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    Part ECAD Model Manufacturer Description Download Buy
    5962-9174601Q3A Texas Instruments Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 Visit Texas Instruments Buy

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    bct8240a

    Abstract: No abstract text available
    Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		SN54BCT8240A, SN74BCT8240A SCBS067E BCT240 SNJ54BCT8240AFK 5962View 9174601Q3A SNJ54BCT8240AJT 9174601QLA bct8240a PDF