111 STA111 SCANSTA111 48-pin MTD48) 49-pin SLC49A) MTD48 STA111 Parking counter

    TDIX

    Abstract: SCANSTA112 AN-1259 AN-1312 SCANSTA111 STA111 STA112
    Text: National Semiconductor Application Note 1312 June 2004 When multiple devices are connected to an STA111 or STA112 local scan port LSP , there are delays associated with the LSP path of the local scan chain that must be considered during timing analysis. Because of the propagation delay of the STA111/112 and the delay through any


    Original     		PDF STA111 STA112 STA111/112 STA111/112, STA111/STA112) TDIX SCANSTA112 AN-1259 AN-1312 SCANSTA111

    SCANSTA111

    Abstract: STA111
    Text: STA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The STA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board


    Original     		PDF SCANSTA111 SCANSTA111 IEEE1149 STA111

    corelis JTAG CONNECTOR

    Abstract: JTAG CONNECTOR SCANSTA111 SCANSTA112 STA111
    Text: Partition IEEE 1149.1 SCAN Chains For Manageability! Application Brief 121 Highlights • Partition JTAG Chains to Enhance Targeting, Throughput, and Isolation During JTAG Test • Extend the IEEE 1149.1 Test Bus into a Multidrop Backplane Environment, Allows Cards to


    Original     		PDF com/pf/SC/SCANSTA111 com/pf/SC/SCANSTA112 corelis JTAG CONNECTOR JTAG CONNECTOR SCANSTA111 SCANSTA112 STA111

    STA111

    Abstract: TDIX AN-1259 AN-1312 SCANSTA111 SCANSTA112 STA112 AN1312
    Text: ெࡔࡔॆӷ‫༹ڞ‬ ᆌᆩጀ๥ 1312 2004౎6ሆ āāॽ‫߲ܠ‬ഗॲ૶‫ڟ‬ᅃ߲STA111ईኁSTA112Ԩ‫ں‬෢௮ āāྺକኟඓ‫֡ں‬ፕSTA111/112LjՂႷሞTCKB‫ڦ‬ᅃ߲ ‫܋‬੨ LSP ้Ljሞ้Ⴞ‫ݴ‬ဆ೺क़ՂႷ੊୯‫ڟ‬٪ሞᇑԨ‫ں‬෢


    Original     		PDF STA111/STA112) STA112 STA111/112 STA111 SCANSTA111 SCANSTA112 STA111 TDIX AN-1259 AN-1312 SCANSTA111 SCANSTA112 STA112 AN1312

    LSP01

    Abstract: sgpio backplane AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 STA112
    Text: National Semiconductor Application Note 1259 April 2003 Introduction the ScanBridge. This insures that all of the TAPs on the LSPs are in a reset mode. The SCANSTA112 is the third device in a series that enable multi-drop address and multiplexing of IEEE-1149.1 scan


    Original     		PDF SCANSTA112 IEEE-1149 STA112 SCANPSC110 SCANSTA111. AN-1259 LSP01 sgpio backplane AN-1259 SCANSTA111 STA111

    lm2679-adj

    Abstract: uaa 3100 lm2679-adj 10A LM8365 STA112 z10a adj 2576 ADC78H90 EP2S15 LM2647
    Text: ナショナル セミコンダクター Altera FPGA および CPLD 向け電源デザイン・ガイド 2005年 秋 対象 Altera 製品 : ナショナルの全 FPGA ソリューションを紹介 : Stratix II FPGA ファミリ • LVDS インタフェース製品


    Original     		PDF LM5070 TSSOP-16 LLP-16 LM3670/71 600mA OT-23 OT23-5 LM3671 600mA2MHz lm2679-adj uaa 3100 lm2679-adj 10A LM8365 STA112 z10a adj 2576 ADC78H90 EP2S15 LM2647

    Untitled

    Abstract: No abstract text available
    Text: STA111 www.ti.com SNLS060K – AUGUST 2001 – REVISED APRIL 2013 STA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port Check for Samples: STA111 FEATURES DESCRIPTION • The STA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The


    Original     		PDF SCANSTA111 SNLS060K SCANSTA111

    Untitled

    Abstract: No abstract text available
    Text: STA111 www.ti.com SNLS060K – AUGUST 2001 – REVISED APRIL 2013 STA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port Check for Samples: STA111 FEATURES DESCRIPTION • The STA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The


