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    SIT9003AI-33-33EB-59.94431 SiTime 1 to 110 MHz, Low Power Spread-spectrum Oscillator Datasheet
    SF Impression Pixel

    9944 K Price and Stock

    Rochester Electronics LLC AD9944KCP

    AFE VIDEO ADC 12 BIT 3V
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    DigiKey AD9944KCP Bag 7,403 44
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    Analog Devices Inc AD9944KCPZ

    IC CCD SIGNAL PROCESSOR 32-LFCSP
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    DigiKey AD9944KCPZ Tray
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    Rochester Electronics AD9944KCPZ 20,967 1
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    Rochester Electronics LLC AD9944KCPZ

    COMPLETE 12-BIT, 25 MHZ CCD SIGN
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    DigiKey AD9944KCPZ Bulk 49
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    Rochester Electronics LLC AD9944KCPRL

    AFE VIDEO ADC 12 BIT 3V
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    DigiKey AD9944KCPRL Bulk 51
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    Analog Devices Inc AD9944KCPZRL

    IC CCD SIGNAL PROCESSOR 32-LFCSP
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    DigiKey AD9944KCPZRL Reel
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    Rochester Electronics AD9944KCPZRL 29,188 1
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    9944 K Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    sf 818 transistor

    Abstract: D-30916
    Text: SALES OFFICES CANADA NEPEAN ONTARIO K2H 9C4 301 Moodie Drive Suite 307 Tel. 613 829-9944 Telefax (613) 829-8996 U.S.A. NORTH & SOUTH AMERICAN MARKETING HEADQUARTERS 55 Old Bedford Road LINCOLN, MA 01773 Tel. (781) 259-0300 Telefax (781) 259-4421 ALABAMA


    Original     		PDF

    Untitled

    Abstract: No abstract text available
    Text: Product Preview PP/9944/1 December 2013 DE9944 SDR Demonstrator Software Defined Radio Demonstrator for FDMA Digital/Analogue PMR Introduction DE9944 Brief Description FDMA 6.25 kHz digital PMR is an enabler to achieve highly functional solutions by using low


    Original     		PDF PP/9944/1 DE9944 DE9944 STD-T98, T-102,

    DS-1000

    Abstract: DS1302 DIE REVISION DH020 ds1000m-100 25409
    Text: RELIABILITY MONITOR DS1000M-100 OCT '99 MONITOR DEVICE REVISION DATE CD LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1000 E3 300 9944 PROCESS Single Poly, Single Metal DH927108AJC 8 PDIP CPS ChipPac, China 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60%


    Original     		PDF DS1000M-100 DS1000 DH927108AJC J-STD-020 30C/60% DS-1000 DS1302 DIE REVISION DH020 25409

    microprocessors architecture of 8253

    Abstract: embedded microprocessors 8284 microprocessor architecture JAYA46000 malaysia microelectronic solution 5ST86
    Text: FF-stpc.qxd 24-09-1998 9:05 Pagina 1 SALES OFFICES AMERICAS BRAZIL 05413 SÃO PAULO R. Henrique Schaumann 286-CJ33 Tel. 55-11 883-5455 Telefax (55-11) 282-2367 CANADA NEPEAN ONTARIO K2H 9C4 301 Moodie Drive Suite 307 Tel. (613) 829-9944 Telefax (613) 829-8996


    Original     		PDF 286-CJ33 microprocessors architecture of 8253 embedded microprocessors 8284 microprocessor architecture JAYA46000 malaysia microelectronic solution 5ST86

    Hyundai 9944

    Abstract: nseb ds1000m-100 DS2165Q
    Text: RELIABILITY MONITOR DS1000M-100 OCT '99 MONITOR DEVICE REVISION DATE CODE LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1000 E3 DIP 300 CPS ChipPac, C 9944 PROCESS Single Poly, Single Metal DH927108AJC 8 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60% Ea: 0.7


    Original     		PDF DS1000M-100 DS1000 DH927108AJC DS87C520 DN901118AAB Hyundai 9944 nseb DS2165Q

    74 HTC 00

    Abstract: 74 HTC 08 DS1302 DIE REVISION Hyundai 9944
    Text: RELIABILITY MONITOR DS1000M-100 OCT '99 MONITOR DEVICE REVISION DATE CD LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1000 E3 300 9944 PROCESS Single Poly, Single Metal DH927108AJC 8 PDIP CPS ChipPac, China 1.2 µm Standard Process JOB NO DESCRIPT Cf: 60%


