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    transistor 20595

    Abstract: 20595 DS1232
    Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1232 Sep-97 9729 C1 HYUNDAI DL719713ABE 3.0µ OX/NI 16 SOIC STRESS/JOB NO. Preconditioning P/C : HTC Vapor Phase P-20423 READPOINT (Sample Size/No. of Fails)


    Original
    PDF DS1232 Sep-97 DL719713ABE P-20423 P-20470 P-20471, P-20595 P-20596 transistor 20595 20595 DS1232

    P-20606

    Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
    Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97


    Original
    PDF DS1302) Mar-97 Jun-97 Sep-97 Feb-97 May-97 Aug-97 P-20606 c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050