F240
Abstract: SN54BCT8240A SN74BCT8240A
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067D
BCT8240A
SN54BCT8240A
17ocal
F240
SN54BCT8240A
SN74BCT8240A
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SN74HC02 Spice model
Abstract: philips semiconductor data handbook SDAD001C SDFD001B SCAD001D SN7497 spice model SN74AHC14 spice Transistor Crossreference SLLS210 ci ttl sn74ls00
Text: LOGIC OVERVIEW 1 FUNCTIONAL INDEX 2 FUNCTIONAL CROSSĆREFERENCE 3 DEVICE SELECTION GUIDE 4 3 LOGIC SELECTION GUIDE FIRST QUARTER 1997 IMPORTANT NOTICE Texas Instruments TI reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest
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F240
Abstract: SN54BCT8240A SN74BCT8240A BCT8240A DB471
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D - FEBRUARY 1990 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW
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OCR Scan
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SN54BCT8240A,
SN74BCT8240A
SCBS067D
BCT240
F240
SN54BCT8240A
BCT8240A
DB471
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