    Original     		PDF DS1000M-100 DS1000 DH927108AJC DK935356AAB J-STD-020 30C/60% 74 HTC 00 74 HTC 08 DS1302 DIE REVISION Hyundai 9944

    dallas date code ds1230

    Abstract: dallas date code dallas ds1230 code 25807
    Text: RELIABILITY MONITOR STRESS: VAPOR PHASE REFLOW CONDITIONS: 217C MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS5002 C4 PACKAGE READ POINT QTY FAIL APR '00 25428 0004 Carsem DM925587AAF MQFP 3 203 DS87C520 A14 NOV '99 24798 9931 ATK Anam, K


    Original     		PDF DS5002 DS87C520 DM925587AAF DN901118AAB DK935356AAB J-STD-020 DM929359AB DS1232 DS1233 dallas date code ds1230 dallas date code dallas ds1230 code 25807

    Ablebond 71

    Abstract: 9727
    Text: 08/08/2002 RELIABILITY REPORT FOR DS1004, Rev E1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


    Original     		PDF DS1004, reliabilit235C DS1004 DS1000 Ablebond 71 9727

    dallas date code ds1230

    Abstract: 25091 e8 sot223 24446
    Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 47 DS1869 A3 SEP '99 24445 9907 NSEB DJ824247ABA SOIC


    Original     		PDF DS1621 DS1869 DK815282AAB DJ824247ABA DM846764AA DS2502 DS87C520 DN901118AAB DK935356AAB dallas date code ds1230 25091 e8 sot223 24446

    ACT245

    Abstract: 9944 74AC245 smd code book a7 transistor smd diode g6 54ACT 74ACT245 74ACT245MTC 74ACT245PC 74ACT245SC
    Text: 54AC 74AC245  54ACT 74ACT245 Octal Bidirectional Transceiver with TRI-STATE Inputs Outputs General Description Features The ’AC ’ACT245 contains eight non-inverting bidirectional buffers with TRI-STATE outputs and is intended for bus-oriented applications Current sinking capability is 24 mA at


    Original     		PDF 74AC245 54ACT 74ACT245 ACT245 9944 74AC245 smd code book a7 transistor smd diode g6 74ACT245 74ACT245MTC 74ACT245PC 74ACT245SC

    54ACT

    Abstract: 74AC 74AC245 74ACT245 AC245 ACT245 C1995
    Text: 54AC 74AC245  54ACT 74ACT245 Octal Bidirectional Transceiver with TRI-STATE Inputs Outputs General Description Features The ’AC ’ACT245 contains eight non-inverting bidirectional buffers with TRI-STATE outputs and is intended for bus-oriented applications Current sinking capability is 24 mA at


    Original     		PDF 74AC245 54ACT 74ACT245 ACT245 20-3A 74AC 74AC245 74ACT245 AC245 C1995

    9418 transistor

    Abstract: 9241 9329 9944 k 9329 transistor 9648 LTC1043 9944
    Text: RELIABILITY DATA LTC1043 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE NEWEST DATE CODE CERDIP SIDEBRAZE PLASTIC DIP 381 9226 961 8444 148 8445 1,490 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP


    Original     		PDF LTC1043 00-03-6209B. 9418 transistor 9241 9329 9944 k 9329 transistor 9648 LTC1043 9944

    DS1233 a5

    Abstract: e8 sot223 9915 dallas 25010 DN819 densit DS1232L ds1232l datasheet DS1869 DK815282AAB
    Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 45 DS1621 A7 SEP '99 24466 9930 ATP (Anam, PI) DK906731AAC SOIC


    Original     		PDF DS1621 DK815282AAB DK906731AAC DS1869 DJ821534ABB DJ824252AAC DJ824247ABA DS1233 a5 e8 sot223 9915 dallas 25010 DN819 densit DS1232L ds1232l datasheet DS1869

    Untitled

    Abstract: No abstract text available
    Text: RELIABILITY MONITOR PROCESS: STRESS: 0.6 µm Double Poly, Single Metal Ti/TiN layers used on all Metals INFANT LIFE MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY READ POINT QTY FAILS LOT NO. PACKAGE DS2502 C3 MAR '00 25253 0005 Carsem S DM941226AA


    Original     		PDF DM941226AA DM941230AG DS2502 DM941230AG DM941226AA

    218E-08

    Abstract: ti 9919
    Text: RELIABILITY MONITOR PROCESS: STRESS: 0.6 µm Double Poly, Single Metal Ti/TiN layers used on all Metals INFANT LIFE MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY READ POINT QTY FAILS LOT NO. PACKAGE DS2502 C2 MAR '99 24153 9913 Carsem S DM842206AL


    Original     		PDF DM842206AL DM846764AA DS2502 DM846764AA DM842206AL 218E-08 ti 9919

    LT1413

    Abstract: R340 9848
    Text: RELIABILITY DATA LT1413 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP NEWEST DATE CODE 50 9522 50 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 200 9347