    Original     		PDF SCANSTA111 SNLS060K SCANSTA111

    LSP01

    Abstract: AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 STA112 sgpio backplane
    Text: National Semiconductor Application Note 1259 August 7, 2008 Introduction Transparent Mode - Transparent mode refers to a condition of operation in which there are no pad-bits or 'STA112 registers in the scan chain. The Transparent mode of operation is available in both ScanBridge and Stitcher modes. Only the


    Original     		PDF STA112 LSP01 AN-1259 LSP01 AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 sgpio backplane

    lcd mp4

    Abstract: 12mhz mp5 12mhz mp5 CRYSTAL DDR4 mb89051 FPT-64P-M09 LQFP-64 MB89F051 LC1 FH 43 al4142
    Text: FUJITSU SEMICONDUCTOR CM25-10148-XE CONTROLLER MANUAL F2MC-8L 8 BIT MICRO CONTROLLER MB89051 Series HARDWARE MANUAL F2MC-8L 8 BIT MICRO CONTROLLER MB89051 Series HARDWARE MANUAL FUJITSU LIMITED PREFACE • Purpose of this document and intended reader The MB89051 Series products were developed as the general-purpose version of the F2MC-8L


    Original     		PDF CM25-10148-XE MB89051 MB89051Series lcd mp4 12mhz mp5 12mhz mp5 CRYSTAL DDR4 FPT-64P-M09 LQFP-64 MB89F051 LC1 FH 43 al4142

    LSP01

    Abstract: AN-1259 SCANPSC110 SCANSTA111 SCANSTA112 STA111 STA112
    Text: National Semiconductor Application Note 1259 February 2004 Introduction the ScanBridge. This insures that all of the TAPs on the LSPs are in a reset mode. The SCANSTA112 is the third device in a series that enable multi-drop address and multiplexing of IEEE-1149.1 scan


    Original     		PDF SCANSTA112 IEEE-1149 STA112 SCANPSC110 SCANSTA111. AN-1259 LSP01 AN-1259 SCANSTA111 STA111

    Untitled

    Abstract: No abstract text available
    Text: STA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The STA111 Enhanced Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial


    Original     		PDF SCANSTA111 SCANSTA111 IEEE1149 ds101245

    GHW Connectors

    Abstract: TDQ38 BTA60 bta61 bta80 bta11 BTA100 BTA32 bta50 bta81
    Text: Version 1.2 December 1999 2975 Stender Way, Santa Clara, California 95054 Telephone: 800 345-7015 • TWX: 910-338-2070 • FAX: (408) 492-8674 Printed in U.S.A. 1999 Integrated Device Technology, Inc. Integrated Device Technology, Inc. reserves the right to make changes to its products or specifications at any time, without notice, in order to improve design or performance


    Original     		PDF

    STA111

    Abstract: SCANSTA111
    Text: STA111 Enhanced SCAN Bridge Multidrop Addressable IEEE 1149.1 JTAG Port • Mode Register0 allows local TAPs to be bypassed, General Description The STA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved


    Original     		PDF SCANSTA111 SCANSTA111 STA111

    SCANSTA111

    Abstract: STA111
    Text: STA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The STA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board


    Original     		PDF SCANSTA111 SCANSTA111 IEEE1149 STA111

    1LQ1

    Abstract: national an-1 voltage regulator MCF528x DSLV010A CLC01A DP83849 bsdl DS90LV110T
    Text: ナショナル セミコンダクター インタフェース製品 セレクションガイド 2006年12月 LVDS/BusLVDS/M-LVDS. ドライバ・レシーバ・. トランシーバ. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-6 マルチギガビット LVDS.


    Original     		PDF AN-10 CLC01 DS92LV16. 03-5639-7300www 550064-010-JP 1LQ1 national an-1 voltage regulator MCF528x DSLV010A CLC01A DP83849 bsdl DS90LV110T

    Virtex-4 serdes

    Abstract: camera-link to hd-SDI converter schematic satellite finder BELDEN 1700A dp83848 1470 LM camera-link to SDI converter CAT5E Pinout DP83865 SCHEMATIC dp83848 data sheet
    Text: Interface Selection Guide March 2007 LVDS Drivers/Receivers Tranceivers . 5-6 LVDS and CML PHYs Differential to Differential . 7-10 SerDes . . 11-13 Serial Digital Interface (SDI) . . 14-16


