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    QNFL9901 Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    QNFL9901 STMicroelectronics PREDICTING THE MEMORY DATA RETENTION TIME Original PDF

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    st memory

    Abstract: QNFL9901
    Text: QNFL9901 QUALITY NOTE Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time


    Original     		QNFL9901 st memory QNFL9901 PDF

    QNFL9901

    Abstract: No abstract text available
    Text: QNFL9901 QUALITY NOTE  Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time


    Original     		QNFL9901 QNFL9901 PDF