    Original     		PDF LT1413 00-03-6209B. LT1413 R340 9848

    LT1413

    Abstract: R340
    Text: RELIABILITY DATA LT1413 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 100 9513 100 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 200 9347 200 • PRESSURE COOKER TEST AT 15 PSIG, +121°C


    Original     		PDF LT1413 953ST 00-03-6209B. LT1413 R340

    LT1460

    Abstract: LT1790 LT6660 74822
    Text: RELIABILITY DATA LT1460 / LT1790 / LT6660 10/17/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 438 9640 441 9633 879 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE


    Original     		PDF LT1460 LT1790 LT6660 00-03-6209B. LT6660 74822

    ru 94vo circuit

    Abstract: 604 LEM ru 94vo LAS 50-TP/SP1 lem lp tp LAS 50-TP-SP1 lem 9944 TCA 875 PN 1204 LPN.500
    Text: feL; ¿^^-9944- Current Transducer LAS 50-TP IPN = 50 A For the electronic measurement of currents: DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). Preliminary Electrical data


    OCR Scan     		PDF 50-TP 625-lp/lpN) 50-TP 50-TP/SP1 50-TP/SP1: ru 94vo circuit 604 LEM ru 94vo LAS 50-TP/SP1 lem lp tp LAS 50-TP-SP1 lem 9944 TCA 875 PN 1204 LPN.500

    DTL-930

    Abstract: dtl 930 9945 9962 G. 994.4 9932 DTL 9934 9946 9948 dtl 9946
    Text: BIPOLAR DIGITAL ICs continued DTL-930 series4 LU Q >- t- z o HQ_ C • a a & E L] Q - DC X s H — L i. C J co Ü J a Gates 9930 9932 9933 9934* 9935 9936 9944 9946 9962 Flip-flops 9093 9094 9097 9099 9945 9948 h~ O z < LU O < u < a. Expandable dual 4-input


    OCR Scan     		PDF DTL-930 dtl 930 9945 9962 G. 994.4 9932 DTL 9934 9946 9948 dtl 9946

    9945a

    Abstract: ic 9945 a 8 pin ci 9933 b 9945 A transistor 9945 A 9962 GH cx 3120 inverter circuit diagram 9936 9936 GN diode 9948
    Text: FAIRCHILD DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS COMPOSITE DATA SHEET A FAIRCHILD COMPATIBLE CURRENT SINKING LOGIC PRODUCT 0 °C TO 7 5 °C TEM PERATURE RANGE GENERAL DESCRIPTION— Fairchild Diode Transistor Micrologic DT/j L Integrated Circuits family uses


    OCR Scan     		PDF

    ic 9945 a 8 pin

    Abstract: 9945 A transistor ic 9945 a 4 pin L9944 diode 9948 LT 9949 fairchild micrologic 3m 9962 9932 DTL fairchild 9946
    Text: FAIRCHILD DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS COMPOSITE DATA SHEET A FAIRCHILD COMPATIBLE CURRENT SINKING LOGIC PRO DUCT 0°C TO 75°C TEM PERATURE RAN GE GENERAL DESCRIPTION — Fairchild Diode Transistor Micrologic DT/iL Integrated Circuits family uses


    OCR Scan     		PDF

    9962 GH

    Abstract: L9932 l9933 9945 A transistor DTL 9930 9936 GN 9962 6H fairchild 9930 integrated circuits data inverter circuit diagram 9936 FD100 diode
    Text: DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS A FAIRCHILD COMPATIBLE CURRENT SINKING LOGIC PRODUCT MILITARY TEMPERATURE RANGE: - 5 5 ° C to + 1 2 5 ° C GENERAL DESCRIPTION The Fairchild 9930 series of Diode Transistor Micrologic is a member of the Compatible Current Sinking Logic CCSL family designed for use in


    OCR Scan     		PDF O-116) 0035j^ U3IXXXX51X U6AXXXX51X 9962 GH L9932 l9933 9945 A transistor DTL 9930 9936 GN 9962 6H fairchild 9930 integrated circuits data inverter circuit diagram 9936 FD100 diode

    9933 b

    Abstract: st 9935 ic 9945 a 8 pin mos 9945 A transistor l9933 fairchild micrologic AD 9946 lt 9093 inverters diagrams UL9930
    Text: DIODE-TRANSISTOR MICROLOGIC INTEGRATED CIRCUITS A FAIRCHILD COMPATIBLE CURRENT SINKING LOG IC PRODUCT MILITARY TEMPERATURE RANGE: -5 5 ° C to +125°C G E N E R A L D E S C R IP T IO N The 9932 buffer has active pull-up to provide increased capacitive drive and


    OCR Scan     		PDF U3IXXXX51X U6AXXXX51X 9933 b st 9935 ic 9945 a 8 pin mos 9945 A transistor l9933 fairchild micrologic AD 9946 lt 9093 inverters diagrams UL9930