Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    EDI411024CXXQB Search Results

    EDI411024CXXQB Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: WDÌ DRAM Test Enable Function E lectronic D « «tg n i Inc. EDI411024CXXQB Functional Description The T e s t E nable Function im plem entation on E lectronic D esigns' 1M x 1 dynam ic RAM allow s te st tim e reduction by use o f a parallel test algorithm . By asserting the TE pin, the


    OCR Scan     		PDF EDI411024CXXQB 256Kx1

    EDI8M8512L

    Abstract: No abstract text available
    Text: ^EDI Packaging Cross Reference Electronic Designs Inc. by Part Number No. Pins 31 40 31 40 26 52 TBD 36 TBD 36 TBD TBD TBD TBD 26 52 26 52 25 28 27 32 25 28 27 32 78 20 16 20/26 1 18 18 20 16 20/26 18 20 16 2026 18 20 16 20/26 4 20 18 20 13 28 76 28 22 28


    OCR Scan     		PDF EDH816H64CX2 EDI88128PXXNM EDI88130CSXXNB 188130LPSXXNB EDI88130PSXXNB 188128CXXLB EDI88128CXXLM EDI88128LPXXLB EDI88128LPXXLM EDI88128PXXLB EDI8M8512L

    EDI44256C

    Abstract: No abstract text available
    Text: ^EDI Dynamic RAM Selector Guide Electronic D u lg n s Inc. The Industry’s Fastest High Density MIL-STD-883, Paragraph 1.2.1 Compliant Dynamic RAMs In response to the need of our military customers for high-performance, M IL-S TD 883 compliant DRAM s, Electronic Designs


    OCR Scan     		PDF MIL-STD-883, 256Kx4 EDI44256CXXNB EDI44256CXXQB EDI44256CXXZB EDI411024CXXFB EDI411024CXXNB EDI411024CXXQB EDI44256C