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    32kx8 sram

    Abstract: VSS115 32kxS
    Text: Honeywell Advance Information HC80820 256K X 8 RADIATION-TOLERANT SRAM FEATURES R A D IA TIO N OTHER • Total D ose Hardness at Tactical Level • S pare Mem ory Chip can be Substituted O n-The-Fly • Soft Error R ate of <1 x1 O'5 upsets/bit-day or <1 upset/module-day


    OCR Scan     		HC80820 PINOUR19 BADDR18 BADDR17 BADDR16 BADDR15 122-lead 32kx8 sram VSS115 32kxS PDF

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    Abstract: No abstract text available
    Text: fc.3E D 45S1Ô72 GDD 1 G1 1 H ONEYÙI EL L/ S 11T Honeywell *H0N3 S E C Advance Information 256K X 8 RADIATION-TOLERANT SRAM HC80820 FEATURES RADIATION OTHER • Total Dose Hardness at Tactical Level • Spare Memory Chip can be Substituted On-The-Fly • Soft Error Rate of <1x10 5upsets/bit-day


    OCR Scan     		HC80820 BADDR11 BARRD10 BDISCRI02 BDISCRI01 BADDR21 BADDR20 BADDR19 BADDR18 BADDR17 PDF