    Original     		PDF AN-1113 LMH0031 AN-1320 LMH0034 AN-1372 Virtex-4 serdes camera-link to hd-SDI converter schematic satellite finder BELDEN 1700A dp83848 1470 LM camera-link to SDI converter CAT5E Pinout DP83865 SCHEMATIC dp83848 data sheet

    STA112

    Abstract: AN-1327 SCANSTA111 SCANSTA112 FFFFFF00 stapl
    Text: National Semiconductor Application Note 1327 December 17, 2009 The STA111/112 Provides a Straightforward and Flexible Method of Isolating Scan Chains for Simplified Programming. Many modern communication and networking systems incorporate a system-wide IEEE 1149.1 JTAG test bus. The test


    Original     		PDF SCANSTA111/112 AN-1327 STA112 AN-1327 SCANSTA111 SCANSTA112 FFFFFF00 stapl

    TDQ38

    Abstract: LTA201 LTA230 a1633 BTA32 B32315 LTA123 LTA143 LTA150 SDQ57
    Text: 7 8 VCC3.3 SYNCOUT tied to SYNCIN through series resistor. Trace length matched to SYSCLK[0:7]/TITAN_CLK 1,14 1,12,14 6,7,12,13,14 1,12,14 1 16 2 15 3 14 4 13 5 12 6 11 7 10 9 8 S2 1 1 1 1 1 1 1 1 BLK_WR1 BLK_WR0 CLK_FREQ2 CLK_FREQ1 CLK_FREQ0 CLKMULT2 CLKMULT1


    Original     		PDF 10KOHM SDQM02 SDQM12 SDQM22 SDQM32 22DQM03 22OHM 17DEVCS31 16DEVCS30 SDQM41 TDQ38 LTA201 LTA230 a1633 BTA32 B32315 LTA123 LTA143 LTA150 SDQ57

    AA1010

    Abstract: SCANSTA111 STA111
    Text: STA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The STA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board


    Original     		PDF SCANSTA111 SCANSTA111 IEEE1149 CSP-9-111S2. AA1010 STA111

    LM2679 spec switcher

    Abstract: 67A SOT23-6 lm2679-adj lm2679-adj 10A LP3990-1.8 ADC08200 LM2679 LM5070 12v output LMH6714 pin diagram for IC 4580
    Text: Power Management Design Guide for Altera FPGAs and CPLDs Altera devices covered: Also features National’s FPGA solutions for: Stratix® II FPGA family Stratix® FPGA family Cyclone FPGA family MAX® II CPLD family • Communications interface, including LVDS


    Original     		PDF LM5070 O263-5, O220-5 LM2679 spec switcher 67A SOT23-6 lm2679-adj lm2679-adj 10A LP3990-1.8 ADC08200 LM2679 LM5070 12v output LMH6714 pin diagram for IC 4580

    SCAN921023

    Abstract: SCAN921224 SCAN92LV090 SCANSTA111 SCANSTA111MT SCANSTA111SM STA111 TRST IEEE 3 bus SYSTEM
    Text: National News STA111 November 2001 www.national.com/pf/SC/STA111.html National’s STA111 Multidrop Addressable JTAG Port Improves Throughput and Fault Isolation in IEEE 1149.1 Environment Basic Block Diagram PASS BITS 2 / TDI TDO TMS TCK TRST


    Original     		PDF SCANSTA111 com/pf/SC/SCANSTA111 SCANSTA111 STA111 32-bit 16-bit SCANSTA111SM SCANSTA111MT SCAN921023 SCAN921224 SCAN92LV090 SCANSTA111MT SCANSTA111SM STA111 TRST IEEE 3 bus SYSTEM

    AN-1313

    Abstract: AN-891 SCAN90CP02 STA111 STA112 AN-891 national
    Text: National Semiconductor Application Note 1313 March 2005 The SCAN90CP02 has several Design-for-Test DfT features intended to lower development and manufacturing test costs: • IEEE 1149.1 • IEEE 1149.6 • StuckAt fault insertion Another feature that is being promoted by the programmable


    Original     		PDF SCAN90CP02 CSP-9-111C2) CSP-9-111S2) CSP-9-111S2. AN-1313 AN-1313 AN-891 STA111 STA112 AN-891 national