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    E5-1101

    Abstract: wafer prober AN115013 WM-40X0 SECS II wafer map format wafer map format wafer map 3d01
    Text: AN115013 SECS II wafer map format Rev. 1.3 — 1 July 2009 Application note Document information Info Content Keywords wafer mapping, SECS II format, electronic inking Abstract This document gives a short guideline how to interpret wafer maps in SECS II format delivered with wafers by Business Line Identification.


    Original     		AN115013 E5-1101 wafer prober AN115013 WM-40X0 SECS II wafer map format wafer map format wafer map 3d01 PDF